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Electron Microscopy


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Group Offers into sub-categories under Electron MicroscopyGroup Offers into sub-categories under Electron Microscopy

List all 3 product types under Electron MicroscopyList all 3 product types under Electron Microscopy


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV
Electron Gun Power Supply

CPS Computer Power Supply 6004
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Electron Microscopy

1   F* Scotia, New York
FEI FOCUSED ION BEAM SYSTEM
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE
Field Emission Scanning Electron Microscope
178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
Hitachi, 4500 SEM, 200mm
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




178297
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm
Manufactured in 2005; Status: Bagged and Skidded
178710
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Taichung, Taichung City
178298
Hitachi  

Hitachi  

RS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Taichung, Taichung City
Hitachi, RS5000, Defect Review, 300mm
Manufactured in 2006; Status: Bagged and Skidded
191596
Hitachi  

Hitachi  

S-4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F*N* Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F*N* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Sunnyvale, California
Hitachi, S-5500- Schanning Electron Microscope, 300mm
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm
Status: Bagged and Skidded
6402
JEOL  

JEOL  

JSM 6100 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE
Scanning Electron Microscope with LaB Filament
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Taichung, Taichung City
JEOL, Defect Review, 200mm
Status: Cold Shutdown
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore,
JEOL, JWS 7555S, Defect Review, 200mm
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm
Manufactured in 2007; Status: Bagged and Skidded
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

81042
Microspec  

Microspec  

WDX-2A(Spectrometer) 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Scotia, NY
MICROSPEC WDX-2A SPECTROMETER
Spectrometer


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Electron Microscopy:
CPS, FEI, Hitachi, JEOL, KLA-Tencor, Microspec