 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
| Make |
Model |
| |
|
$ |
|
 |
254018
|
KLA-Tencor
|
KLA-Tencor |
2138XP |
in Microscope Inspection Tools
KLA-Tencor 2138XP Brightfield Inspection Tool:KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes
- For 150mm & 200mm Wafers
- Model 2552UI User Interface
- Denkenseiki Noise Filter
- Please Inquire for Additional Details
|
1
|
|
|
 N* |
Austin, Texas |
|
|
129073
|
KLA-Tencor
|
KLA-Tencor |
760-660139-00 |
in Other Motors
KLA-Tencor Power Changing Assy 760-660139-00:3 Lens Power Changing Assy complete w/optics
|
1
|
|
|
|
Plano, TX |
|
|
250822
|
KLA-Tencor
|
KLA-Tencor |
SWE Kit |
in Film Thickness Testers
KLA-TENCOR Spectra fx SWE Kit:KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit
|
1
|
|
|
|
Plano, Texas |
|
|
254093
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool:KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports
- Wafer Level Reliability
- Broadband Spectroscopic Ellipsometer
- Single Wave Ellipsometer
- Stress Measurement
- iDesorber
|
1
|
|
|
N* |
Austin, Texas |
|
|
249589
|
KLA-Tencor
|
KLA-Tencor |
ASET-F5x |
in Film Thickness Testers
KLA-Tencor ASET-F5x Thin Film Measurement System:KLA-TENCOR ASET-F5x Thin Film Measurement System - Serial Number 0202802R
- Manufactured in June, 2002
- Inspection Modes Include:
- Dual Beam Spectrometry
- Spectroscopic Ellipsometry
- Film Stress Analysis
- SUMMIT™ Application Software Version 3.21.16
- FTML Version 3.46.06
- Model 300DFF1P Wafer Loading Platform
- Dual Loadports for 300mm Wafers
- Three Axis Wafer Handling Robot
- GEM / SECS Communication
- Inquire for Additional Details
|
2
|
|
|
|
Austin, Texas |
|
|
250811
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
KLA-TENCOR Aleris 8350 Film Metrology Tool:KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports
- Wafer Level Reliability
- Broadband Spectroscopic Ellipsometer
- Single Wave Ellipsometer
- Stress Measurement
- iDesorber
|
1
|
|
|
|
Austin, Texas |
|
|
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Available
|
1
|
|
55,014.74 |
|
Austin, Texas |
|
|
133789
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
740-212542-000 |
in Lamps
KLA-Tencor 740-212542-000 Insert Assy with Lamps:KLA-Tencor 740-212542-000 Insert Assy with LampsInsert Assy with Lamps
|
1
|
|
|
|
Plano, TX |
|
|
254247
|
KLA-Tencor
|
KLA-Tencor |
Archer A500 AIM |
in Lithography Equipment
|
1
|
|
|
N* |
Malta, New York |
|
|
253369
|
KLA-Tencor
|
KLA-Tencor |
5200 |
in Lithography Equipment
|
1
|
|
|
|
Burlington, Vermont |
|
|
250823
|
KLA-Tencor
|
KLA-Tencor |
Viper 2401 |
in Metrology Equipment
KLA-TENCOR Viper 2401 After Develop Inspection Tool:KLA-TENCOR Viper 2401 After Develop Inspection Tool - Please Inquire for Details
|
1
|
|
|
|
Austin, Texas |
|
|
250821
|
KLA-Tencor
|
KLA-Tencor |
Archer 200 AIM |
in Critical Dimension Measurement Equipment
KLA-TENCOR Archer 200 AIM Overlay Metrology Tool:KLA-TENCOR Archer 200 AIM Overlay Metrology Tool - ETAL Stage
- Yaskawa Robot with NXC100 Controller
- IDE Maxon 1000 Floatation Controller
|
1
|
|
|
|
Plano, Texas |
|
|
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
|
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
|
149499
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658164-20 |
in Electrical and Electronic Components
KLA Tencor 710-658164-20 PLLAD-8 Assy:KLA Tencor 710-658164-20 PLLAD-8 AssyPLLAD-8 Assy
|
1
|
|
|
|
Plano, TX |
|
|
149500
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-653016-20 |
in Electrical and Electronic Components
KLA Tencor 710-653016-20 81B Assy:KLA Tencor 710-653016-20 81B Assy81B Assy
|
1
|
|
|
|
Plano, TX |
|
|
149501
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658076-20 |
in Electrical and Electronic Components
KLA Tencor 710-658076-20 Phase 3 Defect Processor PCB:KLA Tencor 710-658076-20 Phase 3 Defect Processor PCBPhase 3 Defect Processor PCB
|
1
|
|
|
|
Plano, TX |
|
|
149503
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658081-20 |
in Electrical and Electronic Components
KLA Tencor 710-658081-20 Defect Filter PCB Assy:KLA Tencor 710-658081-20 Defect Filter PCB AssyDefect Filter PCB Assy
|
1
|
|
|
|
Plano, TX |
|
|
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
|
Plano, TX |
|
|
250812
|
KLA-Tencor
|
KLA-Tencor |
HRP-240 |
in Film Thickness Testers
KLA-TENCOR HRP-240 High Resolution Profiler:KLA-TENCOR HRP-240 High Resolution Profiler - Cassette to Cassette Wafer Handling for up to 200mm Wafers
- Previously Configured for SMIF Wafer Handling
- Please Inquire for Additional Details
|
1
|
|
|
|
Milpitas, California |
