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	View All Offers Under Metrology Equipment » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Offers into sub-categories under Metrology Equipment List all 58 product types under Metrology Equipment

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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	259151	Accent Optical Technologies QS-2200A FT-IR Spectrometer	Accent Optical Technologies QS-2200A FT-IR Spectrometer		FT-IR Spectrometers in Spectrometers Accent Optical Technologies QS-2200A FT-IR Spectrometer: Accent  Optical Technologies QS-2200A FT-IR Spectrometer KBR Optical Components Reflective Measurement of Epitaxial Silicon Thickness Automatic Wafer Handling Genmark Robot with Integrated Flatfinder & Controller Dual Cassette Platforms for up to 200mm Wafers ACCENT Robot Interface ACCENT 013-4738-2 Stage Controller ACCENT 013-4758-2 AC Power Box Control PC Running Windows XP OS ACCENT GUI Application Software SECS/GEM Interface Software	1				Plano, Texas
	110263	ADE	ADE	Episcan 1000	FT-IR Spectrometers in Spectrometers ADE Episcan 1000: ADE Episcan 1000 Film Thickness Measurement & Mapping Tool Measurement of Epi Films <25µ ON-LINE TECHNOLOGIES 2110 Spectrometer Head IRVINE OPTICAL Nanoloader II Dual Cassette Wafer Handler ADE ACS Controller Windows NT Operating System Price.............................................................................$75,000.00 As-Is Price....................................................................$40,000.00	1			F*	Plano, Texas
	111048	American Optical	American Optical	1177-1	Fiber Optic Light Sources in Fiber Optic Illuminators AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	2		195.05		Scotia, New York
	171583	Anatech Ltd	Anatech Ltd	Hummer 6.6T	Sample Coaters in Sample Preparation ANATECH HUMMER 6.6T SPUTTER SYSTEM: Sputter System	1			F*	Scotia, New York
	204578	Orbotech	Orbotech	Ultra Discovery VM	Metrology Equipment - Other in Metrology Equipment AOI Orbotech Ultra Discovery VM: Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits High throughput and superior detection with minimal number of false calls Especially designed for inspection of the finest lines down to 10μm Quick set-up even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP TechnologyTM Push-to-Scan®: A ‘no set-up’ process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full ‘Step and Repeat’ functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed	1		24,906.67		Regensburg, Bavaria
	184614	ATM GmbH	ATM GmbH	Brillant BR250.2	Cut-Off Saws in Surface Processing Equipment ATM GmbH CUT OFF SAW 12" : Cut-Off Saw	1			F*	Scotia, New York
	1786	Bausch & Lomb	Bausch & Lomb	Type A	Stands in Parts and Accessories, Microscope BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND: Type A Incident Light Stand Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope	12				Scotia, New York
	1785	Bausch & Lomb	Bausch & Lomb	312690	Parts and Accessories - Other in Parts and Accessories, Microscope BAUSCH & LOMB ER-ARM: ER-Arm Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope	10		180.05	F*	Scotia, New York
	208308	Bausch & Lomb	Bausch & Lomb	MicroZoom	Upright Microscopes in Optical Microscopes BAUSCH & LOMB INDUSTRIAL MICROSCOPE INCIDENT LIGHT: Industrial microscope with long working distance objectives.	1			F*	Scotia, New York
	964	Bausch & Lomb	Bausch & Lomb	MicroZoomII	Microscopes - Other in Optical Microscopes BAUSCH & LOMB MICROSCOPE WORK STATION: Microscope Work Station Long working distance objectives	1				Scotia, New York
