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List all 2 product types under Surface InspectionList all 2 product types under Surface Inspection


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  •  
     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Note Location
    Make Model
      $  
    Offer 139442

    Accretech  

    Crystal Edge 2.0 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 Dallas, TX
    Accretech/TSK Crystal Edge 2.0
    Wafer Inspection
    S/N CE5002
    Offer 179175

    Applied Materials  

    Compass 200mm 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 F* Regensburg, BY
    AMAT Compass 200mm

    COMPASS PRO* – INCREASING SENSITIVITY AND THROUGHPUT

    FOR 100NM CHALLENGES

    Addressing the increasing need for higher sensitivity at

    higher throughputs, the CompassPro introduces new features

    targeted at grainy layers, complex devices such as combined

    logic and memory, and more accurate die-to-die precision,

    resolution and defect reporting. Additionally, CompassPro

    optimizes performance on copper and low-k with predefined

    recipes. CompassPro patterned wafer inspection

    technology helps our customers to actively engineer high

    yield in the shortest possible time. The “Pro-active”

    approach provides an un-rivaled solution set for patterned

    wafer inspection in the nanometer era.

    Offer 163973

    Applied Materials  

    Compass Pro 300 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 F* Regensburg, BY
    AMAT COMPASS PRO 300mm
    Darkfield Defect Inspection,
    2x 300mm Load Ports Asyst SMIF-300FL
    Offer 163974

    Applied Materials  

    Compass Pro 300 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 F* Regensburg, BY
    AMAT COMPASS PRO 300mm
    Darkfield Defect Inspection,
    2x 300mm Load Ports Asyst SMIF-300FL
    Offer 163975

    Applied Materials  

    Compass Pro 300 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 F* Regensburg, BY
    AMAT COMPASS PRO 300mm
    Darkfield Defect Inspection
    2x 300mm Load Ports Asyst SMIF-300FL
    Tool already disassembled.
    Offer 166797

    Dexon  

     

    List all items of this typeUnpatterned Wafer Inspection

    in Surface Inspection

    1 Dallas, TX
    Dexon Hood
    Solvent Hood
    Offer 49926

    GCA/Tropel  

    9000 

    List all items of this typeUnpatterned Wafer Inspection

    in Surface Inspection

    1 Plano, TX
    GCA/TROPEL 9000
    Surface Flatness Analyzer
    Offer 139633

    Hitachi  

    WA1350 

    List all items of this typeUnpatterned Wafer Inspection

    in Surface Inspection

    1 Dallas, TX
    Hitachi Finetech WA1350
    Atomic Force Microscope
    S/N 03001
    Offer 137458

    KLA-Tencor  

    KLA AIT2 for 12" / 300 mm 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 Regensburg, BY
    KLA AIT2/XP
    KLA AIT2
    Equipment Code: MES313-02
    Darkfield-Defectinspection AIT Fusion, 2Loadport, upgrad. 2004 to AIT XP


    KLA AIT2
    Serial Number: 9332
    Offer 101271

    KLA-Tencor  

    AIT 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 Plano, TX
    KLA-Tencor AIT
    Patterned Wafer Defect Inspection Tool with Auto Focus
    Offer 77963

    KLA-Tencor  

    FT-750 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 Plano, TX
    KLA-Tencor FT-750
    Film Thickness Mapping Tool
    Offer 5310

    KLA-Tencor  

    7700 

    List all items of this typePatterned Wafer Inspection

    in Surface Inspection

    1 F* Scotia, NY
    KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER
    Patterned Wafer Contamination Analyzer

  • Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
  • Capable of measuring defects on unpatterned wafers
  • Capable of measuring wafers from 4” to 8”
  • High sensitivity on after-etch and high topography applications
  • Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
  • Offer 54273

    Nova  

    420 

    List all items of this typeUnpatterned Wafer Inspection

    in Surface Inspection

    1 F* Scotia, NY
    NOVA THICKNESS MEASUREMENT SYSTEM
    Thickness Measurement System

    Scanning head and cables only.
    Offer 50017

    KLA-Tencor  

    Surfscan 4000 

    List all items of this typeUnpatterned Wafer Inspection

    in Surface Inspection

    1 Plano, TX
    Tencor Surfscan 4000 - PARTS TOOL ONLY
    Wafer Surface Analysis - Parts Tool Only


    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer
    NOTE:
       when photo available
       when document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.
    Items from the following manufacturers are offered under Surface Inspection:
    Accretech, Applied Materials, Inc., Dexon, GCA/Tropel, Hitachi, KLA-Tencor, Nova