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     Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
    Make Model
      $  
    178406

    Allied  

    MultiPrep 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 F* Singapore,
    Allied, MultiPrep, Polisher, 200mm
    Manufactured in 1996; Status: Unhooked
    111048

    American Optical  

    1177-1 

    List all items of this typeFiber Optic Light Sources

    in Fiber Optic Illuminators

    2 195.00 F* Scotia, NY
    AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE
    Fiber Optic Light Source
    1895

    American Optical  

    570 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 525.00 Scotia, NY
    AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X
    Stereo Zoom Microscope

    (stand not included)

     

    1894

    American Optical  

    580 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    2 550.00 Scotia, NY
    AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X
    Stereo Zoom Microscope

    (stand and arm not included)

    171583

    Anatech Ltd  

    Hummer 6.6T 

    List all items of this typeSample Coaters

    in Sample Preparation

    1 F* Scotia, NY
    ANATECH HUMMER 6.6T SPUTTER SYSTEM
    Sputter System
    180474

    Applied Materials  

    NanoSEM 3D 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* East Fishkill, NY
    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


    SEM - Critical Dimension (CD) Measurement

    Currently configured for 300mm wafers

    CE Marked

    Install Type: Stand Alone

    Cassette Interface:

    • (3) 300mm FOUP

    Roll-Around Ergo-Station w/Touch-Screen

    Status Lamp

    Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8)

    Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

     

    Software Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8

    180514

    Applied Materials  

    NanoSEM 3D 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* East Fishkill, NY
    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

    MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


    SEM - Critical Dimension (CD) Measurement

    Currently configured for 300mm wafers

    CE Marked

    Install Type: Stand Alone

    Cassette Interface:

    • (3) 300mm FOUP

    Roll-Around Ergo-Station w/Touch-Screen

    Status Lamp

    Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8)

    Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

     

    Software Options:

    • Slope Reconstruction

    • CH Analysis

    • Profile Grade

    • Discrete Inspection

    • Defect Review

    • ARAMS (ES8

     

    Tool ID: KA03

    189511

    Applied Materials  

    Semvision CX 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Burlington, Vermont
    Applied Materials, SEMVision CX, 200mm,
    Applied Materials, SEMVision CX, 200mm,

    Serial Number is W854.
    184614

    ATM GmbH  

    Brillant BR250.2 

    List all items of this typeCut-Off Saws

    in Surface Processing Equipment

    1 F* Scotia, NY
    ATM GmbH CUT OFF SAW 12"
    Cut-Off Saw
    176719

    SELA  

    EM2 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Regensburg, BY
    Automated TEM and SEM sample preparation system - SELA EM2

    A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

    Tool is completed.

    Used within FE & BE failure analysis

    110163

    BAL-TEC  

    SCD 050 

    List all items of this typeSample Coaters

    in Sample Preparation

    1 Scotia, NY
    BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP
    Sputter Coater
    1786

    Bausch & Lomb  

    Type A 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    13 185.00 Scotia, NY
    BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND
    Type A Incident Light Stand

    Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
    1785

    Bausch & Lomb  

    312690 

    List all items of this typeParts and Accessories - Other

    in Parts and Accessories, Microscope

    10 180.00 F* Scotia, NY
    BAUSCH & LOMB ER-ARM
    ER-Arm

    Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
    964

    Bausch & Lomb  

    MicroZoomII 

    List all items of this typeMicroscopes - Other

    in Optical Microscopes

    1 4,000.00 Scotia, NY
    BAUSCH & LOMB MICROSCOPE WORK STATION
    Microscope Work Station

    Long working distance objectives

     

    146

    Bausch & Lomb  

    StereoZoom 7 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    7 Scotia, New York
    BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X
    Stereo Zoom Microscope

    Scopes listed include pod and eyepieces only

     

    248

    Bausch & Lomb  

    StereoZoom 7 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 Scotia, New York
    BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X
    Stereo Zoom Microscope with Camera
    3264