	3264	Bausch & Lomb	Bausch & Lomb	StereoZoom 1	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X: Stereo Zoom Microscope Microscopes listed are for pod and eyepieces only	13		225.06		Scotia, New York
	110365	Bausch & Lomb	Bausch & Lomb	StereoZoom 2	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 2X: Stereo Zoom Microscope   Microscopes listed are for pod and eyepieces only	1		350.09		Scotia, New York
	1800	Bausch & Lomb	Bausch & Lomb	StereoZoom 5	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X: Stereo Zoom Microscope Scopes listed include pod and eyepieces only	1		600.16		Scotia, New York
	159266	Bausch & Lomb	Bausch & Lomb	SZ4	Stereo Microscopes in Optical Microscopes Bausch & Lomb Stereo Zoom 4: StereoZoom 4 Microscope with Boom Stand	1			F*	Plano, TX
	161016	Bausch & Lomb	Bausch & Lomb	StereoZoom 4	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 4: Microscope on Small Base	1				Plano, TX
	161018	Bausch & Lomb	Bausch & Lomb	StereoZoom 6 Plus	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6 Plus: Microscope Head	1			F*	Plano, TX
	159267	Bausch & Lomb	Bausch & Lomb	SZ 6-ST	Stereo Microscopes in Optical Microscopes Bausch & Lomb StereoZoom 6-ST: StereoZoom Microscope with Boom Stand	1				Plano, TX
	157435	Bausch & Lomb	Bausch & Lomb	StereoZoom 7	Stereo Microscopes in Optical Microscopes BAUSCH & LOMB StereoZoom 7: Microscope & Boom Stand	1			F*	Plano, TX
	110364	Bausch & Lomb	Bausch & Lomb	Type K	Stands in Parts and Accessories, Microscope BAUSCH & LOMB TYPE K STAND: K Stand for B&L StereoZoom Microscopes Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope E-Arm not included	1				Scotia, New York
	231442	Bio-Rad Q7 Overlay Metrology Tool	Bio-Rad Q7 Overlay Metrology Tool		Metrology Equipment - Other in Metrology Equipment Bio-Rad Q7 Overlay Metrology Tool: Bio-Rad Q7 Overlay Metrology Tool	1				Plano, Texas
	219230	Bio-Rad	Bio-Rad	Q8	Metrology Equipment - Other in Metrology Equipment Bio-Rad Q8 Overlay Metrology Tool: Bio-Rad Q8 Overlay Metrology Tool	1				Plano, Texas
	225795	Bio-Rad	Bio-Rad	QS-1200	FT-IR Spectrometers in Spectrometers Bio-Rad QS-1200 FT-IR Spectrometer: BIORAD QS-1200 Automated FT-IR Spectrometer Non-Destructive Measurement of Epitaxial Silicon Films PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage Manual Loading for up to 300mm Wafers 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping FTS-175 Optical Bench Dynamically Tuned Beam Splitter NKBr Beam Splitter Dual Frequency IR Source Upgraded HeNe Laser System Control PC with Windows XP, 320G HD & 1G RAM Win-IR Pro (Rev. 2.51) Application Software QS-500 Epi (Rev. 1.31) Application Software Microsoft Access Database Application System Software, Applications Software & Site Preparation Manuals Included Refurbished & Fully Functional	1		110,029.48		Plano, Texas
	258395	Bio-Rad	Bio-Rad	QS-500	FT-IR Spectrometers in Spectrometers Bio-Rad QS-500 FT-IR Spectrometer: Bio-Rad QS-500 FT-IR Spectrometer Transmissive & Reflective Film Measurement  Si Epi Thickness, C & O in Si, BPSG Analysis KBr Optical Components Bio-Rad SPC 3200 Data Station Upgradable to Computer Running Windows XP  Bio-Rad 013-4100 Spectrometer Controller Bio-Rad Stage Controller Bio-Rad Robot Interface Genmark Robot & Controller	1				Plano, Texas
	31390	Bio-Rad	Bio-Rad	Q5	Overlay Registration in Critical Dimension Measurement Equipment BioRad Q5: Overlay Registration Tool - Has Been Upgraded to a Q6 CD Measurement, Single and Two-Axis Overlay Registration	1			F*	Plano, TX