|
|
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
|
Singapore |
|
|
254084
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
in Inspection Equipment
|
1
|
|
|
N* |
Singapore |
|
|
254085
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Inspection Equipment
|
1
|
|
|
N* |
Singapore |
|
|
254086
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Inspection Equipment
|
1
|
|
|
N* |
Singapore |
|
|
254087
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Inspection Equipment
|
1
|
|
|
N* |
Singapore |
|
|
155840
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
410918 |
in Semiconductor Parts
KLA-Tencor PN 410918:L-Stylus, DurasharpL-Stylus, Durasharp
|
5
|
|
|
|
Plano, TX |
|
|
249590
|
KLA-Tencor
|
KLA-Tencor |
Flexus 5400 |
in Metrology Equipment
KLA-Tencor Flexus 5400 Stress Measurement Tool:KLA-Tencor Flexus 5400 Stress Measurement Tool - Model # 304514
- Cassette to Cassette Handling of 100mm - 200mm Wafers
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
|
250814
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool:KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250815
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too:KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
|
250816
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP3+ |
in Surface Inspection
KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool:KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool - DUV Illumination
- Particle Detection to 32nm
- Dual 300mm FOUP Loadports
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
|
250818
|
KLA-Tencor
|
KLA-Tencor |
Puma 9120 IS |
in Surface Inspection
KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool:KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool - For 200mm or 300mm Wafers
- 2ea Cameras
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
|
250819
|
KLA-Tencor
|
KLA-Tencor |
Puma 9130 |
in Surface Inspection
KLA-TENCOR Puma 9130 Darkfield Inspection Tool:KLA-TENCOR Puma 9130 Darkfield Inspection Tool - Parts Tool
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
|
50017
|
KLA-Tencor
|
KLA-Tencor |
Surfscan 4500 |
in Surface Inspection
Tencor Surfscan 4500:TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool - Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
|
1
|
|
45,012.06 |
|
Plano, Texas |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Optical Microscopes
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
|
|
Malta, New York |
|
|
254147
|
KLA-Tencor
|
KLA-Tencor |
UV1280SE |
in Optical Microscopes
KLA Tencor UV1280SE, 200mm, s/n: 991098:Film thickness measurement tool
|
1
|
|
|
N* |
Singapore |
|
|
254148
|
KLA-Tencor
|
KLA-Tencor |
OP5240I |
in Optical Microscopes
|
1
|
|
|
N* |
Santa Clara, California |
|
|
254149
|
KLA-Tencor
|
KLA-Tencor |
OP3260I |
in Optical Microscopes
KLA Tencor OP3260I, 200mm, s/n: 6678:Film thickness measurement
|
1
|
|
|
N* |
Singapore |
|
|
254150
|
KLA-Tencor
|
KLA-Tencor |
OP2600DUVI |
in Optical Microscopes
KLA Tencor OP2600DUVI, 200mm, s/n: 6454:Film thickness measurement
|
1
|
|
|
N* |
Singapore |
|
|
252339
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
252340
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
|
Singapore |
|
|
253033
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA Tencor AIT II, 200mm, s/n: 9234:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
|
|
Burlington, Vermont |
|
|
253037
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA-Tencor AIT II, 200mm, s/n: 9262:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
|
|
Burlington, Vermont |
|
|
253038
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA-Tencor AIT II, 200mm, s/n: 9152:AIT II w/ ADC. Defect Inspection
|
1
|
|
|
|
Burlington, Vermont |
|
|
253039
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Optical Microscopes
|
1
|
|
|
|
Burlington, Vermont |
|
|
253040
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA Tencor AIT II, 200mm, s/n: 9145:KLA-Tencor AIT II w/ ADC. Defect Inspection
|
1
|
|
|
|
Burlington, Vermont |
|
|
254255
|
KLA-Tencor
|
KLA-Tencor |
2835 |
in Optical Microscopes
KLA 2835, 300mm, s/n: 1340334:Brightfield Inspection
|
1
|
|
|
N* |
Malta, New York |
|
|
126787
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor SQ. 4" Wafer Locator Ring for Flexus 2320:SQ. 4" Wafer Locator Ring for Flexus 2320
|
1
|
|
|
|
Plano, TX |
|
|
126788
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor 3" Wafer Locator Rings for Flexus 2320:3" Wafer Locator Rings for Flexus 2320
|
2
|
|
|
|
Plano, TX |
|
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