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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	110263	ADE	ADE	Episcan 1000	FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00	1			F*	Plano, Texas
	248208	Applied Materials	Applied Materials	G3 Lite	Scanning Electron Microscopes in Inspection Equipment AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041	1				Singapore
	111048	American Optical	American Optical	1177-1	Fiber Optic Light Sources in Fiber Optic Illuminators AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	2		195.05		Scotia, New York
	171583	Anatech Ltd	Anatech Ltd	Hummer 6.6T	Sample Coaters in Sample Preparation ANATECH HUMMER 6.6T SPUTTER SYSTEM: Sputter System	1			F*	Scotia, New York
	204578	Orbotech	Orbotech	Ultra Discovery VM	Metrology Equipment - Other in Metrology Equipment AOI Orbotech Ultra Discovery VM: Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits High throughput and superior detection with minimal number of false calls Especially designed for inspection of the finest lines down to 10μm Quick set-up even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP TechnologyTM Push-to-Scan®: A ‘no set-up’ process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full ‘Step and Repeat’ functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed	1		24,906.67		Regensburg, Bavaria
	184614	ATM GmbH	ATM GmbH	Brillant BR250.2	Cut-Off Saws in Surface Processing Equipment ATM GmbH CUT OFF SAW 12" : Cut-Off Saw	1			F*	Scotia, New York
	1786	Bausch & Lomb	Bausch & Lomb	Type A	Stands in Parts and Accessories, Microscope BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND: Type A Incident Light Stand Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope	12				Scotia, New York
	1785	Bausch & Lomb	Bausch & Lomb	312690	Parts and Accessories - Other in Parts and Accessories, Microscope BAUSCH & LOMB ER-ARM: ER-Arm Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope	10		180.05	F*	Scotia, New York
	208308	Bausch and Lomb	Bausch and Lomb	MicroZoom	Upright Microscopes in Optical Microscopes BAUSCH & LOMB INDUSTRIAL MICROSCOPE INCIDENT LIGHT: Industrial microscope with long working distance objectives.	1			F*	Scotia, New York
	964	Bausch & Lomb	Bausch & Lomb	MicroZoomII	Microscopes - Other in Optical Microscopes BAUSCH & LOMB MICROSCOPE WORK STATION: Microscope Work Station Long working distance objectives	1				Scotia, New York
	248	Bausch & Lomb	Bausch & Lomb	StereoZoom 7	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X: Stereo Zoom Microscope with Camera	1				Scotia, New York
	3264	Bausch & Lomb	Bausch & Lomb	StereoZoom 1	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X: Stereo Zoom Microscope Microscopes listed are for pod and eyepieces only	13		225.06		Scotia, New York
	110365	Bausch & Lomb	Bausch & Lomb	StereoZoom 2	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 2X: Stereo Zoom Microscope   Microscopes listed are for pod and eyepieces only	1		350.09		Scotia, New York
	1800	Bausch & Lomb	Bausch & Lomb	StereoZoom 5	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X: Stereo Zoom Microscope Scopes listed include pod and eyepieces only	1		600.16		Scotia, New York
	159266	Bausch & Lomb	Bausch & Lomb	SZ4	Stereo Microscopes in Optical Microscopes Bausch & Lomb Stereo Zoom 4: StereoZoom 4 Microscope with Boom Stand	1			F*	Plano, TX
	161016	Bausch & Lomb	Bausch & Lomb	StereoZoom 4	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 4: Microscope on Small Base	1				Plano, TX
	161018	Bausch & Lomb	Bausch & Lomb	StereoZoom 6 Plus	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6 Plus: Microscope Head	1			F*	Plano, TX
	159267	Bausch & Lomb	Bausch & Lomb	SZ 6-ST	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6-ST: StereoZoom Microscope with Boom Stand	1				Plano, TX
	157435	Bausch & Lomb	Bausch & Lomb	StereoZoom 7	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB StereoZoom 7: Microscope & Boom Stand	1			F*	Plano, TX
