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Group Offers into sub-categories under Inspection EquipmentGroup Offers into sub-categories under Inspection Equipment

List all 3 product types under Inspection EquipmentList all 3 product types under Inspection Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

BUEHLER PRIMET MODULAR DISPENSING SATELLITE:

Modular Dispensing Satellite

1 625.00 F* Scotia, New York
7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
1 3,750.00 Scotia, NY
176740
Gatan  

Gatan  

691 PIPS 

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in Sample Preparation

GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

1   F* Scotia, New York
206533
Gatan  

Gatan  

693 PIPS 

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in Sample Preparation

GATAN PRECISION ION POLISHING/MILLING SYSTEM SYSTEM:

Precision Ion Polishing System (PIPS)

1   F* Scotia, New York
78602
Hewlett Packard  

Hewlett Packard  

43804N 

List all items of this typeX-Ray Inspection Equipment - Other

in Inspection Equipment

HEWLETT PACKARD HP FAXITRON X-RAY SYSTEM 110 kV:
X-Ray System

 

1   F* Scotia, NY
100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
1   F* Scotia, NY
60831
Hitachi  

Hitachi  

S-4100 

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in Inspection Equipment

HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
1   F* Scotia, NY
178294
Hitachi  

Hitachi  

AS5000 

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in Inspection Equipment

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




1   F* Singapore
219072
Hitachi  

Hitachi  

RS4000 

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in Inspection Equipment

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03:

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03

remarketing@surplusglobal.com

1   Singapore
219057
Hitachi  

Hitachi  

RS4000 

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in Inspection Equipment

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03:

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03

remarketing@surplusglobal.com

1   Singapore
219058
Hitachi  

Hitachi  

RS4000 

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in Inspection Equipment

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01:

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01

remarketing@surplusglobal.com

1   Singapore
219056
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02:

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02

remarketing@surplusglobal.com

1   Singapore
219055
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01:

Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01

remarketing@surplusglobal.com

1   Singapore
200588
Hewlett Packard  

Hewlett Packard  

43855B 

List all items of this typeX-Ray Inspection Equipment - Other

in Inspection Equipment

HP Faxitron X-Ray System:
DEMO LISTING -- NOT REAL
1 [2,700.00]+ F* Edgewater, New Jersey
6402
JEOL  

JEOL  

JSM 6100 

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in Inspection Equipment

JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
1   F* Scotia, NY
178300
JEOL  

JEOL  

7555 

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in Inspection Equipment

JEOL, Defect Review, 200mm:

Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

1   Singapore
187765
JEOL  

JEOL  

JWS 7555S 

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in Inspection Equipment

JEOL, JWS 7555S, Defect Review, 200mm:

JEOL, JWS 7555S, Defect Review, 200mm

1   Singapore
189689
JEOL  

JEOL  

JWS-7515 

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in Inspection Equipment

JEOL, JWS-7515, 200mm, SEM:

JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108

1   Singapore
203119
JEOL  

JEOL  

ARM200CF Super X 

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in Inspection Equipment

JEOL, TEM, ARM200CF Super X, :

JEOL, TEM, ARM200CF Super X,

Atomic Resolution Electron Microscope

 

remarketing@surplusglobal.com

 

1   Malta, New York
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
81042
Microspec  

Microspec  

WDX-2A(Spectrometer) 

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in Inspection Equipment

MICROSPEC WDX-2A SPECTROMETER:
Spectrometer
1   Scotia, NY
1817
Precise Optics  

Precise Optics  

PS61 

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in Inspection Equipment

PRECISE OPTICS X-RAY IMAGE INTENSIFIER:
6" X-Ray Image Intensifier

1   F* Scotia, NY
149933
Reichert Inc  

Reichert Inc  

Ultracut S-EM FCS 

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in Sample Preparation

REICHERT/LEICA LOW TEMPERATURE SECTIONING SYSTEM:

Low Temperature Sectioning System

1   F* Scotia, New York
202838
Zeiss  

Zeiss  

LEA 1530 

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in Inspection Equipment

Zeiss, LEO1530, SEM, :

Zeiss, LEO1530, SEM, 

 

LEO1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE

 No Backside Detector (BSD)

Able to house8" wafer.  No 8" wafer holder. No travel for 8" wafer.

 

 

Unhooked, in QRA Lab.

 

 

1   Singapore


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment:
Buehler, CPS, Gatan, Hewlett Packard, Hitachi, JEOL, KLA-Tencor, Microspec, Precise Optics, Reichert Inc, Zeiss