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Your search for Manufacturer: Nanometrics
found:
  • 2 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
248941
Nanometrics  

Nanometrics  

8300XSE 

List all items of this typeEllipsometers

in Film Thickness Testers

Nanometrics 8300XSE Film Thickness Analyzer:

Nanometrics 8300XSE Film Thickness Analyzer

  • J.A. Woollam M-44 Spectroscopic Ellipsometer
  • J.A. Woollam EC-270 Ellipsometer Controller
  • J.A. Woollam LPS-420 Xenon Light Source
  • Manual Loading of up to 300mm Wafers
  • Yaskawa ERCR-NS01-B004 Motion Controller
 1   N* Plano, Texas
3863
Nanometrics  

Nanometrics  

NANOLINE III 

List all items of this typeOptical CD Measurement

in Critical Dimension Measurement Equipment

NANOMETRICS CRITICAL DIMENSION COMPUTER:

Critical Dimension Computer

Large memory digital computer calculates line widths
and provides statistics on in process wafer and photomasks.

 1   F* Scotia, New York

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.