	110364	Bausch & Lomb	Bausch & Lomb	Type K	Stands in Parts and Accessories, Microscope BAUSCH & LOMB TYPE K STAND: K Stand for B&L StereoZoom Microscopes Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope E-Arm not included	1				Scotia, New York
	231442	Bio-Rad Q7 Overlay Metrology Tool	Bio-Rad Q7 Overlay Metrology Tool		Metrology Equipment - Other in Metrology Equipment Bio-Rad Q7 Overlay Metrology Tool: Bio-Rad Q7 Overlay Metrology Tool	1				Plano, Texas
	219230	Bio-Rad	Bio-Rad	Q8	Metrology Equipment - Other in Metrology Equipment Bio-Rad Q8 Overlay Metrology Tool: Bio-Rad Q8 Overlay Metrology Tool	1				Plano, Texas
	225795	Bio-Rad	Bio-Rad	QS-1200	FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional	1		110,029.48		Plano, Texas
	31390	Bio-Rad	Bio-Rad	Q5	Overlay Registration in Critical Dimension Measurement Equipment BioRad Q5: Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Single and Two-Axis Overlay Registration	1			F*	Plano, TX
	121504	Bio-Rad	Bio-Rad	Q5	Overlay Registration in Critical Dimension Measurement Equipment Biorad Q5: Overlay Registration Tool	2				Plano, TX
	54652	Bio-Rad	Bio-Rad	Q7/Q8	Overlay Registration in Critical Dimension Measurement Equipment BioRad Q7/Q8 Overlay Metrology Tool: Overlay Metrology Tool for up to 200mm Wafers	1			F*	Plano, TX
	109425	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand w/ Rectangular Horizontal Post Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	6				Scotia, New York
	109122	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	19			F*	Scotia, New York
	109549	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand w/ Rotatable Knuckle Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109553	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109554	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109598	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Table Clamp Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	4				Scotia, New York
	109648	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	1				Scotia, New York
	109427	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Dual Arm Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2		350.09		Scotia, New York
	209828	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology	1				Malta, New York
	4436	Buehler	Buehler	Consumables	Polishing & Grinding Sample Prep Equipment in Sample Preparation BUEHLER CONSUMABLES, POLISHING AND GRINDING: Polishing and Grinding Consumables	4				Scotia, NY
	122523	Buehler	Buehler	Dressing Chuck	Cut-Off Saws in Surface Processing Equipment BUEHLER ISOMET DRESSING CHUCK: Dressing Chuck	2		185.05	F*	Scotia, New York
	142877	Buehler	Buehler	ISOMET	Cut-Off Saws in Surface Processing Equipment BUEHLER LOW SPEED CUT-OFF SAW: Precision Sectioning Saw Representative photo - color of saw may vary Various ISOMET chucks available.  See other information for more details.	2		3,325.89	F*	Scotia, New York
	116574	Buehler	Buehler	Primet	Sample Preparation - Other in Sample Preparation BUEHLER PRIMET MODULAR DISPENSING SATELLITE: Modular Dispensing Satellite	1		625.17	F*	Scotia, New York
	7353	CPS	CPS	6004/1958	Scanning Electron Microscopes in Inspection Equipment CPS SEM ELECTRON GUN POWER SUPPLY 30KV: Electron Gun Power Supply CPS SEM Power Supply 6004	1		3,751.00		Scotia, New York
	144802	CR Technology	CR Technology	UF160/0	Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer	1				Plano, TX
	28680	Dage-MTI	Dage-MTI	SERIES 68	Cameras and Controllers in Optical Microscopes DAGE-MTI SERIES 68 INFRARED CAMERA: Infrared Camera	2		1,100.29		Scotia, New York
	194899	DELTRONIC	DELTRONIC	DH14-RR	Measuring Microscopes in Optical Microscopes Deltronic DH14-RR Profile Projector : Deltronic DH14-RR Profile Projector  20X Objective Lens	1				Plano, Texas
	57426	Denton	Denton	DESK II	Sample Coaters in Sample Preparation DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP : Metal Sputter	1		6,251.67	F*	Scotia, New York
	159268	Diagnostic Instrumts	Diagnostic Instrumts		Stereo Microscopes in Optical Microscopes Diagnostic Instruments: Microscope Boom Stand	2				Plano, TX
