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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
192337
Leica  

Leica  

E3610 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Advantest, E3610, MASK CD SEM,:
Advantest, E3610, MASK CD SEM,
Leica E3610 CD SEM

WAFER MASK CD SEM

S/N : 710005324

2006 Vintage

For Post 64nm Technology node

Front End Module
Fan filter unit (FFU)
SMIF Versa Port 
InSPEQ Bench module
Electric Frame
Vacuum pump unit 
Ozonizer Unit
Custom TMC active isolation pad for 24" raised floor
111048
American Optical  

American Optical  

1177-1 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

2 195.00 F* Scotia, NY
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
1895
American Optical  

American Optical  

570 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 525.00 Scotia, NY
AMERICAN OPTICAL STEREO MICROSCOPE 7X - 42X:
Stereo Zoom Microscope

(stand not included)

 

1894
American Optical  

American Optical  

580 

List all items of this typeStereo Microscopes

in Optical Microscopes

2 550.00 Scotia, NY
AMERICAN OPTICAL STEREO ZOOM MICROSCOPES 10X - 60X:
Stereo Zoom Microscope

(stand and arm not included)

171583
Anatech Ltd  

Anatech Ltd  

Hummer 6.6T 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
ANATECH HUMMER 6.6T SPUTTER SYSTEM:
Sputter System
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
184614
ATM GmbH  

ATM GmbH  

Brillant BR250.2 

List all items of this typeCut-Off Saws

in Surface Processing Equipment

1   F* Scotia, NY
ATM GmbH CUT OFF SAW 12" :
Cut-Off Saw
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

110163
BAL-TEC  

BAL-TEC  

SCD 050 

List all items of this typeSample Coaters

in Sample Preparation

1   Scotia, NY
BAL-TEC SAMPLE COATER/SPUTTER COATER SEM SAMPLE PREP:
Sputter Coater
1786
Bausch & Lomb  

Bausch & Lomb  

Type A 

List all items of this typeStands

in Parts and Accessories, Microscope

13 185.00 Scotia, NY
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:
Type A Incident Light Stand

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
1785
Bausch & Lomb  

Bausch & Lomb  

312690 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

10 180.00 F* Scotia, NY
BAUSCH & LOMB ER-ARM:
ER-Arm

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
964
Bausch & Lomb  

Bausch & Lomb  

MicroZoomII 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1 4,000.00 Scotia, NY
BAUSCH & LOMB MICROSCOPE WORK STATION:
Microscope Work Station

Long working distance objectives

 

146
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

248
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 10X - 70X:
Stereo Zoom Microscope with Camera
3264
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 1 

List all items of this typeStereo Microscopes

in Optical Microscopes

13 225.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:
Stereo Zoom Microscope

Microscopes listed are for pod and eyepieces only

 

110365
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 2 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 350.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 2X:
Stereo Zoom Microscope

 



Microscopes listed are for pod and eyepieces only

 

145
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

7   Scotia, New York
BAUSCH & LOMB STEREO MICROSCOPE 7X - 30X:
Stereo Zoom Microscope

Pod color may vary
Microscopes listed are for pod and eyepieces only

 

1800
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 5 

List all items of this typeStereo Microscopes

in Optical Microscopes

1 600.00 Scotia, NY
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:
Stereo Zoom Microscope

Scopes listed include pod and eyepieces only

 

159266
Bausch & Lomb  

Bausch & Lomb  

SZ4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb Stereo Zoom 4:
StereoZoom 4 Microscope with Boom Stand
161016
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 4 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 4:
Microscope on Small Base
161018
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 6 Plus 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
Bausch & Lomb StereoZoom 6 Plus:
Microscope Head
159267
Bausch & Lomb  

Bausch & Lomb  

SZ 6-ST 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   Plano, TX
Bausch & Lomb StereoZoom 6-ST:
StereoZoom Microscope with Boom Stand
157435
Bausch & Lomb  