    Bausch & Lomb  

    StereoZoom 1 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    13 225.00 Scotia, NY
    BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X
    Stereo Zoom Microscope

    Microscopes listed are for pod and eyepieces only

     

    110365

    Bausch & Lomb  

    StereoZoom 2 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 350.00 Scotia, NY
    BAUSCH & LOMB STEREO MICROSCOPE 2X
    Stereo Zoom Microscope

     



    Microscopes listed are for pod and eyepieces only

     

    145

    Bausch & Lomb  

    StereoZoom 4 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    7 Scotia, New York
    BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X
    Stereo Zoom Microscope

    Pod color may vary
    Microscopes listed are for pod and eyepieces only

     

    1800

    Bausch & Lomb  

    StereoZoom 5 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 600.00 Scotia, NY
    BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X
    Stereo Zoom Microscope

    Scopes listed include pod and eyepieces only

     

    159266

    Bausch & Lomb  

    SZ4 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 F* Plano, TX
    Bausch & Lomb Stereo Zoom 4
    StereoZoom 4 Microscope with Boom Stand
    161016

    Bausch & Lomb  

    StereoZoom 4 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 Plano, TX
    Bausch & Lomb StereoZoom 4
    Microscope on Small Base
    161018

    Bausch & Lomb  

    StereoZoom 6 Plus 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 F* Plano, TX
    Bausch & Lomb StereoZoom 6 Plus
    Microscope Head
    159267

    Bausch & Lomb  

    SZ 6-ST 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 Plano, TX
    Bausch & Lomb StereoZoom 6-ST
    StereoZoom Microscope with Boom Stand
    157435

    Bausch & Lomb  

    StereoZoom 7 

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    1 F* Plano, TX
    BAUSCH & LOMB StereoZoom 7
    Microscope & Boom Stand
    110364

    Bausch & Lomb  

    Type K 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    1 235.00 Scotia, NY
    BAUSCH & LOMB TYPE K STAND
    K Stand for B&L StereoZoom Microscopes

    Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
    E-Arm not included
    109598
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    4 300.00 Scotia, NY
    BOOM STAND
    Table Clamp Microscope Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109648
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    1 325.00 Scotia, NY
    BOOM STAND
    Microscope Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109553
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    2 325.00 Scotia, NY
    BOOM STAND
    Microscope Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109554
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    2 325.00 Scotia, NY
    BOOM STAND
    Microscope Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109122
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    19 350.00 F* Scotia, NY
    BOOM STAND
    Microscope Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109425
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    6 350.00 Scotia, NY
    BOOM STAND
    Microscope Boom Stand w/ Rectangular Horizontal Post

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109427
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    2 350.00 Scotia, NY
    BOOM STAND
    Dual Arm Microscope Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    109549
    BOOM STAND 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    2 350.00 Scotia, NY
    BOOM STAND
    Microscope Boom Stand w/ Rotatable Knuckle

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    185800

    Buehler  

    SimpliMet 1000 

    List all items of this typeMounting Press

    in Sample Preparation

    1 4,950.00 F* Scotia, NY
    BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY
    Automatic Mounting Press
    23007

    Buehler  

    Carbimet Paper Discs 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    2 50.00 F* Scotia, NY
    BUEHLER CARBIMET 320 GRIT PAPER DISCS
    Paper Discs 320 Grit

    Buehler part number: 30-5108-320-100
    4436

    Buehler  

    Consumables 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    4 Scotia, NY
    BUEHLER CONSUMABLES, POLISHING AND GRINDING
    Polishing and Grinding Consumables
    122523

    Buehler  

    Dressing Chuck 

    List all items of this typeCut-Off Saws

    in Surface Processing Equipment

    2 185.00 F* Scotia, NY
    BUEHLER ISOMET DRESSING CHUCK
    Dressing Chuck

    142877

    Buehler  

    ISOMET 

    List all items of this typeCut-Off Saws

    in Surface Processing Equipment

    4 3,350.00 F* Scotia, NY
    BUEHLER LOW SPEED CUT-OFF SAW
    Precision Sectioning Saw