	109548	Diagnostic Instrumts	Diagnostic Instrumts	SMS16-A	Stands in Parts and Accessories, Microscope DIAGNOSTIC INSTRUMENTS BOOM STAND: Weighted Base Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	86452	Diagnostic Instrumts	Diagnostic Instrumts	SMS16-B	Stands in Parts and Accessories, Microscope DIAGNOSTIC INSTRUMENTS BOOM STAND: Boom Stand	1		325.09	F*	Scotia, New York
	18711	Dolan Jenner	Dolan Jenner	180	Fiber Optic Light Sources in Fiber Optic Illuminators DOLAN JENNER FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	1		150.04	F*	Scotia, New York
	122729	Dolan Jenner	Dolan Jenner	PL-750A- 111	Fiber Optic Light Sources in Fiber Optic Illuminators DOLAN JENNER FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	1		225.06	F*	Scotia, NY
	230317	FEI	FEI	ExSolve CLM next Gen	Microscopes - Other in Optical Microscopes FEI, ExSolve CLM next Gen, 300mm, S/N 9923535: FEI, ExSolve CLM next Gen, 300mm, S/N 9923535	1				Malta, New York
	230318	FEI	FEI	ExSolve CLM next Gen	Microscopes - Other in Optical Microscopes FEI, ExSolve CLM next Gen, 300mm, S/N 9923609: FEI, ExSolve CLM next Gen, 300mm, S/N 9923609	1				Malta, New York
	134541	FIBER OPTIC LIGHT SOURCE	FIBER OPTIC LIGHT SOURCE		Fiber Optic Light Sources in Fiber Optic Illuminators FIBER OPTIC LIGHT SOURCE: Remote Fiber Optic Illuminator Model FOI-150-Remote	1		180.05		Scotia, New York
	134624	FIBER OPTIC LIGHT SOURCE	FIBER OPTIC LIGHT SOURCE		Fiber Optic Light Sources in Fiber Optic Illuminators FIBER OPTIC LIGHT SOURCE: Fiber Optic Illuminator Manufacturer Unknown	1		180.05		Scotia, New York
	238938	Four Dimensions	Four Dimensions	CV92A	CV Plotters in Metrology Equipment Four Dimensions CV92A Semiautomatic CV Plotter: Four Dimensions CV92A Semiautomatic CV Plotter Mercury Probe System Control Computer Embedded Computer	1		50,013.40		Plano, Texas
	45435	Gaertner	Gaertner	L116B	Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER: Ellipsometer Upgraded in 2004 by Gaertner	1			F*	Scotia, New York
	39958	Gaertner	Gaertner	L2W16E.1550	Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER 150 MM: Ellipsometer	1				Scotia, New York
	233897	Gatan	Gatan	691 PIPS	Sample Preparation - Other in Sample Preparation GATAN PRECISION ION POLISHING SYSTEM: Precision Ion Polishing System (PIPS). The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.	1			F*	Scotia, New York
	49926	GCA/Tropel	GCA/Tropel	9000	Unpatterned Wafer Inspection in Surface Inspection GCA/TROPEL 9000: Surface Flatness Analyzer	1				Plano, TX
	35762	Hitachi	Hitachi	S-7000	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi S-7000: CD SEM Measurement Tool	1			F*	Plano, TX
	237745	HMI	HMI	eScan 500	Scanning Electron Microscopes in Inspection Equipment HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm	1				Malta, New York
	202816	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3.	1				Malta, New York
	202817	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1				Malta, New York
	332	Karl Storz	Karl Storz	483C	Parts and Accessories - Other in Parts and Accessories, Microscope KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE : Twin Fiber Optic Light Source Light guide not included.	1		350.09		Scotia, New York
	237748	KLA-Tencor	KLA-Tencor	AMI2900	Wafer Inspection Microscopes in Optical Microscopes KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module	1				Malta, New York
	218321	KLA-Tencor	KLA-Tencor	AIT	Patterned Wafer Inspection in Surface Inspection KLA-Tencor AIT Patterned Wafer Inspection Tool: KLA-Tencor AIT Patterned Wafer Inspection Tool Call for Details	1				Plano, Texas
	104306	KLA-Tencor	KLA-Tencor	AlphaStep 300	Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer	1				Plano, TX
	247845	KLA-Tencor	KLA-Tencor	Auto RS-55tc	4 & 6 Point Probes in Resistivity Testers KLA-Tencor Auto RS-55tc Resistivity Test Tool: KLA-TENCOR Auto RS-55tc Resistivity Mapping System Accommodates all Wafer Sizes from 50mm – 200mm 5 Megaohm/sq Measurement Range Typical Measurement Time: 5 – 4.5 Seconds per Test Site <0.2% (1 sigma) Measurement Repeatability Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC PC Based System Controller 25 MHz 486 Based MPU 44 MB Removable Hard Disk 110 MB Fixed Hard Disk Drive 5” Floppy Disk Drive X-Y Map: Up to 1200 Sites Programmable Probe Qualification: 20 sites 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)	1		80,021.44	N*	Austin, Texas
