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Wafer Manufacturing Metrology Equipment


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List all 7 product types under Wafer Manufacturing Metrology EquipmentList all 7 product types under Wafer Manufacturing Metrology Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
99573
CDE  

CDE  

RESMAP 463-OC 

List all items of this type4 & 6 Point Probes

in Resistivity Testers

1   F* Scotia, NY
CREATIVE DESIGN ENGINEERING RESMAP FOUR POINT PROBE
Four Point Probe
132416
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.B Model 2 

List all items of this typeWaferTesters - Other

in Wafer Testers

1   F* Plano, TX
Irvine Optical Ultrastation 3.B Model 2 Display
Irvine Optical Ultrastation 3.B Model 2 Wafer Inspection Station Display (only)
129848
KLA-Tencor  

KLA-Tencor  

M-Gage 

List all items of this typeNon-Contact Resistivity Testers

in Resistivity Testers

1   F* Plano, TX
KLA-Tencor M-Gage
Non-Contact Wafer Monitor for Sheet Resistance

Model 50-00070
26911
Philips  

Philips  

DCD 120 

List all items of this typeXray Diffractometers

in Wafer Manufacturing Metrology Equipment

1   F* Scotia, NY
PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER
Double Crystal Diffractometer

Double Crystal Diffractometer optimized for fast rocking curve analysis of pseudomorphic epitaxial layer structures.
46035
Philips  

Philips  

XPERT HR2 

List all items of this typeXray Diffractometers

in Wafer Manufacturing Metrology Equipment

1   F* Scotia, NY
PHILIPS HIGH RESOLUTION X-RAY DIFFRACTOMETER
High Resolution X-Ray Diffractometer

Software, Firmware updated in 2004
Generator upgraded in 2000
183167
Revera  

Revera  

Veraflex 

List all items of this typeXray Diffractometers

in Wafer Manufacturing Metrology Equipment

1   F* Singapore,
Revera Veraflex, 300mm, XPS, HKMG Measurement
Revera Veraflex, 300mm, XPS, HKMG Measurement System
X-Ray Photoelectron Spectroscopy (XPS)

TOOL ID: DXPS701
S/N: 080220
2008 Vintage
Bagged and Skidded in Warehouse
178431
Revera  

Revera  

RVX5000 

List all items of this typeXray Diffractometers

in Wafer Manufacturing Metrology Equipment

1   F* Taichung, Taichung City
REVERA, XPS, 300mm
Manufactured in 2006; Status: Bagged and Skidded
178432
Rigaku  

Rigaku  

3272 

List all items of this typeXray Diffractometers

in Wafer Manufacturing Metrology Equipment

1   Santa Clara, CA
Rigaku, XRF, 300mm
Status: Deinstalled


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Manufacturing Metrology Equipment:
CDE, Irvine Optical Company, KLA-Tencor, Philips, Revera, Rigaku