How to post on WWX
Latest Listings!
 Fast¬†¬†FIND      full search   tips    
in  ALL  ONLY CD Measurement Eq
Serving  Our Guest Log in    RegisterHow to post your own listings   View prices in  or ...    
ALL CATEGORIES   Semiconductor Mfg   Metrology Eq   View   Search-by-Specs    Input    Edit    
View All Offers Under

Critical Dimension Measurement Equipment


» Switch Major Category
Click an item's ID# below for its full specifications and source, or:

Group Offers into sub-categories under Critical Dimension Measurement EquipmentGroup Offers into sub-categories under Critical Dimension Measurement Equipment

List all 4 product types under Critical Dimension Measurement EquipmentList all 4 product types under Critical Dimension Measurement Equipment


  • To sort on a column, click the column head; click it again to reverse the sort.
  • Click the links under the Product Type column head to see other like items of that type.
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
192337
Leica  

Leica  

E3610 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Advantest, E3610, MASK CD SEM,:
Advantest, E3610, MASK CD SEM,
Leica E3610 CD SEM

WAFER MASK CD SEM

S/N : 710005324

2006 Vintage

For Post 64nm Technology node

Front End Module
Fan filter unit (FFU)
SMIF Versa Port 
InSPEQ Bench module
Electric Frame
Vacuum pump unit 
Ozonizer Unit
Custom TMC active isolation pad for 24" raised floor
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
121504
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

2   Plano, TX
Biorad Q5:
Overlay Registration Tool
31390
Bio-Rad  

Bio-Rad  

Q5 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   Plano, TX
BioRad Q5:
Overlay Registration Tool - Has Been Upgraded to a Q6

CD Measurement, Single and Two-Axis Overlay Registration
121505
Bio-Rad  

Bio-Rad  

Q7 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

3   Plano, TX
Biorad Q7:
Overlay Registration Tool
54651
Bio-Rad  

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   Plano, TX
BioRad Q7/Q8 Overlay Metrology Tool:
Overlay Metrology Tool for up to 200mm Wafers
54652
Bio-Rad  

Bio-Rad  

Q7/Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   F* Plano, TX
BioRad Q7/Q8 Overlay Metrology Tool:
Overlay Metrology Tool for up to 200mm Wafers
122412
Bio-Rad  

Bio-Rad  

Q8 

List all items of this typeOverlay Registration

in Critical Dimension Measurement Equipment

1   Plano, TX
Biorad Q8:
Overlay Registration
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
77955
JEOL  

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Plano, TX
Jeol JWS-7505ZH:
Critical Dimension Scanning Electron Microscope
3863
Nanometrics  

Nanometrics  

NANOLINE III 

List all items of this typeOptical CD Measurement

in Critical Dimension Measurement Equipment

1   F* Scotia, NY
NANOMETRICS CRITICAL DIMENSION COMPUTER:
Critical Dimension Computer

Large memory digital computer calculates line widths
and provides statistics on in process wafer and photomasks.


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Critical Dimension Measurement Equipment:
Applied Materials, Inc., Bio-Rad, Hitachi, JEOL, Leica, Nanometrics