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Electron Microscopy


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Group Offers into sub-categories under Electron MicroscopyGroup Offers into sub-categories under Electron Microscopy

List all 3 product types under Electron MicroscopyList all 3 product types under Electron Microscopy


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     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
    Make Model
      $  
    7353

    CPS  

    6004/1958 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 3,750.00 Scotia, NY
    CPS ELECTRON GUN POWER SUPPLY 30KV
    Electron Gun Power Supply

    CPS Computer Power Supply 6004
    181557

    FEI  

    200XP TMP 

    List all items of this typeFocused Ion Beam Tools

    in Electron Microscopy

    1 F* Scotia, New York
    FEI FOCUSED ION BEAM SYSTEM
    Focus Ion Beam System

    The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
    100557

    Hitachi  

    S-2400 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-2400 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Micrscope (SEM)
    60831

    Hitachi  

    S-4100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE
    Field Emission Electron Microscope

    NB: System is missing Ion pump power supply. Sold "As Is".
    324

    Hitachi  

    S-806C 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE
    Field Emission Scanning Electron Microscope
    178293

    Hitachi  

    4500 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Hitachi, 4500 SEM, 200mm
    Manufactured in 1990
    178296

    Hitachi  

    Microanalysis System 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Metrology, Microanalysis System 300mm
    Status: Bagged and Skidded
    178294

    Hitachi  

    AS5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm
    Status: Cold Shutdown

    Wafer Particle & Defect Analysis system AS5000

    Defect data server




    178297

    Hitachi  

    RS4000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    Hitachi, RS4000 , Defect Review, 300mm
    Manufactured in 2005; Status: Bagged and Skidded
    178710

    Hitachi  

    RS4000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    178298

    Hitachi  

    RS5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    Hitachi, RS5000, Defect Review, 300mm
    Manufactured in 2006; Status: Bagged and Skidded
    191596

    Hitachi  

    S-4500 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F*N* Burlington, Vermont
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Quartz PCI USB V9.5 (for Image Capture)
    System is powered up and under vacuum.
    Was under service contract through April 2017.


    S/N: 7926-02


    191493

    Hitachi  

    S-5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F*N* Burlington, Vermont
    Hitachi, S-5000, SEM, 200mm
    Hitachi, S-5000, SEM, 200mm

    Running.
    Power ON, Under Vacuum.

    S/N: 0500-02-03

    DOM 1995
    178299

    Hitachi  

    Z-5700 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Z-5700 Spectroscopy, 300mm
    Status: Bagged and Skidded
    6402

    JEOL  

    JSM 6100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Microscope with LaB Filament
    178300

    JEOL  

    7555 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    JEOL, Defect Review, 200mm
    Status: Cold Shutdown
    178302

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    178303

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    187765

    JEOL  

    JWS 7555S 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Singapore,
    JEOL, JWS 7555S, Defect Review, 200mm
    JEOL, JWS 7555S, Defect Review, 200mm
    189689

    JEOL  

    JWS-7515 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    JEOL, JWS-7515, 200mm, SEM
    JEOL, JWS-7515, 200mm, SEM

    S/N: WS179028-108
    178304

    KLA-Tencor  

    ES31 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    178305

    KLA-Tencor  

    ES32 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    KLA-Tencor, ES32, E-beam Inspection, 300mm
    Manufactured in 2007; Status: Bagged and Skidded
    188890

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 East Fishkill, New York
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    188891

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* East Fishkill, NY
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm

    S/N: 5158014


    Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

    81042

    Microspec  

    WDX-2A(Spectrometer) 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Scotia, NY
    MICROSPEC WDX-2A SPECTROMETER
    Spectrometer
    192342

    Applied Materials  

    SEMVision G3 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 N* Taichung, Taichung City
    SEMVision G3, Applied Materials, 300mm, Defect Review System
    SEMVision G3, Applied Materials, 300mm, Defect Review System

    S/N: W-3009

    DOM : 5/1/2007


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Electron Microscopy:
    Applied Materials, Inc., CPS, FEI, Hitachi, JEOL, KLA-Tencor, Microspec