	54652	Bio-Rad	Bio-Rad	Q7/Q8	Overlay Registration in Critical Dimension Measurement Equipment BioRad Q7/Q8 Overlay Metrology Tool: Overlay Metrology Tool for up to 200mm Wafers	1			F*	Plano, TX
	109122	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	19			F*	Scotia, New York
	109425	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand w/ Rectangular Horizontal Post Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	6				Scotia, New York
	109549	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand w/ Rotatable Knuckle Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109553	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	109427	BOOM STAND	BOOM STAND		Stands in Parts and Accessories, Microscope BOOM STAND: Dual Arm Microscope Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2		350.09		Scotia, New York
	4436	Buehler	Buehler	Consumables	Polishing & Grinding Sample Prep Equipment in Sample Preparation BUEHLER CONSUMABLES, POLISHING AND GRINDING: Polishing and Grinding Consumables	4				Scotia, NY
	122523	Buehler	Buehler	Dressing Chuck	Cut-Off Saws in Surface Processing Equipment BUEHLER ISOMET DRESSING CHUCK: Dressing Chuck Representative photos	1			F*	Scotia, New York
	142877	Buehler	Buehler	ISOMET	Cut-Off Saws in Surface Processing Equipment BUEHLER LOW SPEED CUT-OFF SAW: Precision Sectioning Saw Representative photo - color of saw may vary Various ISOMET chucks available.  See other information for more details.	2				Scotia, New York
	116574	Buehler	Buehler	Primet	Sample Preparation - Other in Sample Preparation BUEHLER PRIMET MODULAR DISPENSING SATELLITE: Modular Dispensing Satellite	1			F*	Scotia, New York
	254015	CDE	CDE	ResMap 463-FOUP	4 & 6 Point Probes in Resistivity Testers CDE ResMap 463-FOUP Resistivity Mapping Tool: CDE ResMap 463-FOUP Resistivity Mapping Tool For 300mm & 200mm Wafers Automatic Probe Head Selection Please Inquire for Additional Details	1				Plano, Texas
	7353	CPS	CPS	6004/1958	Scanning Electron Microscopes in Inspection Equipment CPS SEM ELECTRON GUN POWER SUPPLY 30KV: Electron Gun Power Supply CPS SEM Power Supply 6004	1		3,751.00		Scotia, New York
	144802	CR Technology	CR Technology	UF160/0	Xray Fluorescence Spectrometers in Spectrometers CR Technology XRay System UF160/0: XRAY Wafer Analyzer	1				Plano, TX
	194899	DELTRONIC	DELTRONIC	DH14-RR	Measuring Microscopes in Optical Microscopes Deltronic DH14-RR Profile Projector : Deltronic DH14-RR Profile Projector  20X Objective Lens	1				Plano, Texas
	57426	Denton	Denton	DESK II	Sample Coaters in Sample Preparation DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP : Metal Sputter	1		6,251.67	F*	Scotia, New York
	159268	Diagnostic Instrumts	Diagnostic Instrumts		Stereo Microscopes in Optical Microscopes Diagnostic Instruments: Microscope Boom Stand	2				Plano, TX
	109548	Diagnostic Instrumts	Diagnostic Instrumts	SMS16-A	Stands in Parts and Accessories, Microscope DIAGNOSTIC INSTRUMENTS BOOM STAND: Weighted Base Boom Stand Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included	2				Scotia, New York
	106265	Digital Instruments	Digital Instruments	Nanoscope IIIA	Metrology Equipment - Other in Metrology Equipment DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA: Atomic Force Microscope AFM Scanning Probe Microscope SPM Stage size: 300mm Accessories: Stage Controller: NanoScope Model 5000C-1 Scanning Probe Microscope Controller: NanoScope IIIA Vibration Isolation Table and Acoustic Enclosure	1				Scotia, New York
