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Electron Microscopy


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List all 3 product types under Electron MicroscopyList all 3 product types under Electron Microscopy


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     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Note Location
    Make Model
      $  
    Offer 7353

    CPS  

    6004/1958 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 3,750.00 Scotia, NY
    CPS ELECTRON GUN POWER SUPPLY 30KV
    Electron Gun Power Supply

    CPS Computer Power Supply 6004
    Offer 181557

    FEI  

    200XP TMP 

    List all items of this typeFocused Ion Beam Tools

    in Electron Microscopy

    1 F* Scotia, New York
    FEI FOCUSED ION BEAM SYSTEM
    Focus Ion Beam System

    The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
    Offer 100557

    Hitachi  

    S-2400 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-2400 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Micrscope (SEM)
    Offer 60831

    Hitachi  

    S-4100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE
    Field Emission Electron Microscope

    NB: System is missing Ion pump power supply. Sold "As Is".
    Offer 324

    Hitachi  

    S-806C 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE
    Field Emission Scanning Electron Microscope
    Offer 178293

    Hitachi  

    4500 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Hitachi, 4500 SEM, 200mm
    Manufactured in 1990
    Offer 178294

    Hitachi  

    AS5000 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Hitachi, Metrology, 200mm
    Status: Cold Shutdown
    Offer 178296

    Hitachi  

    Microanalysis System 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    Hitachi, Metrology, Microanalysis System 300mm
    Status: Bagged and Skidded
    Offer 178299

    Hitachi  

    Z-5700 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Z-5700 Spectroscopy, 300mm
    Status: Bagged and Skidded
    Offer 6402

    JEOL  

    JSM 6100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Microscope with LaB Filament
    Offer 178302

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    Offer 178303

    JEOL  

    JEM-2500SE 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    Offer 187765

    JEOL  

    JWS 7555S 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Singapore,
    JEOL, JWS 7555S, Defect Review, 200mm
    JEOL, JWS 7555S, Defect Review, 200mm
    Offer 189689

    JEOL  

    JWS-7515 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F*N* Singapore,
    JEOL, JWS-7515, 200mm, SEM
    JEOL, JWS-7515, 200mm, SEM

    S/N: WS179028-108
    Offer 178304

    KLA-Tencor  

    ES31 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Singapore,
    Offer 188890

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 East Fishkill, New York
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    Offer 188891

    KLA-Tencor  

    eS810 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* East Fishkill, NY
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm

    S/N: 5158014


    Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

    Offer 81042

    Microspec  

    WDX-2A(Spectrometer) 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 Scotia, NY
    MICROSPEC WDX-2A SPECTROMETER
    Spectrometer


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer
    NOTE:
       when photo available
       when document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.
    Items from the following manufacturers are offered under Electron Microscopy:
    CPS, FEI, Hitachi, JEOL, KLA-Tencor, Microspec