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Your search for Manufacturer: Nanometrics
found:
  • 3 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
248941
Nanometrics  

Nanometrics  

8300XSE 

List all items of this typeEllipsometers

in Film Thickness Testers

Nanometrics 8300XSE Film Thickness Analyzer:

Nanometrics 8300XSE Film Thickness Analyzer

  • J.A. Woollam M-44 Spectroscopic Ellipsometer
  • J.A. Woollam EC-270 Ellipsometer Controller
  • J.A. Woollam LPS-420 Xenon Light Source
  • Manual Loading of up to 300mm Wafers
  • Yaskawa ERCR-NS01-B004 Motion Controller
  • Please Inquire for Additional Details
 1   Austin, Texas
261179
Nanometrics  

Nanometrics  

ECV Pro UV 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Nanometrics ECV Pro UV Electrochemical CV Profiler:

Nanometrics ECVPro Carrier Concentration Profiler

  • For Si, SiC, II-VI, III-V & III-Nitrides 
  • Hamamatsu LC8 UV Light Source
  • ECVision In-Situ Camera System
  • Dual Frequency Measurement
  • Carrier Frequency: 0.3kHz to 50kHz
  • Depth Range: 0.05μm to 50μm
  • Depth Resolution: 1nm 
  • Dell PC, Windows 8 OS, ECV Pro SW Version 2.4.6.0

     Installation & Training Available

 1 110,029.48 Plano, Texas
3863
Nanometrics  

Nanometrics  

NANOLINE III 

List all items of this typeOptical CD Measurement

in Critical Dimension Measurement Equipment

NANOMETRICS CRITICAL DIMENSION COMPUTER:

Critical Dimension Computer

Large memory digital computer calculates line widths
and provides statistics on in process wafer and photomasks.

 1   F* Scotia, New York

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.