	5310	KLA-Tencor	KLA-Tencor	7700	Patterned Wafer Inspection in Surface Inspection KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER: Patterned Wafer Contamination Analyzer Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films Capable of measuring defects on unpatterned wafers Capable of measuring wafers from 4” to 8” High sensitivity on after-etch and high topography applications Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers	1			F*	Scotia, New York
	247844	KLA-Tencor	KLA-Tencor	RS-55tc	4 & 6 Point Probes in Resistivity Testers KLA-Tencor RS-55tc Resistivity Test Tool: KLA-Tencor RS-55tc Resistivity Test Tool Accommodates all Wafer Sizes from 50mm – 200mm Sheet Resistance Measurement of 5 mohm/sq to 5 Mohm/sq Typical Measurement Time: 5 – 4.5 Seconds per Test Site <0.2% (1 sigma) Measurement Repeatability X-Y Map: Programmable Up to 1200 Sites Probe Qualification: 20 sites 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included) PC Based System Controller with Color Monitor	1		35,009.38	N*	Austin, Texas
	247843	KLA-Tencor	KLA-Tencor	UV-1050	Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Included	1		55,014.74	N*	Austin, Texas
	1127	Leco	Leco	VC-50	Cut-Off Saws in Surface Processing Equipment LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE: Vari/Cut Off Saw	1			F*	Scotia, New York
	18713	Fostec	Fostec	8300	Fiber Optic Light Sources in Fiber Optic Illuminators LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source Representative photo These units are manufactured by Fostec and re-branded by different companies. The light source received may not be branded Fostec.	19		175.05	F*	Scotia, New York
	186519	Leica	Leica	INM20	Wafer Inspection Microscopes in Optical Microscopes LEICA AUTOMATED WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system	1			F*	Scotia, New York
	1893	Leica	Leica	445945	Parts and Accessories - Other in Parts and Accessories, Microscope LEICA E-ARM FOCUSING DRIVE: Focusing Drive For MS5/MZ6/MZ8	9			F*	Scotia, New York
	243053	Leica	Leica	Polylite 88	Upright Microscopes in Optical Microscopes LEICA REICHERT BRIGHTFIELD DARKFIELD : Long Working Distance Objectives	1			F*	Scotia, New York
	165299	Leica	Leica	S6 E	Stereo Microscopes in Optical Microscopes LEICA STEREO MICROSCOPE 6.3X - 40X: Stereo Microscope with Boom Stand and Ring Light	1		1,550.42	F*	Scotia, New York
	192026	Leica	Leica	S6 E	Stereo Microscopes in Optical Microscopes LEICA STEREO MICROSCOPE 6.3X - 40X: Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens	1		1,725.46	F*	Scotia, New York
	37954	Leica	Leica	INM 100	Upright Microscopes in Optical Microscopes LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD: Wafer Inspection Microscope New, never used	1			F*	Scotia, New York
	169430	Leica	Leica	Wild M8	Stereo Microscopes in Optical Microscopes LEICA WILD STEREO MICROSCOPE 6X - 50X: Stereo Microscope	1				Scotia, New York
	1643	Leica	Leica	POLYLITE88	Upright Microscopes in Optical Microscopes LEICA/REICHERT METALLURGICAL MICROSCOPE: Metallurgical Microscope - Camera and controller not included	1			F*	Scotia, New York
	1641	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION : Manual Wafer Inspection Microscope MicroVision MVT 1080 Wafer Loader	1			F*	Scotia, New York
	106575	Leica	Leica	Polylite 88	Upright Microscopes in Optical Microscopes LEICA/REICHERT MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Polylite 88 Reflected Light Microscope	2			F*	Scotia, New York
	186513	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system	1				Scotia, New York
	186518	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system	1			F*	Scotia, New York
