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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   116574 Buehler   Buehler   Primet  Sample Preparation - Other in Sample Preparation BUEHLER PRIMET MODULAR DISPENSING SATELLITE: Modular Dispensing Satellite 1 625.00 F* Scotia, New York 7353 CPS   CPS   6004/1958  Scanning Electron Microscopes in Inspection Equipment CPS ELECTRON GUN POWER SUPPLY 30KV: Electron Gun Power Supply CPS Computer Power Supply 6004 1 3,750.00 Scotia, NY 176740 Gatan   Gatan   691 PIPS  Sample Preparation - Other in Sample Preparation GATAN 691 PRECISION ION POLISHING SYSTEM PIPS: Precision Ion Polishing System (PIPS). Includes Gatan Binocular Microscope The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to produce high quality TEM specimens having exceptionally large, clean, electron transparent areas. 1   F* Scotia, New York 206533 Gatan   Gatan   693 PIPS  Sample Preparation - Other in Sample Preparation GATAN PRECISION ION POLISHING/MILLING SYSTEM SYSTEM: Precision Ion Polishing System (PIPS) 1   F* Scotia, New York 78602 Hewlett Packard   Hewlett Packard   43804N  X-Ray Inspection Equipment - Other in Inspection Equipment HEWLETT PACKARD HP FAXITRON X-RAY SYSTEM 110 kV: X-Ray System   1   F* Scotia, NY 100557 Hitachi   Hitachi   S-2400  Scanning Electron Microscopes in Inspection Equipment HITACHI S-2400 SCANNING ELECTRON MICROSCOPE: Scanning Electron Micrscope (SEM) 1   F* Scotia, NY 60831 Hitachi   Hitachi   S-4100  Scanning Electron Microscopes in Inspection Equipment HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE: Field Emission Electron Microscope NB: System is missing Ion pump power supply. Sold "As Is". 1   F* Scotia, NY 178294 Hitachi   Hitachi   AS5000  Scanning Electron Microscopes in Inspection Equipment Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm: Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server 1   F* Singapore 219072 Hitachi   Hitachi   RS4000  Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03 remarketing@surplusglobal.com 1   Singapore 219057 Hitachi   Hitachi   RS4000  Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03 remarketing@surplusglobal.com 1   Singapore 219058 Hitachi   Hitachi   RS4000  Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01 remarketing@surplusglobal.com 1   Singapore 219056 Hitachi   Hitachi   RS4000  Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02 remarketing@surplusglobal.com 1   Singapore 219055 Hitachi   Hitachi   RS4000  Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01 remarketing@surplusglobal.com 1   Singapore 200588 Hewlett Packard   Hewlett Packard   43855B  X-Ray Inspection Equipment - Other in Inspection Equipment HP Faxitron X-Ray System: DEMO LISTING -- NOT REAL 1 [2,700.00]+ F* Edgewater, New Jersey 6402 JEOL   JEOL   JSM 6100  Scanning Electron Microscopes in Inspection Equipment JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE: Scanning Electron Microscope with LaB Filament 1   F* Scotia, NY 178300 JEOL   JEOL   7555  Scanning Electron Microscopes in Inspection Equipment JEOL, Defect Review, 200mm: Status: Bagged & Skidded in warehouse Parts tool.  Listed as major parts missing. 1   Singapore 187765 JEOL   JEOL   JWS 7555S  Scanning Electron Microscopes in Inspection Equipment JEOL, JWS 7555S, Defect Review, 200mm: JEOL, JWS 7555S, Defect Review, 200mm 1   Singapore 189689 JEOL   JEOL   JWS-7515  Scanning Electron Microscopes in Inspection Equipment JEOL, JWS-7515, 200mm, SEM: JEOL, JWS-7515, 200mm, SEM S/N: WS179028-108 1   Singapore 203119 JEOL   JEOL   ARM200CF Super X  Scanning Electron Microscopes in Inspection Equipment JEOL, TEM, ARM200CF Super X, : JEOL, TEM, ARM200CF Super X, Atomic Resolution Electron Microscope   remarketing@surplusglobal.com   1   Malta, New York 178304 KLA-Tencor   KLA-Tencor   ES31  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 81042 Microspec   Microspec   WDX-2A(Spectrometer)  Scanning Electron Microscopes in Inspection Equipment MICROSPEC WDX-2A SPECTROMETER: Spectrometer 1   Scotia, NY 1817 Precise Optics   Precise Optics   PS61  X-Ray Inspection Equipment - Other in Inspection Equipment PRECISE OPTICS X-RAY IMAGE INTENSIFIER: 6" X-Ray Image Intensifier 1   F* Scotia, NY 149933 Reichert Inc   Reichert Inc   Ultracut S-EM FCS  Sample Preparation - Other in Sample Preparation REICHERT/LEICA LOW TEMPERATURE SECTIONING SYSTEM: Low Temperature Sectioning System 1   F* Scotia, New York 202838 Zeiss   Zeiss   LEA 1530  Scanning Electron Microscopes in Inspection Equipment Zeiss, LEO1530, SEM, : Zeiss, LEO1530, SEM,    LEO1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE  No Backside Detector (BSD) Able to house8" wafer.  No 8" wafer holder. No travel for 8" wafer.     Unhooked, in QRA Lab.     1   Singapore

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment: Buehler, CPS, Gatan, Hewlett Packard, Hitachi, JEOL, KLA-Tencor, Microspec, Precise Optics, Reichert Inc, Zeiss