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	View All Offers Under Surface Inspection » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Offers into sub-categories under Surface Inspection List all 2 product types under Surface Inspection

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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   49926 GCA/Tropel   GCA/Tropel   9000  Unpatterned Wafer Inspection in Surface Inspection GCA/TROPEL 9000: Surface Flatness Analyzer 1   Plano, TX 255557 KLA Tencor   KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   Regensburg, Bavaria 255558 KLA Tencor   KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   Regensburg, Bavaria 255559 KLA Tencor   KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   Regensburg, Bavaria 218321 KLA-Tencor   KLA-Tencor   AIT  Patterned Wafer Inspection in Surface Inspection KLA-Tencor AIT Patterned Wafer Inspection Tool: KLA-Tencor AIT Patterned Wafer Inspection Tool Call for Details 1   Plano, Texas 5310 KLA-Tencor   KLA-Tencor   7700  Patterned Wafer Inspection in Surface Inspection KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER: Patterned Wafer Contamination Analyzer Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films Capable of measuring defects on unpatterned wafers Capable of measuring wafers from 4” to 8” High sensitivity on after-etch and high topography applications Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers 1   F* Scotia, New York 250818 KLA-Tencor   KLA-Tencor   Puma 9120 IS  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool: KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool For 200mm or 300mm Wafers 2ea Cameras Please Inquire for Additional Details 1   Austin, Texas 250819 KLA-Tencor   KLA-Tencor   Puma 9130  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Puma 9130 Darkfield Inspection Tool: KLA-TENCOR Puma 9130 Darkfield Inspection Tool Parts Tool Please Inquire for Additional Details 1   Austin, Texas 250814 KLA-Tencor   KLA-Tencor   Surfscan SP1  Unpatterned Wafer Inspection in Surface Inspection KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool: KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool Dual Port 300mm 1   Plano, Texas 250815 KLA-Tencor   KLA-Tencor   Surfscan SP1  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too: KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool Dual Port 200mm 1   Plano, Texas 250816 KLA-Tencor   KLA-Tencor   Surfscan SP3+  Unpatterned Wafer Inspection in Surface Inspection KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool: KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool DUV Illumination Particle Detection to 32nm Dual 300mm FOUP Loadports Please Inquire for Additional Details 1   Austin, Texas 50017 KLA-Tencor   KLA-Tencor   Surfscan 4500  Unpatterned Wafer Inspection in Surface Inspection Tencor Surfscan 4500: TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool Cassette to Cassette Handling of 3” – 6” Wafers New HeNe 2mW Laser, 632.8 nm Wavelength New HeNe Laser Power Supply 2 µ Particle Size Sensitivity Automatic Calibration Flatscreen Monitor System Calibrated & Demonstrated Calibration Standard Wafer Included 1 45,012.06 Plano, Texas 249591 Tencor   Tencor   Surfscan 5500  Unpatterned Wafer Inspection in Surface Inspection Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool: Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool 1   Plano, Texas

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Surface Inspection: GCA/Tropel, KLA Tencor, KLA-Tencor, Tencor