	57070	Leitz	Leitz	Laborlux 12 HL	Upright Microscopes in Optical Microscopes LEITZ BRIGHTFIELD/DARKFIELD FILAR EYEPIECE: Brightfield, Darkfield and DIC Leitz Filar Eyepiece with Boeckeler Micrometer and Readout	1		5,951.59	F*	Scotia, New York
	115354	Leitz	Leitz	060-680-014	Measuring Microscopes in Optical Microscopes LEITZ MEASURING MICROSCOPE BODY: Measuring Microscope - Body only Unit is being sold AS IS	1		2,500.67		Scotia, New York
	47433	Leitz	Leitz	Secolux 6X6	Upright Microscopes in Optical Microscopes LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD: Brightfield Reflected Light Microscope	1		5,701.53	F*	Scotia, New York
	113754	Leitz	Leitz	Ergolux	Upright Microscopes in Optical Microscopes LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Brightfield/Darkfield Reflected Light	1		4,901.31	F*	Scotia, New York
	89143	Leitz	Leitz	Ergolux	Upright Microscopes in Optical Microscopes LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Brightfield Reflected Light/Transmitted Light Microscope	1		5,251.41	F*	Scotia, New York
	205912	Matrix Corp	Matrix Corp	Matrix X3	Metrology Equipment - Other in Metrology Equipment Matrix X3 X-Ray System: high speed X-Ray system	1				Regensburg, Bavaria
	58429	McPherson	McPherson	2035	UV-Visible Spectrophotometers in Spectrophotometers MCPHERSON 2035 SPECTROMETER: UV-VIS-IR Spectrophotometer	1			F*	Scotia, New York
	18582	Melles Griot	Melles Griot	04TFF002	Microscopes - Other in Optical Microscopes MELLES GRIOT FINE FOCUSING MICROSCOPE: Fine Focusing Microscope	3		450.12		Scotia, New York
	111690	MICROSCOPE STAND	MICROSCOPE STAND		Stands in Parts and Accessories, Microscope MICROSCOPE STAND: Large StereoZoom Microscope Stand Available only with purchase of a B&L, Nikon, or Olympus StereoZoom Microscope	1			F*	Scotia, New York
	81042	Microspec	Microspec	WDX-2A(Spectrometer)	Scanning Electron Microscopes in Inspection Equipment MICROSPEC WDX-2A SPECTROMETER: Spectrometer	1				Scotia, New York
	133353	Mitutoyo	Mitutoyo	176-901-1A	Measuring Microscopes in Optical Microscopes MITUTOYO TOOLMAKER'S MICROSCOPE: Toolmakers Microscope	1			F*	Scotia, New York
	238960	Rudolph Technologies	Rudolph Technologies	MPC 200XCu	Film Thickness Testers - Other in Film Thickness Testers MP200: Rudolph MetaPulse 200 non copper / double delay stage with 5" Chuck.  2 Loadports for 6/8 inch Laser is broken!	1				Villach, Carinthia
	244540	Rudolph Technologies	Rudolph Technologies	MP200	Film Thickness Testers - Other in Film Thickness Testers MP200 double path tool : non copper tool; double path tool delay stage; 6 inch chuck	1				Villach, Carinthia
	3863	Nanometrics	Nanometrics	NANOLINE III	Optical CD Measurement in Critical Dimension Measurement Equipment NANOMETRICS CRITICAL DIMENSION COMPUTER: Critical Dimension Computer Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.	1			F*	Scotia, New York
	241510	NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm	NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm		Other Items in Microscopes NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm	1				Malta, New York
	42358	Nicolet	Nicolet	NEXUS 470	FT-IR Spectrometers in Spectrometers NICOLET (THERMO) FT-IR SPECTROMETER : FT-IR with Spectra-Tech Continuum Scope and TGA Interface Nicolet NEXUS 470 Nicolet acquired by Thermo Scientific	1			F*	Scotia, New York
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Metrology Equipment: ADE, American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, Bausch & Lomb, Inc, Bausch and Lomb, Bio-Rad, Buehler, Carl Zeiss, CPS, CR Technology, Dage-MTI, DELTRONIC, Denton, Diagnostic Instruments, Dolan Jenner, FEI, Fostec, Four Dimensions, Gaertner, Gatan, GCA/Tropel, Hitachi, HMI, HSEB, Karl Storz, KLA Tencor, KLA-Tencor, Leco, Leica, Leica, Leitz, Matrix Corp, McPherson, Melles Griot, Microspec, Mitutoyo, Nanometrics, Nicolet, Nikon, Nikon, Olympus, Orbotech, Plasmos, Reichert Inc, Reichert-Jung, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Schott Fostec, Semprex, Sloan, Solid State Measurement, Spectronic Unicam, Thermo Electron, Veeco Instruments, Vision Engineering, Volpi, Well, Wild, Zeiss