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Critical Dimension Measurement Equipment


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Group Offers into sub-categories under Critical Dimension Measurement EquipmentGroup Offers into sub-categories under Critical Dimension Measurement Equipment

List all 4 product types under Critical Dimension Measurement EquipmentList all 4 product types under Critical Dimension Measurement Equipment


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     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
    Make Model
      $  
    180474

    Applied Materials  

    NanoSEM 3D 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* East Fishkill, NY
    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


    SEM - Critical Dimension (CD) Measurement

    Currently configured for 300mm wafers

    CE Marked

    Install Type: Stand Alone

    Cassette Interface:

    • (3) 300mm FOUP

    Roll-Around Ergo-Station w/Touch-Screen

    Status Lamp

    Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8)

    Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

     

    Software Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8

    180514

    Applied Materials  

    NanoSEM 3D 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* East Fishkill, NY
    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


    SEM - Critical Dimension (CD) Measurement

    Currently configured for 300mm wafers

    CE Marked

    Install Type: Stand Alone

    Cassette Interface:

    • (3) 300mm FOUP

    Roll-Around Ergo-Station w/Touch-Screen

    Status Lamp

    Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8)

    Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

     

    Software Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8

     

    Tool ID: KA03

    189511

    Applied Materials  

    Semvision CX 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Burlington, Vermont
    Applied Materials, SEMVision CX, 200mm,
    Applied Materials, SEMVision CX, 200mm,

    Serial Number is W854.
    31390

    Bio-Rad  

    Q5 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    1 Plano, TX
    BioRad Q5
    Overlay Registration Tool - Has Been Upgraded to a Q6

    CD Measurement, Single and Two-Axis Overlay Registration
    121504

    Bio-Rad  

    Q5 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    2 Plano, TX
    Biorad Q5
    Overlay Registration Tool
    121505

    Bio-Rad  

    Q7 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    3 Plano, TX
    Biorad Q7
    Overlay Registration Tool
    54651

    Bio-Rad  

    Q7/Q8 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    1 Plano, TX
    BioRad Q7/Q8 Overlay Metrology Tool
    Overlay Metrology Tool for up to 200mm Wafers
    54652

    Bio-Rad  

    Q7/Q8 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    1 F* Plano, TX
    BioRad Q7/Q8 Overlay Metrology Tool
    Overlay Metrology Tool for up to 200mm Wafers
    122412

    Bio-Rad  

    Q8 

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    1 Plano, TX
    Biorad Q8
    Overlay Registration
    35762

    Hitachi  

    S-7000 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Plano, TX
    Hitachi S-7000
    CD SEM Measurement Tool
    178287

    Hitachi  

    S-7800 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Singapore,
    Hitachi, S-7800 CD-SEM, 200mm
    Manufactured in 2008
    77955

    JEOL  

    JWS-7505ZH 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Plano, TX
    Jeol JWS-7505ZH
    Critical Dimension Scanning Electron Microscope
    191527

    KLA-Tencor  

    8100XP 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F*N* Singapore,
    KLA-Tencor, 8100XP, CD SEM, 200mm
    KLA-Tencor, 8100XP, CD SEM, 200mm

    S/N: 602
    3863

    Nanometrics  

    NANOLINE III 

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    1 F* Scotia, NY
    NANOMETRICS CRITICAL DIMENSION COMPUTER
    Critical Dimension Computer

    Large memory digital computer calculates line widths
    and provides statistics on in process wafer and photomasks.
    49938

    Nanometrics  

    CD-50 

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    1 F* Plano, TX
    Nanometrics Nanoline CD-50
    CD Measurement System
    5074

    Nanometrics  

    CD-50 

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    1 Plano, TX
    Nanometrics Nanoline CD-50
    Critical Dimension Measurement Tool for up to 6" Wafers


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Critical Dimension Measurement Equipment:
    Applied Materials, Inc., Bio-Rad, Hitachi, JEOL, KLA-Tencor, Nanometrics