|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
225795
|
Bio-Rad
|
Bio-Rad |
QS-1200 |
in Spectrometers
Bio-Rad QS-1200 FT-IR Spectrometer:BIORAD QS-1200 Automated FT-IR Spectrometer - Non-Destructive Measurement of Epitaxial Silicon Films
- PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage
- Manual Loading for up to 300mm Wafers
- 320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping
- FTS-175 Optical Bench
- Dynamically Tuned Beam Splitter
- NKBr Beam Splitter
- Dual Frequency IR Source
- Upgraded HeNe Laser
- System Control PC with Windows XP, 320G HD & 1G RAM
- Win-IR Pro (Rev. 2.51) Application Software
- QS-500 Epi (Rev. 1.31) Application Software
- Microsoft Access Database Application
- System Software, Applications Software & Site Preparation Manuals Included
- Refurbished & Fully Functional
|
1
|
|
110,029.48 |
|
Plano, Texas |
|
|
219230
|
Bio-Rad
|
Bio-Rad |
Q8 |
in Metrology Equipment
Bio-Rad Q8 Overlay Metrology Tool:Bio-Rad Q8 Overlay Metrology Tool
|
1
|
|
|
|
Plano, Texas |
|
|
31390
|
Bio-Rad
|
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
BioRad Q5:Overlay Registration Tool - Has Been Upgraded to a Q6CD Measurement, Single and Two-Axis Overlay Registration
|
1
|
|
|
F* |
Plano, TX |
|
|
54652
|
Bio-Rad
|
Bio-Rad |
Q7/Q8 |
in Critical Dimension Measurement Equipment
BioRad Q7/Q8 Overlay Metrology Tool:Overlay Metrology Tool for up to 200mm Wafers
|
1
|
|
|
F* |
Plano, TX |
|
|
121504
|
Bio-Rad
|
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
Biorad Q5:Overlay Registration Tool
|
2
|
|
|
|
Plano, TX |
|
|
|