	18711	Dolan Jenner	Dolan Jenner	180	Fiber Optic Light Sources in Fiber Optic Illuminators DOLAN JENNER FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	1		150.04	F*	Scotia, New York
	122729	Dolan Jenner	Dolan Jenner	PL-750A- 111	Fiber Optic Light Sources in Fiber Optic Illuminators DOLAN JENNER FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source	1		225.06	F*	Scotia, NY
	134541	FIBER OPTIC LIGHT SOURCE	FIBER OPTIC LIGHT SOURCE		Fiber Optic Light Sources in Fiber Optic Illuminators FIBER OPTIC LIGHT SOURCE: Remote Fiber Optic Illuminator Model FOI-150-Remote	1		180.05		Scotia, New York
	134624	FIBER OPTIC LIGHT SOURCE	FIBER OPTIC LIGHT SOURCE		Fiber Optic Light Sources in Fiber Optic Illuminators FIBER OPTIC LIGHT SOURCE: Fiber Optic Illuminator Manufacturer Unknown	1		180.05		Scotia, New York
	238938	Four Dimensions	Four Dimensions	CV92A	CV Plotters in Metrology Equipment Four Dimensions CV92A Semiautomatic CV Plotter: Four Dimensions CV92A Semiautomatic CV Plotter Mercury Probe System Control Computer Embedded Computer	1		50,013.40		Plano, Texas
	248945	Frontier Semi	Frontier Semi	900TC-VAC	Stress Measurement Equipment in Metrology Equipment Frontier 900TC-VAC Wafer Stress Gauge: Frontier 900TC-VAC Wafer Stress Gauge	1				Plano, Texas
	45435	Gaertner	Gaertner	L116B	Ellipsometers in Film Thickness Testers GAERTNER ELLIPSOMETER: Ellipsometer Upgraded in 2004 by Gaertner	1			F*	Scotia, New York
	49926	GCA/Tropel	GCA/Tropel	9000	Unpatterned Wafer Inspection in Surface Inspection GCA/TROPEL 9000: Surface Flatness Analyzer	1				Plano, TX
	35762	Hitachi	Hitachi	S-7000	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi S-7000: CD SEM Measurement Tool	1			F*	Plano, TX
	259333	Insidix	Insidix	Compact II	Metrology Equipment - Other in Metrology Equipment Insidix Compact II: currently in use available mid of 2026	1				Regensburg, Bavaria
	249592	J. A. Woollam	J. A. Woollam	M-2000	Ellipsometers in Film Thickness Testers J.A. Woollam M-2000 Spectroscopic Ellipsometer: J.A. Woollam M-2000 Spectroscopic Ellipsometer	1				Plano, Texas
	249729	J.A. Woollam VB-200 Spectroscopic Ellipsometer	J.A. Woollam VB-200 Spectroscopic Ellipsometer		Ellipsometers in Film Thickness Testers J.A. Woollam VB-200 Spectroscopic Ellipsometer: J.A. Woollam VB-200 Spectroscopic Ellipsometer	1				Plano, Texas
	332	Karl Storz	Karl Storz	483C	Parts and Accessories - Other in Parts and Accessories, Microscope KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE : Twin Fiber Optic Light Source Light guide not included.	1		350.09		Scotia, New York
	254018	KLA-Tencor	KLA-Tencor	2138XP	Automatic Wafer Inspection Tools in Microscope Inspection Tools KLA-Tencor 2138XP Brightfield Inspection Tool: KLA-Tencor 2138XP Brightfield Defect Inspection Tool 0.25µ, 0.39µ, 0.62µ Spot Sizes For 150mm & 200mm Wafers Model 2552UI User Interface Denkenseiki Noise Filter Please Inquire for Additional Details	1				Austin, Texas
	218321	KLA-Tencor	KLA-Tencor	AIT	Patterned Wafer Inspection in Surface Inspection KLA-Tencor AIT Patterned Wafer Inspection Tool: KLA-Tencor AIT Patterned Wafer Inspection Tool Call for Details	1				Plano, Texas
	250811	KLA-Tencor	KLA-Tencor	Aleris 8350	Film Thickness Testers - Other in Film Thickness Testers KLA-TENCOR Aleris 8350 Film Metrology Tool: KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool Dual 300 mm Loadports Analysis of 190nm-800nm Wavelengths White Light Reflectometer Broadband Spectroscopic Ellipsometer Single Wave Ellipsometer Stress Measurement iDesorber	1				Austin, Texas