    Representative photo - color of saw may vary

    Various ISOMET chucks available. 
    See other information for more details.
    116574

    Buehler  

    Primet 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 650.00 F* Scotia, NY
    BUEHLER PRIMET MODULAR DISPENSING SATELLITE
    Modular Dispensing Satellite

    147703

    Buehler  

    48-1573GGG-R 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 3,850.00 F* Scotia, NY
    BUEHLER THREE POSITION POLISHING BENCH
    Three Position Polishing Bench

    178410

    Buehler  

    Ecomet-3000 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 Taichung, Taichung City
    Buehler, Ecomet-3000 Polisher, 300mm
    Status: Bagged and Skidded
    178407

    Buehler  

    Ecomet-3000 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 F* Taichung, Taichung City
    Buehler, Polisher, Ecomet-3000 300mm
    Status: Bagged and Skidded
    178409

    Buehler  

    Ecomet-3000 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 F* Taichung, Taichung City
    Buehler, Polisher, 300mm
    Status: Bagged and Skidded
    173380

    Coborn  

    PS1 (PS-1) 

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 F* Leominster, Massachusetts
    Coborn Planetary Skive for Diamond Faceting & Polishing Bench

    Coborn Planetary Skive (Scaif) Diamond (SCD) Faceting and Polishing Bench equipped with 24x36 inch table, 3-phase fixed speed spindle, and an additional planetary motion functionality.

    • Engineered to polish and/or finish single-crystal diamond (SCD) materials including cutting tools, gemstones, and substrates for scientific research.
    • Planetary motion can improve diamond removal rates, polished surface finish, and/or edge quality especially on difficult-to-polish SCD (CVD, HPHT, or Natural).  The relative motion of the wheel and SCD workpiece also minimizes uneven wear of "tracks" in the ferrous skive wheel/plate.
    • The system design offered can be operated with or without planetary motion.
    • Refurbishment includes a new charcoal gray laminated top applied to a thick steel tabletop. 
    • Goods to be sold in tested, refurbished condition with a limited warranty. 
    • 5/22/17 update: The unit shown in the attached images has been sold.  However, refurbishment of a similar system is nearing completion.  Photos will be updated soon.
    165713

    Coborn  

    SK-KKAS  

    List all items of this typePolishing & Grinding Sample Prep Equipment

    in Sample Preparation

    1 F* Sterling, Massachusetts
    Coborn SK-KKAS Skive Spindle (1.5kW)
    • Coborn SK-KKAS Scaif (Skive) Spindle with advanced functionality.
    • For Polishing & Faceting Single Crystal Diamond: Natural and Lab-Made
      • Height-Adjustable Nose (Z position of spindle nose).
      • Includes Coborn Airflow Bowl option (for dust collection below spindle).
      • Includes Coborn Expanding Nose option (replaceable "collet").
      • Wired to enable variable spindle speed.
    • This 3-Phase spindle was previously tested at Cline Innovations using a sturdy skive bench (not included/available) equipped with a variable speed drive.
    • Skive bench is NOT included with this listing.
    • If you prefer to purchase a complete, operational planetary scaife bench, please see Cline Innovations' listing 173380 .
    7353

    CPS  

    6004/1958 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 3,750.00 Scotia, NY
    CPS ELECTRON GUN POWER SUPPLY 30KV
    Electron Gun Power Supply

    CPS Computer Power Supply 6004
    28680

    Dage-MTI  

    SERIES 68 

    List all items of this typeCameras and Controllers

    in Optical Microscopes

    2 1,200.00 Scotia, NY
    DAGE-MTI SERIES 68 INFRARED CAMERA
    Infrared Camera
    176738

