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	View All Offers Under Wafer Manufacturing Metrology Equipment » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Offers into sub-categories under Wafer Manufacturing Metrology Equipment List all 7 product types under Wafer Manufacturing Metrology Equipment

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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   257112 Tesec   Tesec   4330IH  WaferTesters - Other in Wafer Testers 4330IH TESEC HOT & COLD TEST: 4330IH TESEC HOT & COLD TEST 1   N* Tijuana, Baja California 257113 Tesec   Tesec   4330IH  WaferTesters - Other in Wafer Testers 4330IH TESEC HOT & COLD TEST: 4330IH TESEC HOT & COLD TEST 1   N* Tijuana, Baja California 254741 Veeco   Veeco   AFM-2 (METV44-1)  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment AFM-2 (METV44-1) : Atomic Force Microscope (AFM) An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions. 1   Villach, Kärnten 255422 Hewlett Packard   Hewlett Packard   AOT   WaferTesters - Other in Wafer Testers AOT3 Bundle : -Tester  AOT, Bundle sale preferred AOT3-06 AOT3-07 AOT3-08 AOT3-20 3444A40234 3607A40332 3527A40287 30451 AOT3-29 AOT3-33 AOT3-36 AOT3-38 30705 37978 40117 40128 8 lot   Villach, Carinthia 252767 BRUKER D8 Davinci, s/n: 12/12-113  BRUKER D8 Davinci, s/n: 12/12-113  Xray Diffractometers in Wafer Manufacturing Metrology Equipment BRUKER D8 Davinci, s/n: 12/12-113: Bruker D8 DaVinci X-Ray Diffractometer 1   Malta, New York 254246 BRUKER D8 Discover, 300mm, s/n: 205935  BRUKER D8 Discover, 300mm, s/n: 205935  Xray Diffractometers in Wafer Manufacturing Metrology Equipment 1   Malta, New York 252770 BRUKER D8 Fabline, 300mm, s/n: 205934  BRUKER D8 Fabline, 300mm, s/n: 205934  Xray Diffractometers in Wafer Manufacturing Metrology Equipment BRUKER D8 Fabline, 300mm, s/n: 205934: Bruker D8 Fabline X-Ray Diffractometer 1   Malta, New York 253457 BRUKER D8 Fabline, 300mm, s/n: 208564  BRUKER D8 Fabline, 300mm, s/n: 208564  Xray Diffractometers in Wafer Manufacturing Metrology Equipment BRUKER D8 Fabline, 300mm, s/n: 208564: BRUKER D8 FABLINE XRAY DEFRACTION 1   Dresden, Saxony 254015 CDE   CDE   ResMap 463  4 & 6 Point Probes in Resistivity Testers CDE ResMap 463 Resistivoiy Mapping Tool: CDE ResMap 463 Resistivity Mapping Tool For 300mm & 200mm Wafers Automatic Probe Head Selection Please Inquire for Additional Details   1   Austin, Texas 212139 Minato   Minato   MM-6600  WaferTesters - Other in Wafer Testers Minato MM-6600 Wafer Mobility Tester: Minato MM-6600 Wafer Mobility Tester MECS UX-1000 Wafer Handling Robot PC Controlled 2   Plano, Texas 212140 Minato MM-6600 Wafer Mobility Tester  Minato MM-6600 Wafer Mobility Tester  WaferTesters - Other in Wafer Testers Minato MM-6600 Wafer Mobility Tester: Minato MM-6600 Wafer Mobility Tester MECS UX-1000 Wafer Handling Robot PC Controlled 2   Plano, Texas 254657 Nikon   Nikon   Nikon 23 Optiphot 200  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment 1   Villach, Kärnten 254656 Nikon   Nikon   Nikon 7 Optiphot 200  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment 1   Villach, Kärnten 26911 PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER  PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER  Xray Diffractometers in Wafer Manufacturing Metrology Equipment PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER: Double Crystal Diffractometer Double Crystal Diffractometer optimized for fast rocking curve analysis of pseudomorphic epitaxial layer structures. 1   F* Scotia, New York 257111 SRM   SRM   TD16  WaferTesters - Other in Wafer Testers TD16 SRM Electrical Test: TD16 SRM Electrical Test 1   N* Tijuana, Baja California 256864 SRM   SRM   TD16  WaferTesters - Other in Wafer Testers TD16 SRM Electrical Test: TD16 SRM Electrical Test 1   N* Tijuana, Baja California 256867 SRM   SRM   SRM  WaferTesters - Other in Wafer Testers TD20 SRM Electrical Test: TD20 SRM Electrical Test 1   N* Tijuana, Baja California 256871 SRM   SRM   TD20  WaferTesters - Other in Wafer Testers TD20 SRM Electrical Test: TD20 SRM Electrical Test 1   N* Tijuana, Baja California 249014 Accretech   Accretech   TSK  Wafer Manufacturing Metrology Equipment - Other in Wafer Manufacturing Metrology Equipment TSK Prober UF200/UF200A Bundle : Several TSK Probers for sale. Preferred as package sale.   TSK-136 TSK-050 TSK-089 TSK-123 TSK-117 TSK Prober + Hinge TSK-Prober TSK-Prober TSK-Prober+Hinge TSK Prober UF200 UF200 UF200A Cool UF200A UF200A   TSK-094 TSK-061 TSK-120 TSK-119 TSK-113 TSK Prober TSK Prober + Hinge TSK-Prober TSK-Prober TSK-Prober UF200 UF200A UF200A UF200A UF200A   TSK-008 TSK-044 TSK-073 TSK-106 TSK-145 TSK-Prober TSK-Prober TSK-Prober TSK-Prober+Hinge TSK-Prober+Hinge UF200 UF200 UF200A UF200A UF200A 15   Villach, Carinthia

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Manufacturing Metrology Equipment: Accretech, CDE, Hewlett Packard, Minato, Nikon, SRM, Tesec, Veeco