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 Parts and Accessories - Other  in Parts and Accessories, Microscope  (20)

 Patterned Wafer Inspection  in Surface Inspection  (2)

 Polishing & Grinding Sample Prep Equipment  in Sample Preparation  (1)

 Profilometers  in Film Thickness Testers  (4)

 Sample Coaters  in Sample Preparation  (2)

 Optical CD Measurement  in Critical Dimension Measurement Equipment  (1)

 Other Items  in Microscopes  (4)

 Overlay Registration  in Critical Dimension Measurement Equipment  (3)

 Objective Lenses  in Parts and Accessories, Microscope  (1)

 Stereo Microscopes  in Optical Microscopes  (47)

 FT-IR Spectrometers  in Spectrometers  (4)

 Stress Measurement Equipment  in Metrology Equipment  (1)

 Unpatterned Wafer Inspection  in Surface Inspection  (2)

 Upright Microscopes  in Optical Microscopes  (25)

 Fiber Optic Light Sources  in Fiber Optic Illuminators  (8)

 UV-Visible Spectrophotometers  in Spectrophotometers  (2)

 Wafer Inspection Microscopes  in Optical Microscopes  (18)

 Xray Fluorescence Spectrometers  in Spectrometers  (3)

 Critical Dimension Scanning Electron Microscopes  in Microscopes  (1)

 Stands  in Parts and Accessories, Microscope  (20)

 Film Thickness Testers - Other  in Film Thickness Testers  (3)

 Sample Preparation - Other  in Sample Preparation  (4)

 Cut-Off Saws  in Surface Processing Equipment  (4)

 Scanning Electron Microscopes  in Inspection Equipment  (5)

 Microscopes - Other  in Optical Microscopes  (10)

 CV Plotters  in Metrology Equipment  (2)

 Spectrometers - Other  in Spectrometers  (1)

 Ellipsometers  in Film Thickness Testers  (8)

 Inverted Microscopes  in Optical Microscopes  (2)

 Cameras and Controllers  in Optical Microscopes  (3)

 4 & 6 Point Probes  in Resistivity Testers  (2)

 Measuring Microscopes  in Optical Microscopes  (7)

 Automatic Wafer Inspection Tools  in Microscope Inspection Tools  (4)

 Metrology Equipment - Other  in Metrology Equipment  (5)

Items from the following manufacturers are offered under Metrology Equipment:
ADE, American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, Bausch & Lomb, Inc, Bausch and Lomb, Bio-Rad, Buehler, Carl Zeiss, CPS, CR Technology, Dage-MTI, DELTRONIC, Denton, Diagnostic Instruments, Dolan Jenner, FEI, Fostec, Four Dimensions, Frontier Semiconductor, Gaertner, Gatan, GCA/Tropel, Hitachi, HMI, HSEB, Karl Storz, KLA Tencor, KLA-Tencor, Leco, Leica, Leica, Leitz, Matrix Corp, McPherson, Melles Griot, Microspec, Mitutoyo, Nanometrics, Nicolet, Nikon, Nikon, Olympus, Orbotech, Plasmos, Reichert Inc, Reichert-Jung, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Schott Fostec, Semprex, Sloan, Solid State Measurement, Spectronic Unicam, Thermo Electron, Veeco Instruments, Vision Engineering, Volpi, Well, Wild, Zeiss