	104306	KLA-Tencor	KLA-Tencor	AlphaStep 300	Profilometers in Film Thickness Testers KLA-Tencor AlphaStep 300 Profilometer: Profilometer	1				Plano, TX
	250821	KLA-Tencor	KLA-Tencor	Archer 200 AIM	Overlay Registration in Critical Dimension Measurement Equipment KLA-TENCOR Archer 200 AIM Overlay Metrology Tool: KLA-TENCOR Archer 200 AIM Overlay Metrology Tool ETAL Stage Yaskawa Robot with NXC100 Controller IDE Maxon 1000 Floatation Controller	1				Plano, Texas
	249589	KLA-Tencor	KLA-Tencor	ASET-F5x	Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor ASET-F5x Thin Film Measurement System: KLA-TENCOR ASET-F5x Thin Film Measurement System Serial Number 0202802R Manufactured in June, 2002 Inspection Modes Include: Dual Beam Spectrometry Spectroscopic Ellipsometry Film Stress Analysis SUMMIT™ Application Software Version 3.21.16 FTML Version 3.46.06 Model 300DFF1P Wafer Loading Platform Dual Loadports for 300mm Wafers Three Axis Wafer Handling Robot GEM / SECS Communication Inquire for Additional Details	2				Austin, Texas
	252332	KLA Tencor	KLA Tencor	DSW16E	Metrology Equipment - Other in Metrology Equipment KLA-Tencor DSW16E 300mm Calibration Wafer: KLA-Tencor DSW16E 300mm Calibration Wafer Part Number 0210691-000 (Advanced Technology Development) For Use on e-Beam Patterned Wafer Defect Inspection Tools	1				Plano, Texas
	250812	KLA-Tencor	KLA-Tencor	HRP-240	Profilometers in Film Thickness Testers KLA-TENCOR HRP-240 High Resolution Profiler: KLA-TENCOR HRP-240 High Resolution Profiler Cassette to Cassette Wafer Handling for up to 200mm Wafers Previously Configured for SMIF Wafer Handling Please Inquire for Additional Details	1				Milpitas, California
	250818	KLA-Tencor	KLA-Tencor	Puma 9120 IS	Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool: KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool For 200mm or 300mm Wafers 2ea Cameras Please Inquire for Additional Details	1				Austin, Texas
	250819	KLA-Tencor	KLA-Tencor	Puma 9130	Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9130 Darkfield Inspection Tool: KLA-TENCOR Puma 9130 Darkfield Inspection Tool Parts Tool Please Inquire for Additional Details	1				Austin, Texas
	250822	KLA-Tencor	KLA-Tencor	SWE Kit	Ellipsometers in Film Thickness Testers KLA-TENCOR Spectra fx SWE Kit: KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit	1				Plano, Texas
	247843	KLA-Tencor	KLA-Tencor	UV-1050	Film Thickness Testers - Other in Film Thickness Testers KLA-Tencor UV-1050 Thin Film Measurement Tool: KLA-Tencor UV-1050 Thin Film Measurement Tool Cassette to Cassette Wafer Handling Wafer sizes: 100mm, 150mm & 200mm Broadband UV Optics Dual Beam Spectrophotometry Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP System Control PC with Windows NT OS Summit Application Software GEM / SECS Communication System Installation at Destination Available	1		55,014.74		Austin, Texas
	1127	Leco	Leco	VC-50	Cut-Off Saws in Surface Processing Equipment LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE: Vari/Cut Off Saw	1			F*	Scotia, New York
	18713	Fostec	Fostec	8300	Fiber Optic Light Sources in Fiber Optic Illuminators LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE: Fiber Optic Light Source Representative photo These units are manufactured by Fostec and re-branded by different companies. The light source received may not be branded Fostec.	19			F*	Scotia, New York