    Denton  

    Desk II 

    List all items of this typeSample Coaters

    in Sample Preparation

    1 F* Scotia, NY
    DENTON VACUUM DESKTOP SPUTTERING UNIT/SAMPLE COATER
    Desktop Sputtering Unit
    57426

    Denton  

    DESK II 

    List all items of this typeSample Coaters

    in Sample Preparation

    1 6,250.00 F* Scotia, NY
    DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP
    Metal Sputter

    159268

    Diagnostic Instrumts  

     

    List all items of this typeStereo Microscopes

    in Optical Microscopes

    2 Plano, TX
    Diagnostic Instruments
    Microscope Boom Stand
    86452

    Diagnostic Instrumts  

    SMS16-B 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    1 325.00 F* Scotia, NY
    DIAGNOSTIC INSTRUMENTS BOOM STAND
    Boom Stand
    109548

    Diagnostic Instrumts  

    SMS16-A 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    2 350.00 Scotia, NY
    DIAGNOSTIC INSTRUMENTS BOOM STAND
    Weighted Base Boom Stand

    Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

    Available only with purchase of a Stereozoom Microscope
    E-arm not included

    43778

    Diagnostic In  

    SMS20 

    List all items of this typeStands

    in Parts and Accessories, Microscope

    1 1,075.00 Scotia, NY
    DIAGNOSTIC INSTRUMENTS SMS20
    Boom Stand

    Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
    Available only with purchase of a Stereozoom Microscope
    E-arm not included
    18711

    Dolan Jenner  

    180 

    List all items of this typeFiber Optic Light Sources

    in Fiber Optic Illuminators

    1 150.00 F* Scotia, NY
    DOLAN JENNER FIBER OPTIC LIGHT SOURCE
    Fiber Optic Light Source
    122729

    Dolan Jenner  

    PL-750A- 111 

    List all items of this typeFiber Optic Light Sources

    in Fiber Optic Illuminators

    1 225.00 F* Scotia, NY
    DOLAN JENNER FIBER OPTIC LIGHT SOURCE
    Fiber Optic Light Source

    4499

    Edwards  

    S150 

    List all items of this typeSample Coaters

    in Sample Preparation

    1 F* Scotia, New York
    EDWARDS CARBON EVAPORATION SOURCE
    Carbon Evaporation Source
    181557

    FEI  

    200XP TMP 

    List all items of this typeFocused Ion Beam Tools

    in Electron Microscopy

    1 F* Scotia, New York
    FEI FOCUSED ION BEAM SYSTEM
    Focus Ion Beam System

    The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
    191756

    FEI  

    T30 

    List all items of this typeMicroscopes - Other

    in Optical Microscopes

    1 N* East Fishkill, New York
    FEI T30, TEM, with LaB6 filament operating at 300KeV
    FEI T30, TEM, with LaB6 filament operating at 300KeV

    Cold idle in Lab.

    2010 

    S/N: 30TN6S / D906


    191594

    FEI  

    Tecnial TF-20 

    List all items of this typeMicroscopes - Other

    in Optical Microscopes

    1 F*N* Burlington, Vermont
    FEI Tecnai F20 FE-TEM,
    FEI Tecnai F20 FE-TEM, 

    S/N: D241

    Main Instrument:  Tecnai F20 S-Twin 
     
    FEI Accessories
     
    STEM system for FEG
    Tecnai Extended Workstation
    HAADF Detector
    TIA Software
    Scanned Image Technique
    EDX Spectroscopy Technique
    EFTEM Technique
    Tecnai Function with Digital Micrograph
    EFTEM EELS Module
    Tecnai Macro Facility
    Compustage Rotation Holder
    Compustage Low Background Double-Tilt Holder
    Hingeable Mount, Binoculars
    Tecnai Smart Tilt
    Tecnai Compucentricity
     
