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Critical Dimension Scanning Electron Microscopes in Critical Dimension Scanning Electron MicroscopesCritical Dimension Scanning Electron Microscopes (8)

 

Optical Microscopes in Optical MicroscopesOptical Microscopes (126)

 

Sample Preparation in Sample PreparationSample Preparation (28)

 

Parts and Accessories, Microscope in Parts and Accessories, MicroscopeParts and Accessories, Microscope (54)

 

Other Items in Other ItemsOther Items (5)

 

Electron Microscopy in Electron MicroscopyElectron Microscopy (18)

Special:  Offered1 Offered at Best Price

LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD


LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD



Items from the following manufacturers are offered under Microscopes:
Allied, American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, BAL-TEC, Bausch & Lomb, Inc, Buehler, Coborn, CPS, Dage-MTI, Denton, Diagnostic Instruments, Dolan Jenner, Edwards, FEI, Fostec, Gatan, Hitachi, HSEB, JEOL, Karl Storz, KLA-Tencor, Leco, Leica, Leica, Leitz, Melles Griot, Microspec, Mitutoyo, Nikon, Olympus, Prior Scientific, Reichert Inc, Reichert-Jung, RK Print Coat Instruments, Schott Fostec, SELA, Semicaps, Semprex, South Bay Technology, Strasbaugh, Suss Microtec, Vision Engineering, Volpi, Wild, Zeiss