|  | Item ID | Item Description | Description | # | Price | Notes | Location |
---|
Make | Model |
---|
| | | | | | $ | | |
 |
219230
|
Bio-Rad | Q8 | Overlay Metrology Tool |
1
|  |
|
|
Plano, Texas |
 |
231442
|
Bio-Rad Q7 Overlay Metrology Tool | |
1
|  |
|
|
Plano, Texas |
 |
106265
|
Digital Instruments | Nanoscope IIIA | Atomic Force Microscope |
1
|  |
|
 |
Scotia, New York |
 |
254099
|
KLA | Altair 8920i | AOI Tool |
1
|  |
|
 |
Austin, Texas |
 |
254098
|
KLA | Altair 8935-FFC | AOI Tool |
1
|  |
|
 |
Austin, Texas |
 |
254100
|
KLA | Altair 8935i | AOI Tool |
1
|  |
|
 |
Austin, Texas |
 |
252332
|
KLA Tencor | DSW16E | e-Beam Patterned Wafer Inspection Tool Cal. Wafer |
1
|  |
|
 |
Plano, Texas |
 |
250823
|
KLA-Tencor | Viper 2401 | After Develop Inspection Tool |
1
|  |
|
|
Austin, Texas |
 |
255505
|
Leica | INS-3 | Leica |
1
|  |
|
 |
Villach, Carinthia |
 |
205912
|
Matrix Corp | Matrix X3 | High Speed XRay System f. Tray Handling |
1
|  |
|
 |
Regensburg, Bavaria |
 |
135595
|
Nikon | V-12 | Profile Projector |
1
|  |
|
 |
Plano, TX |
 |
247975
|
Nova | SCAN-2040 | |
1
|  |
|
 |
Dresden, Saxony |
 |
204578
|
Orbotech | Ultra Discovery VM | Automatic Optical Inspection |
1
|  |
24,906.67 |
 |
Regensburg, Bavaria |
 |
258121
|
Rudolph Technologies | mWL 150/200 t | F30 Inspectiontool |
1
|  |
|
N* |
Regensburg, Bavaria |
 |
252025
|
Semilab | SDI-FAAST_230 | |
1
|  |
|
 |
Regensburg, Bavaria |
NOTE:
photo available
reference document attached
F* if the item is specially featured
N* if the item is newly added, and/or
R* if the item's price is recently reduced.
|
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