    Third-Party Accessories
     
    NEC 20-inch LCD Monitor
    EDAX Digital Pulse Processor, TEM
    Gatan 794 MSC Camera, 1K (BROKEN)
    Energy Filter, GIF 2001, Grade A, 1K (BROKEN)
    Tecnai K Space Control
    EDAX RTEM SUTW Detector
    Gatan Single Tilt Rotation Holder, Low Background
    Gatan Double Tilt Rotation Holder
     
    Also, the Compustage has been upgraded to the newer Tecnai Osiris type.
    134541
    FIBER OPTIC LIGHT SOURCE 

    List all items of this typeFiber Optic Light Sources

    in Fiber Optic Illuminators

    1 180.00 F* Scotia, NY
    FIBER OPTIC LIGHT SOURCE
    Remote Fiber Optic Illuminator

    Model FOI-150-Remote
    134624
    FIBER OPTIC LIGHT SOURCE 

    List all items of this typeFiber Optic Light Sources

    in Fiber Optic Illuminators

    1 180.00 F* Scotia, NY
    FIBER OPTIC LIGHT SOURCE
    Fiber Optic Illuminator

    Manufacturer Unknown
    175864

    Gatan  

    691 PIPS 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Scotia, NY
    GATAN 691 PRECISION ION POLISHING SYSTEM PIPS

    Precision Ion Polishing System (PIPS)

    The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
    produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

    176740

    Gatan  

    691 PIPS 

    List all items of this typeSample Preparation - Other

    in Sample Preparation

    1 F* Scotia, NY
    GATAN 691 PRECISION ION POLISHING SYSTEM PIPS

    Precision Ion Polishing System (PIPS).

    Includes Gatan Binocular Microscope

    The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
    produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

    175315

    Gatan  

    681 

    List all items of this typeSample Coaters

    in Sample Preparation

    1 F* Scotia, NY
    GATAN ION BEAM COATER (IBC)
    Ion Beam Coater

    Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

    SEM or TEM specimens
    100557

    Hitachi  

    S-2400 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-2400 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Micrscope (SEM)
    60831

    Hitachi  

    S-4100 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE
    Field Emission Electron Microscope

    NB: System is missing Ion pump power supply. Sold "As Is".
    35762

    Hitachi  

    S-7000 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Plano, TX
    Hitachi S-7000
    CD SEM Measurement Tool
    324

    Hitachi  

    S-806C 

    List all items of this typeScanning Electron Microscopes

    in Inspection Equipment

    1 F* Scotia, NY
    HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE
    Field Emission Scanning Electron Microscope
    178293

    Hitachi  

    4500 

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    in Inspection Equipment

    1 F* Singapore,
    Hitachi, 4500 SEM, 200mm
    Manufactured in 1990
    178296

    Hitachi  

    Microanalysis System 

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    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Metrology, Microanalysis System 300mm
    Status: Bagged and Skidded
    178294

    Hitachi  

    AS5000 

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    in Inspection Equipment

    1 F* Singapore,
    Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm
    Status: Cold Shutdown

    Wafer Particle & Defect Analysis system AS5000

    Defect data server




    178710

    Hitachi  

    RS4000 

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    in Inspection Equipment

    1 N* Taichung, Taichung City
    178297

    Hitachi  

    RS4000 

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    in Inspection Equipment

    1 N* Taichung, Taichung City
    Hitachi, RS4000 , Defect Review, 300mm
    Manufactured in 2005; Status: Bagged and Skidded
    178298

    Hitachi  

    RS5000 

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    in Inspection Equipment

    1 N* Taichung, Taichung City
    Hitachi, RS5000, Defect Review, 300mm
    Manufactured in 2006; Status: Bagged and Skidded
    191596

    Hitachi  

    S-4500 

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    in Inspection Equipment

    1 F*N* Burlington, Vermont
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Hitachi, S-4500, SEM, Failure Analysis SEM
    Quartz PCI USB V9.5 (for Image Capture)
    System is powered up and under vacuum.
    Was under service contract through April 2017.