	186519	Leica	Leica	INM20	Wafer Inspection Microscopes in Optical Microscopes LEICA AUTOMATED WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system	1			F*	Scotia, New York
	1893	Leica	Leica	445945	Parts and Accessories - Other in Parts and Accessories, Microscope LEICA E-ARM FOCUSING DRIVE: Focusing Drive For MS5/MZ6/MZ8	9			F*	Scotia, New York
	243053	Leica	Leica	Polylite 88	Upright Microscopes in Optical Microscopes LEICA REICHERT BRIGHTFIELD DARKFIELD : Long Working Distance Objectives	1			F*	Scotia, New York
	255505	Leica	Leica	INS-3	Metrology Equipment - Other in Metrology Equipment Leica Review Station INS-3: Review Microskop for 6 and 8"	1				Villach, Carinthia
	165299	Leica	Leica	S6 E	Stereo Microscopes in Optical Microscopes LEICA STEREO MICROSCOPE 6.3X - 40X: Stereo Microscope with Boom Stand and Ring Light	1		1,550.42	F*	Scotia, New York
	192026	Leica	Leica	S6 E	Stereo Microscopes in Optical Microscopes LEICA STEREO MICROSCOPE 6.3X - 40X: Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens	1		1,725.46	F*	Scotia, New York
	169430	Leica	Leica	Wild M8	Stereo Microscopes in Optical Microscopes LEICA WILD STEREO MICROSCOPE 6X - 50X: Stereo Microscope	1				Scotia, New York
	1643	Leica	Leica	POLYLITE88	Upright Microscopes in Optical Microscopes LEICA/REICHERT METALLURGICAL MICROSCOPE: Metallurgical Microscope - Camera and controller not included	1			F*	Scotia, New York
	1641	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION : Manual Wafer Inspection Microscope MicroVision MVT 1080 Wafer Loader	1			F*	Scotia, New York
	106575	Leica	Leica	Polylite 88	Upright Microscopes in Optical Microscopes LEICA/REICHERT MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Polylite 88 Reflected Light Microscope	2			F*	Scotia, New York
	186513	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system	1				Scotia, New York
	186518	Leica	Leica	POLYLITE 88	Wafer Inspection Microscopes in Optical Microscopes LEICA/REICHERT WAFER INSPECTION MICROSCOPE: Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system	1			F*	Scotia, New York
	57070	Leitz	Leitz	Laborlux 12 HL	Upright Microscopes in Optical Microscopes LEITZ BRIGHTFIELD/DARKFIELD FILAR EYEPIECE: Brightfield, Darkfield and DIC Leitz Filar Eyepiece with Boeckeler Micrometer and Readout	1		5,951.59	F*	Scotia, New York
	47433	Leitz	Leitz	Secolux 6X6	Upright Microscopes in Optical Microscopes LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD: Brightfield Reflected Light Microscope	1		5,701.53	F*	Scotia, New York
	113754	Leitz	Leitz	Ergolux	Upright Microscopes in Optical Microscopes LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Brightfield/Darkfield Reflected Light	1		4,901.31	F*	Scotia, New York
	89143	Leitz	Leitz	Ergolux	Upright Microscopes in Optical Microscopes LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD: Brightfield Reflected Light/Transmitted Light Microscope	1		5,251.41	F*	Scotia, New York
	58429	McPherson	McPherson	2035	UV-Visible Spectrophotometers in Spectrophotometers MCPHERSON 2035 SPECTROMETER: UV-VIS-IR Spectrophotometer	1			F*	Scotia, New York
	18582	Melles Griot	Melles Griot	04TFF002	Microscopes - Other in Optical Microscopes MELLES GRIOT FINE FOCUSING MICROSCOPE: Fine Focusing Microscope	3		450.12		Scotia, New York
	111690	MICROSCOPE STAND	MICROSCOPE STAND		Stands in Parts and Accessories, Microscope MICROSCOPE STAND: Large StereoZoom Microscope Stand Available only with purchase of a B&L, Nikon, or Olympus StereoZoom Microscope	1			F*	Scotia, New York
