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Film Thickness Testers


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List all 12 product types under Film Thickness TestersList all 12 product types under Film Thickness Testers


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     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
    Make Model
      $  
    110263

    ADE  

    Episcan 1000 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* Plano, TX
    ADE Episcan 1000
    Epi Metrology Spectrometer

    Film Thickness Measurement & Mapping Tool
    159250

    Biorad  

    QS-1200 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 Plano, TX
    Biorad QS-1200
    FT-IR Spectrometer
    130059

    Bio-Rad  

    QS-300 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* Plano, TX
    Biorad QS-300 Spectrometer
    FT-IR Spectrometer
    74140

    Bio-Rad  

    QS-408M 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* Plano, TX
    BioRad QS-408M
    Manual FT-IR (Fourier Transform Infrared Spectrophotometer) for Epi Measurement - 200mm Wafers
    137988

    Bruker  

    Tensor 27 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* Scotia, NY
    BRUKER FT-IR SPECTROMETER
    FT-IR Spectrometer

    166465

    Oxford Instruments  

    CMI 950 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 F* Regensburg, BY
    CMI 950 - Xray fluorescence spectrometer
    X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
    Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).

    System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
    144802

    CR Technology  

    UF160/0 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 Plano, TX
    CR Technology XRay System UF160/0
    XRAY Wafer Analyzer
    45435

    Gaertner  

    L116B 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 F* Scotia, NY
    GAERTNER ELLIPSOMETER
    Ellipsometer

    Upgraded in 2004 by Gaertner

    39958

    Gaertner  

    L2W16E.1550 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Scotia, NY
    GAERTNER ELLIPSOMETER 150 MM
    Ellipsometer
    178414

    GEMETEC  

    WSPS53 

    List all items of this typeSpectrometers - Other

    in Spectrometers

    1 F* Taichung, Taichung City
    GEMETEC, Gas Analyzer, 300mm
    Status: Bagged and Skidded
    190264

    GEMETEC  

    WSPS 2 M S  

    List all items of this typeSpectrometers - Other

    in Spectrometers

    1 Singapore,
    GeMeTec, WSPS 2 M S, 200mm
    GeMeTec, WSPS 2 M S, 200mm

    S/N: 61046-01-05-00
    104306

    KLA-Tencor  

    AlphaStep 300 

    List all items of this typeProfilometers

    in Film Thickness Testers

    1 Plano, TX
    KLA-Tencor AlphaStep 300 Profilometer
    Profilometer
    58429

    McPherson  

    2035 

    List all items of this typeUV-Visible Spectrophotometers

    in Spectrophotometers

    1 F* Scotia, NY
    MC PHERSON 2035
    UV-VIS-IR Spectrophotometer
    10354

    Nanometrics  

    NanoSpec AFT 

    List all items of this typeMicrospectrophotometers

    in Spectrophotometers

    1 Plano, TX
    Nanometrics NanoSpec AFT
    Film Thickness Measurement System (Parts Tool Only)

    PARTS TOOL ONLY
    61872

    Nanometrics  

    NanoSpec 181 

    List all items of this typeMicrospectrophotometers

    in Spectrophotometers

    1 F* Plano, TX
    Nanometrics NanoSpec AFT #010-0181
    Film Thickness Analyzers
    116240

    Nanometrics  

    NanoSpec AFT 2100 

    List all items of this typeMicrospectrophotometers

    in Spectrophotometers

    1 F* Plano, TX
    Nanometrics NanoSpec AFT 2100
    Automatic Film Thickness System
    116241

    Nanometrics  

    NanoSpec AFT 212 

    List all items of this typeMicrospectrophotometers

    in Spectrophotometers

    1 F* Plano, TX
    Nanometrics NanoSpec AFT 212
    Automatic Film Thickness System
    42358

    Nicolet  

    NEXUS 470 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* Scotia, NY
    NICOLET (THERMO) FT-IR SPECTROMETER
    FT-IR with Spectra-Tech Continuum Scope and TGA Interface

    Nicolet NEXUS 470

    Nicolet acquired by Thermo Scientific

    159451

    Nicolet  

    Magna-IR 550 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* Plano, TX
    NICOLET Magna-IR 550
    FT-IR Spectrometer
    77964

    Philips  

    SPW-2800 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 F* Plano, TX
    Philips SPW-2800
    Xray Wafer Analyzer

    High-Precision Wafer Analyzer
    172746

    Plasmos  

    SD 2004 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Plano, TX
    Plasmos SD-2004 Multi-Wavelength Ellipsometer
    Plasmos SD-2004 Multi-Wavelength Ellipsometer
    152329

    Plasmos  

    SD2000 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Plano, TX
    PLASMOS SD2000
    Automatic Ellipsometer

    Thin Film Thickness Measurement System
    179535

    Plasmos  

    SD2000 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Plano, TX
    179536

    Plasmos  

    SD4000 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Plano, TX
    122734

    Rigaku  

    3630 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 Plano, TX
    Rigaku 3630
    Xray Fluorescence Spectrometer
    172365