    S/N: 7926-02


    191493

    Hitachi  

    S-5000 

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    in Inspection Equipment

    1 F*N* Burlington, Vermont
    Hitachi, S-5000, SEM, 200mm
    Hitachi, S-5000, SEM, 200mm

    Running.
    Power ON, Under Vacuum.

    S/N: 0500-02-03

    DOM 1995
    178287

    Hitachi  

    S-7800 

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    in Microscopes

    1 F* Singapore,
    Hitachi, S-7800 CD-SEM, 200mm
    Manufactured in 2008
    178299

    Hitachi  

    Z-5700 

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    in Inspection Equipment

    1 F* Taichung, Taichung City
    Hitachi, Z-5700 Spectroscopy, 300mm
    Status: Bagged and Skidded
    189211
    HMI, eScan 320, 300mm, ebeam Inspection 

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    in Microscopes

    1 F* Malta, New York
    HMI, eScan 320, 300mm, ebeam Inspection
    HMI, eScan 320, 300mm, ebeam Inspection
    eScan 320 eBeam defect inspection and review system
    Integrated front-end, Dual Pod 300mm FOUP 
    2- High quality flat panel displays
    GUI/Image computer XEON Dual CPU 3.2GHZ, 2GB Memory
    Host computer Pentium IV 3.2 GHZ, 2GB Memory
    DBDB (Detection, baseon Design Base) function
    E-chuck wafer holder
    Active Damping
    TFE electron beam emission source sub-system
    Electron=optice column sub-system
    HV power sub-system
    Programmable wafer biasing & charge balance control.
    SE and BSE high speed detection 







    Tool is still in the fab.
    181188

    HSEB  

    Axiospect 300 

    List all items of this typeWafer Inspection Microscopes

    in Optical Microscopes

    1 F* Dresden, SN
    HSEB Axiospect 300, 300mm Wafer inspection microscope
    HSEB Axiospect 300, 300mm Wafer inspection microscope
    Stereo Microscope
    Tool ID: OPI905
    Serial Number: 41302020182
    54074

    Irvine Optical  

    UltraSpec III 

    List all items of this typeAutomatic Wafer Inspection Tools

    in Microscope Inspection Tools

    1 Plano, TX
    Irvine Optical UltraSpec III
    Wafer Inspection Station
    136281

    Irvine Optical Co.  

    UltraSpec III 

    List all items of this typeAutomatic Wafer Inspection Tools

    in Microscope Inspection Tools

    1 Plano, TX
    Irvine Optical UltraSpec III Wafer Inspection Station
    Irvine Optical UltraSpec III Wafer Inspection Station
    131723

    Irvine Optical Co.  

    Ultrastation 3 

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    in Microscope Inspection Tools

    1 Plano, TX
    IRVINE OPTICAL Ultrastation 3
    Macro Inspection Tool
    184441

    Irvine Optical Co.  

    Ultrastation 3.E 

    List all items of this typeAutomatic Wafer Inspection Tools

    in Microscope Inspection Tools

    1 Plano, TX
    Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
    Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
    • Automatic Wafer Loading for up to 200mm Wafers
    • LED Display and Extended Control Keyboard
    • Nikon CF Plan Optics; 5X, 10X, 20X, 50X & 150X B/Dfield Objectives
    • Differential Interference Contrast 
    • Ergonomic Trinocular Head with CFWN 10X/20 Eyepieces
    • Motic Moticam 1000 USB Camera
    • Nikon LHS-H100P-1 Lamphouse
    • 12V 100W Halogen Lamp
    184442

    Irvine Optical Co.  