	81042	Microspec	Microspec	WDX-2A(Spectrometer)	Scanning Electron Microscopes in Inspection Equipment MICROSPEC WDX-2A SPECTROMETER: Spectrometer	1				Scotia, New York
	133353	Mitutoyo	Mitutoyo	176-901-1A	Measuring Microscopes in Optical Microscopes MITUTOYO TOOLMAKER'S MICROSCOPE: Toolmakers Microscope	1			F*	Scotia, New York
	248941	Nanometrics	Nanometrics	8300XSE	Ellipsometers in Film Thickness Testers Nanometrics 8300XSE Film Thickness Analyzer: Nanometrics 8300XSE Film Thickness Analyzer J.A. Woollam M-44 Spectroscopic Ellipsometer J.A. Woollam EC-270 Ellipsometer Controller J.A. Woollam LPS-420 Xenon Light Source Manual Loading of up to 300mm Wafers Yaskawa ERCR-NS01-B004 Motion Controller Please Inquire for Additional Details	1				Austin, Texas
	3863	Nanometrics	Nanometrics	NANOLINE III	Optical CD Measurement in Critical Dimension Measurement Equipment NANOMETRICS CRITICAL DIMENSION COMPUTER: Critical Dimension Computer Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.	1			F*	Scotia, New York
	261179	Nanometrics	Nanometrics	ECV Pro UV	Metrology Equipment - Other in Metrology Equipment Nanometrics ECV Pro UV Electrochemical CV Profiler: Nanometrics ECVPro Carrier Concentration Profiler For Si, SiC, II-VI, III-V & III-Nitrides  Hamamatsu LC8 UV Light Source ECVision In-Situ Camera System Dual Frequency Measurement Carrier Frequency: 0.3kHz to 50kHz Depth Range: 0.05μm to 50μm Depth Resolution: 1nm  Dell PC, Windows 8 OS, ECV Pro SW Version 2.4.6.0      Installation & Training Available	1		110,029.48		Plano, Texas
	42358	Nicolet	Nicolet	NEXUS 470	FT-IR Spectrometers in Spectrometers NICOLET (THERMO) FT-IR SPECTROMETER : FT-IR with Spectra-Tech Continuum Scope and TGA Interface Nicolet NEXUS 470 Nicolet acquired by Thermo Scientific	1			F*	Scotia, New York
	159451	Nicolet	Nicolet	Magna-IR 550	FT-IR Spectrometers in Spectrometers NICOLET Magna-IR 550: FT-IR Spectrometer	1			F*	Plano, TX
	3042	Nikon	Nikon		Microscopes - Other in Optical Microscopes NIKON DISK INSPECTION MICROSCOPE: Disk Inspection Microscope	1			F*	Scotia, New York
	1899	Nikon	Nikon	UA1	Parts and Accessories - Other in Parts and Accessories, Microscope NIKON E-ARM: E-arm E-arm	7		140.04		Scotia, New York
	62898	Nikon	Nikon	E-Arm	Parts and Accessories - Other in Parts and Accessories, Microscope NIKON E-ARM: E-Arm	21		140.04	F*	Scotia, New York
	109820	Nikon	Nikon	Focusing Stand	Stands in Parts and Accessories, Microscope NIKON FOCUSING STAND: Focusing Stand With Diascopic Illuminator Base Available only with purchase of Nikon Stereozoom Microscope	2				Scotia, New York
	110421	Nikon	Nikon	Focusing Stand	Stands in Parts and Accessories, Microscope NIKON FOCUSING STAND: Focusing Stand Available only with purchase of Nikon Stereozoom Microscope	1		250.07		Scotia, New York
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Metrology Equipment: ADE, American Optical, Anatech Ltd, ATM GmbH, Bausch & Lomb, Inc, Bio-Rad, Buehler, Carl Zeiss, CDE, CPS, CR Technology, DELTRONIC, Denton, Diagnostic Instruments, Digital Instruments, Dolan Jenner, Fostec, Four Dimensions, Frontier Semiconductor, Gaertner, GCA/Tropel, Hitachi, Insidix, J. A. Woollam, Karl Storz, KLA Tencor, KLA-Tencor, Leco, Leica, Leica, Leitz, McPherson, Melles Griot, Microspec, Mitutoyo, Nanometrics, Nicolet, Nikon, Nikon, Olympus, Orbotech, Plasmos, Reichert Inc, Reichert-Jung, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Semilab, Semprex, Solid State Measurement, Takano, Tencor, Veeco Instruments, Vision Engineering, Volpi, Well, Wild, Zeiss