|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
247844
|
KLA-Tencor
|
KLA-Tencor |
RS-55tc |
in Resistivity Testers
KLA-Tencor RS-55tc Resistivity Test Tool:KLA-Tencor RS-55tc Resistivity Test Tool - Accommodates all Wafer Sizes from 50mm – 200mm
- Sheet Resistance Measurement of 5 mohm/sq to 5 Mohm/sq
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- X-Y Map: Programmable Up to 1200 Sites
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
- PC Based System Controller with Color Monitor
|
1
|
|
35,009.38 |
N* |
Austin, Texas |
|
|
247845
|
KLA-Tencor
|
KLA-Tencor |
Auto RS-55tc |
in Resistivity Testers
KLA-Tencor Auto RS-55tc Resistivity Test Tool:KLA-TENCOR Auto RS-55tc Resistivity Mapping System - Accommodates all Wafer Sizes from 50mm – 200mm
- 5 Megaohm/sq Measurement Range
- Typical Measurement Time: 5 – 4.5 Seconds per Test Site
- <0.2% (1 sigma) Measurement Repeatability
- Thermal Chuck Temperature Measurement Accuracy: ±0.5ºC
- PC Based System Controller
- 25 MHz 486 Based MPU
- 44 MB Removable Hard Disk
- 110 MB Fixed Hard Disk Drive
- 5” Floppy Disk Drive
- X-Y Map: Up to 1200 Sites Programmable
- Probe Qualification: 20 sites
- 1 - 30 Programmable Routine Test Sites (ASTM Standard Tests Included)
|
1
|
|
80,021.44 |
N* |
Austin, Texas |
|
|
129073
|
KLA-Tencor
|
KLA-Tencor |
760-660139-00 |
in Other Motors
KLA-Tencor Power Changing Assy 760-660139-00:3 Lens Power Changing Assy complete w/optics
|
1
|
|
|
|
Plano, TX |
|
|
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Included
|
1
|
|
55,014.74 |
N* |
Austin, Texas |
|
|
133789
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
740-212542-000 |
in Lamps
KLA-Tencor 740-212542-000 Insert Assy with Lamps:KLA-Tencor 740-212542-000 Insert Assy with LampsInsert Assy with Lamps
|
1
|
|
|
|
Plano, TX |
|
|
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
|
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
95391
|
KLA
|
KLA |
710-651090-20 |
in Electrical and Electronic Components
KLA:Optics Interface PC BoardOptics Interface PC Board
|
1
|
|
|
|
Plano, TX |
|
|
149499
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658164-20 |
in Electrical and Electronic Components
KLA Tencor 710-658164-20 PLLAD-8 Assy:KLA Tencor 710-658164-20 PLLAD-8 AssyPLLAD-8 Assy
|
1
|
|
|
|
Plano, TX |
|
|
149500
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-653016-20 |
in Electrical and Electronic Components
KLA Tencor 710-653016-20 81B Assy:KLA Tencor 710-653016-20 81B Assy81B Assy
|
1
|
|
|
|
Plano, TX |
|
|
149501
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658076-20 |
in Electrical and Electronic Components
KLA Tencor 710-658076-20 Phase 3 Defect Processor PCB:KLA Tencor 710-658076-20 Phase 3 Defect Processor PCBPhase 3 Defect Processor PCB
|
1
|
|
|
|
Plano, TX |
|
|
149503
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658081-20 |
in Electrical and Electronic Components
KLA Tencor 710-658081-20 Defect Filter PCB Assy:KLA Tencor 710-658081-20 Defect Filter PCB AssyDefect Filter PCB Assy
|
1
|
|
|
|
Plano, TX |
|
|
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
|
Plano, TX |
|
|
248207
|
KLA
|
KLA |
QTX-300 |
in Pharmaceutical Laboratory and Scientific Equipment
KLA, QTX-300, 300mm, S/N 1006304891:KLA, QTX-300, 300mm, S/N 1006304891
|
1
|
|
|
N* |
Singapore |
|
|
95390
|
KLA
|
KLA |
710-659227-00 |
in Semiconductor Parts
KLA Instruments:Wafer Inspection BackplaneWafer Inspection Backplane
|
1
|
|
|
|
Plano, TX |
|
|
106858
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
81-86680 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 81-86680:Motor, Rotator DC w/Gearbox
|
1
|
|
|
|
Hudson, NY |
|
|
131811
|
KLA Mfr*
|
KLA Mfr* |