    Ultrastation 3.E 

    List all items of this typeAutomatic Wafer Inspection Tools

    in Microscope Inspection Tools

    1 Plano, TX
    Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
    Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
    • Automatic Wafer Loading for up to 200mm Wafers
    • LED Display and Standard Control Keyboard
    • Motorized Turret with Nikon BD Plan Optics
      • 5X, 10X, 40X & 100X B/Dfield Objectives
    • Ergonomic Trinocular Head with UW 10X/25 Eyepieces
    • Nikon Lamphouse with 12V 100W Halogen Lamp
    6402

    JEOL  

    JSM 6100 

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    in Inspection Equipment

    1 F* Scotia, NY
    JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE
    Scanning Electron Microscope with LaB Filament
    77955

    JEOL  

    JWS-7505ZH 

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Microscopes

    1 F* Plano, TX
    Jeol JWS-7505ZH
    Critical Dimension Scanning Electron Microscope
    178300

    JEOL  

    7555 

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    1 N* Taichung, Taichung City
    JEOL, Defect Review, 200mm
    Status: Cold Shutdown
    178302

    JEOL  

    JEM-2500SE 

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    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    178303

    JEOL  

    JEM-2500SE 

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    1 Taichung, Taichung City
    JEOL, JEM-2500SE Microscopes, 300mm
    Status: Bagged and Skidded
    187765

    JEOL  

    JWS 7555S 

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    1 Singapore,
    JEOL, JWS 7555S, Defect Review, 200mm
    JEOL, JWS 7555S, Defect Review, 200mm
    189689

    JEOL  

    JWS-7515 

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    in Inspection Equipment

    1 F* Singapore,
    JEOL, JWS-7515, 200mm, SEM
    JEOL, JWS-7515, 200mm, SEM

    S/N: WS179028-108
    332

    Karl Storz  

    483C 

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    in Parts and Accessories, Microscope

    1 350.00 Scotia, NY
    KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE
    Twin Fiber Optic Light Source

    Light guide not included.
    191527

    KLA-Tencor  

    8100XP 

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    in Microscopes

    1 F*N* Singapore,
    KLA-Tencor, 8100XP, CD SEM, 200mm
    KLA-Tencor, 8100XP, CD SEM, 200mm

    S/N: 602
    178326

    KLA-Tencor  

    CRS1010 

    List all items of this typeWafer Inspection Microscopes

    in Optical Microscopes

    1 F* Singapore,
    KLA-Tencor, CRS1010 Defect Review, 200mm
    Manufactured in 1997; Status: Bagged and Skidded
    178304

    KLA-Tencor  

    ES31 

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    in Inspection Equipment

    1 F* Singapore,
    178305

    KLA-Tencor  

    ES32 

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    in Inspection Equipment

    1 N* Taichung, Taichung City
    KLA-Tencor, ES32, E-beam Inspection, 300mm
    Manufactured in 2007; Status: Bagged and Skidded
    188890

    KLA-Tencor  

    eS810 

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    in Inspection Equipment

    1 East Fishkill, New York
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    188891

    KLA-Tencor  

    eS810 

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    in Inspection Equipment

    1 F* East Fishkill, NY
    KLA-TENCOR, eS810, e-beam inspection, 300mm
    KLA-TENCOR, eS810, e-beam inspection, 300mm

    S/N: 5158014


    Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

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    *   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

    NOTE:
       photo available
       reference document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.

    Items from the following manufacturers are offered under Microscope Inspection Tools:
    Allied, American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, BAL-TEC, Bausch & Lomb, Inc, Buehler, Coborn, CPS, Dage-MTI, Denton, Diagnostic Instruments, Dolan Jenner, Edwards, FEI, Fostec, Gatan, Hitachi, HSEB, Irvine Optical Company, JEOL, Karl Storz, KLA-Tencor, Leco, Leica, Leica, Leitz, Melles Griot, Microspec, Mitutoyo, Nikon, Nikon, Olympus, Prior Scientific, Reichert Inc, Reichert-Jung, RK Print Coat Instruments, Schott Fostec, SELA, Semicaps, Semprex, South Bay Technology, Strasbaugh, Suss Microtec, Vision Engineering, Vistec Semiconductor, Volpi, Wild, Zeiss