How to post on WWX
Latest Listings!
 Fast¬†¬†FIND      full search   tips    
in  ALL  ONLY Inspection Equipment
Serving  Our Guest Log in    RegisterHow to post your own listings   View prices in  or ...    
ALL CATEGORIES   Oil & Gas Industry   Lab & Scientific Eq   View   Search-by-Specs    Input    Edit    
View All Offers Under

Inspection Equipment


» Switch Major Category
Click an item's ID# below for its full specifications and source, or:

Group Offers into sub-categories under Inspection EquipmentGroup Offers into sub-categories under Inspection Equipment

List all 3 product types under Inspection EquipmentList all 3 product types under Inspection Equipment


  • To sort on a column, click the column head; click it again to reverse the sort.
  • Click the links under the Product Type column head to see other like items of that type.
  •  
     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
    Make Model
      $  
    176719

    SELA  

    EM2 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Regensburg, BY
    Automated TEM and SEM sample preparation system - SELA EM2

    A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

    Tool is completed.

    Used within FE & BE failure analysis

    23007

    Buehler  

    Carbimet Paper Discs 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    2 50.00 F* Scotia, NY
    BUEHLER CARBIMET 320 GRIT PAPER DISCS
    Paper Discs 320 Grit

    Buehler part number: 30-5108-320-100
    116574

    Buehler  

    Primet 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 650.00 F* Scotia, NY
    BUEHLER PRIMET MODULAR DISPENSING SATELLITE
    Modular Dispensing Satellite

    7353

    CPS  

    6004/1958 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 3,750.00 Scotia, NY
    CPS ELECTRON GUN POWER SUPPLY 30KV
    Electron Gun Power Supply

    CPS Computer Power Supply 6004
    161915

    Faxitron X-Ray  

    MX-20 

    List all items of this typeX-Ray Inspection Equipment - Other

    in Inspection Equipment

    1 F* Scotia, New York
    FAXITRON X-RAY SYSTEM
    X Ray System
    175864

    Gatan  

    691 PIPS 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Scotia, NY
    GATAN 691 PRECISION ION POLISHING SYSTEM PIPS

    Precision Ion Polishing System (PIPS)

    The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
    produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

    176740

    Gatan  

    691 PIPS 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Scotia, NY
    GATAN 691 PRECISION ION POLISHING SYSTEM PIPS

    Precision Ion Polishing System (PIPS).

    Includes Gatan Binocular Microscope

    The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
    produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

    78602

    Hewlett Packard  

    43804N 

    List all items of this typeX-Ray Inspection Equipment - Other

    in Inspection Equipment

    1 F* Scotia, NY
    HEWLETT PACKARD HP FAXITRON X-RAY SYSTEM 110 kV
    X-Ray System

     

    100557

    Hitachi  

    S-2400 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-2400 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Micrscope (SEM)
    60831

    Hitachi  

    S-4100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE
    Field Emission Electron Microscope

    NB: System is missing Ion pump power supply. Sold "As Is".
    324

    Hitachi  

    S-806C 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE
    Field Emission Scanning Electron Microscope
    178293

    Hitachi  

    4500 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Hitachi, 4500 SEM, 200mm
    Manufactured in 1990
    178296

    Hitachi  

    Microanalysis System 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Metrology, Microanalysis System 300mm
    Status: Bagged and Skidded
    178294

    Hitachi  

    AS5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm
    Status: Cold Shutdown

    Wafer Particle & Defect Analysis system AS5000

    Defect data server




    178710

    Hitachi  

    RS4000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    178297

    Hitachi  

    RS4000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    Hitachi, RS4000 , Defect Review, 300mm
    Manufactured in 2005; Status: Bagged and Skidded
    178298

    Hitachi  

    RS5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    Hitachi, RS5000, Defect Review, 300mm
    Manufactured in 2006; Status: Bagged and Skidded
    191596

    Hitachi  

    S-4500 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F*N* Burlington, Vermont
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Quartz PCI USB V9.5 (for Image Capture)
    System is powered up and under vacuum.
    Was under service contract through April 2017.


    S/N: 7926-02


    191493

    Hitachi  

    S-5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F*N* Burlington, Vermont
    Hitachi, S-5000, SEM, 200mm
    Hitachi, S-5000, SEM, 200mm

    Running.
    Power ON, Under Vacuum.

    S/N: 0500-02-03

    DOM 1995
    178299

    Hitachi  

    Z-5700 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Z-5700 Spectroscopy, 300mm
    Status: Bagged and Skidded
    6402

    JEOL  

    JSM 6100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Microscope with LaB Filament
    178300

    JEOL  

    7555 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    JEOL, Defect Review, 200mm
    Status: Cold Shutdown
    178302

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    178303

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    187765

    JEOL  

    JWS 7555S 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Singapore,
    JEOL, JWS 7555S, Defect Review, 200mm
    JEOL, JWS 7555S, Defect Review, 200mm
    189689

    JEOL  

    JWS-7515 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    JEOL, JWS-7515, 200mm, SEM
    JEOL, JWS-7515, 200mm, SEM

    S/N: WS179028-108
    178304

    KLA-Tencor  

    ES31 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    178305

    KLA-Tencor  

    ES32 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    KLA-Tencor, ES32, E-beam Inspection, 300mm
    Manufactured in 2007; Status: Bagged and Skidded
    188890

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 East Fishkill, New York
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    188891

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* East Fishkill, NY
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm

    S/N: 5158014


    Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

    81042

    Microspec  

    WDX-2A(Spectrometer) 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Scotia, NY
    MICROSPEC WDX-2A SPECTROMETER
    Spectrometer
    1817

    Precise Optics  

    PS61 

    List all items of this typeX-Ray Inspection Equipment - Other

    in Inspection Equipment

    1 F* Scotia, NY
    PRECISE OPTICS X-RAY IMAGE INTENSIFIER
    6" X-Ray Image Intensifier

    149933

    Reichert Inc  

    Ultracut S-EM FCS 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Scotia, NY
    REICHERT/LEICA LOW TEMPERATURE SECTIONING SYSTEM
    Low Temperature Sectioning System
    158112

    RK Print Coat Inst.  

    K303 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 3,200.00 F* Scotia, NY
    RK PRINTCOAT INSTRUMENTS MULTI COATER
    Multi Coater




    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Inspection Equipment:
    Buehler, CPS, Faxitron X-Ray, Gatan, Hewlett Packard, Hitachi, JEOL, KLA-Tencor, Microspec, Precise Optics, Reichert Inc, RK Print Coat Instruments, SELA