760-661136-00 |
in Semiconductor Parts
KLA Insulated Vertical Illuminator 760-661136-00:KLA Insulated Vertical Illuminator 760-661136-00Insulated Vertical Illuminator
|
1
|
|
|
|
Plano, TX |
|
|
132079
|
KLA Mfr*
|
KLA Mfr* |
710-657058-20 |
in Semiconductor Parts
KLA 710-657058-20 Auto Focus Led Driver:KLA 710-657058-20 Auto Focus Led DriverAuto Focus Led Driver
|
1
|
|
|
|
Plano, TX |
|
|
155840
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
410918 |
in Semiconductor Parts
KLA-Tencor PN 410918:L-Stylus, DurasharpL-Stylus, Durasharp
|
5
|
|
|
|
Plano, TX |
|
|
146781
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
91-0011 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 91-0011:Coupling Body 1/8" Barb
|
2
|
|
|
|
Hudson, NY |
|
|
146782
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
91-0013 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 91-0013:Coupling Insert 1/8" Barb
|
2
|
|
|
|
Hudson, NY |
|
|
146793
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
96-0002 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 96-0002:Regulator Preset 15psi
|
1
|
|
|
|
Hudson, NY |
|
|
242857
|
KLA
|
KLA |
eS32 |
in Test & Measurement Equipment
KLA eS32 E-beam Wafer Inspection 200mm:eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This system provides comprehensive, high-resolution inspection of both masks and wafers with unparalleled accuracy. The unit uses a proprietary optical probe to scan masks and wafers to detect defects and irregularities with a resolution reaching down to 1 micron. This high-precision scanning allows for comprehensive inspection of the entire surface of both the mask and wafer. The machine also includes powerful image processing and analysis algorithms which automatically detect defects, categorize them, and track their locations. KLA eS32 also includes a suite of automated defect correction tools which can rapidly repair standard and complex defects. In addition to its exhaustive defect detection capabilities, this tool also allows for statistical process control (SPC) analysis to ensure production processes maintain consistent quality and accuracy over time. TENCOR ES 32 also includes a user-friendly interface that makes it easy to operate and manage the asset. This user interface is highly customizable, allowing users to quickly change model settings, view detailed inspection reports, and receive real-time notifications of detected defects. In summary, KLA ES 32 is a high-performance mask and wafer inspection equipment that offers superior detection accuracy, automated defect correction, comprehensive statistical process control (SPC) analysis, and an easy-to-use user interface. This system can be used to monitor production lines, resulting in improved manufacturing quality, increased yield, and cost savings.
|
1
|
|
|
|
Austin, Texas |
|
|
50017
|
KLA-Tencor
|
KLA-Tencor |
Surfscan 4500 |
in Surface Inspection
Tencor Surfscan 4500:TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool - Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
|
1
|
|
45,012.06 |
|
Plano, Texas |
|
|
244539
|
KLA Tencor
|
KLA Tencor |
UV1250SE |
in Spectrophotometers
|
1
|
|
|
|
Villach, Carinthia |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Optical Microscopes
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
|
|
Malta, New York |
|
|
126787
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor SQ. 4" Wafer Locator Ring for Flexus 2320:SQ. 4" Wafer Locator Ring for Flexus 2320
|
1
|
|
|
|
Plano, TX |
|
|
126788
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor 3" Wafer Locator Rings for Flexus 2320:3" Wafer Locator Rings for Flexus 2320
|
2
|
|
|
|
Plano, TX |
|