    Rigaku  

    3640 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 F* Plano, TX
    Rigaku 3640 Xray Fluorescence Spectrometer
    Rigaku 3640 Xray Fluorescence Spectrometer
    54993

    Rigaku  

    3700H 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 Plano, TX
    Rigaku 3700H
    TXRF Wafer Analyzer
    103332

    Rigaku  

    TXRF 300S 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 F* Scotia, NY
    RIGAKU X-RAY FLUORESENCE SPECTROMETER
    X-Ray Fluoresence Spectrometer
    Model: TXRF 300S
    86164

    Rudolph Technologies  

    AUTO EL 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 F* Scotia, NY
    RUDOLPH RESEARCH ELLIPSOMETER 150MM
    Ellipsometer
    58212

    Rudolph Research  

    AUTO EL RE-350 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Scotia, NY
    RUDOLPH RESEARCH ELLIPSOMETER 150MM
    Ellipsometer
    50006

    Sagax  

    Isoscope 125 

    List all items of this typeEllipsometers

    in Film Thickness Testers

    1 Plano, TX
    Sagax Isoscope 125
    Ellipsometer
    190839

    Semilab  

    IR3100s 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F*N* Malta, New York
    Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm
    Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm

    Complete IR3100 small spot Model-Based IR to Near-IR
    semiconductor metrology tool configured with a unique
    all-optical method. The measurement is both non-contact
    and non-destructive with rapid analysis of deep trenches
    and other high aspect ratio structures on product wafers.

    S/N: 3039s

    178737

    Sopra  

    EP12 

    List all items of this typeFT-IR Spectrometers

    in Spectrometers

    1 F* East Fishkill, NY
    Sopra EP12, 300mm, optical porosity measurement
    Dielectric Porosity measurment system.
    136700

    Spectronic Unicam  

    4001/4 

    List all items of this typeSpectrometers - Other

    in Spectrometers

    1 Scotia, NY
    SPECTRONIC UNICAM SPECTROPHOTOMETER
    Spectrophotometer

    Spectronic Unicam 4001/4
    168828

    Tencor  

    P-20h 

    List all items of this typeProfilometers

    in Film Thickness Testers

    1 Plano, TX
    Tencor P-20h Long Scan Profiler
    Tencor P-20h Long Scan Profiler
    • 3" - 200mm Wafers
    • MicroHead Stylus Module
    • Automatic Wafer Handling
      • Single Cassette Platform
      • Wafer Prealigner
    • Wafer Stress Option
    134636

    Tencor  

    FLX-2350 FP 

    List all items of this typeFilm Thickness Testers - Other

    in Film Thickness Testers

    1 F* Scotia, New York
    TENCOR THIN FILM STRESS MEASUREMENT SYSTEM
    Thin Film Stress Measurement System

    Tencor FLX-2350 FP
    140974

    Thermo Scientific  

    MicroXR GXR/C 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    2 Scotia, NY
    THERMO SCIENTIFIC MICROBEAM X-RAY FLUORESCENCE XRF SYSTEM
    X-Ray Fluorescence System

    Thermo Scientific MicroXR GXR/C
    135813

    Thermo Scientific  

    Micron VXR 

    List all items of this typeXray Fluorescence Spectrometers

    in Spectrometers

    1 F* Scotia, NY
    THERMO SCIENTIFIC MICROBEAM XRF
    Thermo Scientific

    Micron VXR

    The MicronX VXR measures the thickness of single and multi-layer coatings on most surfaces. It can simultneously measure the thickness and compostiton of alloy

    147760
    Used Bruker Cryomagnet BZH 200/52 Magnet 

    List all items of this typeNuclear Magnetic Resonance Spectrometers

    in Pharmaceutical Laboratory and Scientific Equipment

    1 F* Dayton, OH
    Used Bruker Cryomagnet BZH 200/52 Magnet
    Bruker Cryomagnet BZH 200/52 Magnet, dewar# D101/52/512, Field 4,70 Tesla, Coil# 782080E, Current 52.20.A
    50026

    Veeco  

    Dektak I 

    List all items of this typeProfilometers

    in Film Thickness Testers

    1 Plano, TX
    Veeco Dektak I Profilometer
    PARTS TOOL ONLY
    119455

    Veeco  

    Dektak 3030 

    List all items of this typeProfilometers

    in Film Thickness Testers

    1 F* Scotia, NY
    VEECO INSTRUMENTS STYLUS PROFILER
    Surface Profile Measuring System
    98184

    Veeco  

    Dektak 3030 Auto II 

    List all items of this typeProfilometers

    in Film Thickness Testers

    1 F* Scotia, NY
    VEECO PROFILOMETER
    Profilometer
    109557

    Veeco  

    Dektak 3030 

    List all items of this typeProfilometers

    in Film Thickness Testers

    2 F* Scotia, NY
    VEECO PROFILOMETER

    Profilometer


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Film Thickness Testers:
    ADE, Bio-Rad, Biorad, Bruker, CR Technology, Gaertner, GEMETEC, KLA-Tencor, McPherson, Nanometrics, Nicolet, Oxford Instruments, Philips, Plasmos, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Semilab, Sopra, Spectronic Unicam, Tencor, Thermo Scientific, Veeco Instruments