Bausch & Lomb  

StereoZoom 7 

List all items of this typeStereo Microscopes

in Optical Microscopes

1   F* Plano, TX
BAUSCH & LOMB StereoZoom 7:
Microscope & Boom Stand
110364
Bausch & Lomb  

Bausch & Lomb  

Type K 

List all items of this typeStands

in Parts and Accessories, Microscope

1 235.00 Scotia, NY
BAUSCH & LOMB TYPE K STAND:
K Stand for B&L StereoZoom Microscopes

Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
E-Arm not included
109598
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

4 300.00 Scotia, NY
BOOM STAND:
Table Clamp Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109648
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109553
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109554
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 325.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109425
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

6 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rectangular Horizontal Post

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109427
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Dual Arm Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109549
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
BOOM STAND:
Microscope Boom Stand w/ Rotatable Knuckle

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
109122
BOOM STAND 
BOOM STAND 

List all items of this typeStands

in Parts and Accessories, Microscope

19 350.00 F* Scotia, NY
BOOM STAND:
Microscope Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
185800
Buehler  

Buehler  

SimpliMet 1000 

List all items of this typeMounting Press

in Sample Preparation

1 4,950.00 F* Scotia, NY
BUEHLER AUTOMATIC MOUNTING PRESS 1" TO 2" CAPACITY:
Automatic Mounting Press
23007
Buehler  

Buehler  

Carbimet Paper Discs 

List all items of this typeSample Preparation - Other

in Sample Preparation

2 50.00 F* Scotia, NY
BUEHLER CARBIMET 320 GRIT PAPER DISCS:
Paper Discs 320 Grit

Buehler part number: 30-5108-320-100
4436
Buehler  

Buehler  

Consumables 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

4   Scotia, NY
BUEHLER CONSUMABLES, POLISHING AND GRINDING:
Polishing and Grinding Consumables
122523
Buehler  

Buehler  

Dressing Chuck 

List all items of this typeCut-Off Saws

in Surface Processing Equipment

2 185.00 F* Scotia, NY
BUEHLER ISOMET DRESSING CHUCK:
Dressing Chuck

142877
Buehler  

Buehler  

ISOMET 

List all items of this typeCut-Off Saws

in Surface Processing Equipment

4 3,350.00 F* Scotia, New York
BUEHLER LOW SPEED CUT-OFF SAW:
Precision Sectioning Saw

Representative photo - color of saw may vary

Various ISOMET chucks available. 
See other information for more details.
116574
Buehler  

Buehler  

Primet 

List all items of this typeSample Preparation - Other

in Sample Preparation

1 650.00 F* Scotia, NY
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:
Modular Dispensing Satellite

147703
Buehler  

Buehler  

48-1573GGG-R 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1 3,850.00 F* Scotia, NY
BUEHLER THREE POSITION POLISHING BENCH :
Three Position Polishing Bench

178410
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   Taichung, Taichung City
Buehler, Ecomet-3000 Polisher, 300mm:
Status: Bagged and Skidded
178407
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, Ecomet-3000 300mm:
Status: Bagged and Skidded
178409
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, 300mm:
Status: Bagged and Skidded
173380
Coborn  

Coborn  

PS1 (PS-1) 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

2   F* Leominster, Massachusetts
Coborn Planetary Skive Bench for Diamond Faceting & Polishing:

Coborn Planetary Skive (Scaif) Bench for Faceting and Polishing single-crystal diamond (SCD).  Equipped with 24x36 inch table, 3-phase fixed speed spindle, and an additional planetary motion functionality.

  • Engineered to polish and/or finish single-crystal diamond (SCD) materials including cutting tools, gemstones, and substrates for scientific research.
  • Planetary motion can improve diamond removal rates, polished surface finish, and/or edge quality especially on difficult-to-polish SCD (CVD, HPHT, or Natural).  The relative motion of the wheel and SCD workpiece also minimizes uneven wear of "tracks" in the ferrous skive wheel/plate.
  • The system design offered can be operated with or without planetary motion.
  • Refurbishment includes a new charcoal gray laminated top applied to a thick steel tabletop. 
  • Goods to be sold in tested, refurbished condition with a limited warranty to ensure functionality. 
  • PHOTO NOTE: The unit shown in the attached images has been sold.  However, refurbishment of 2 similar systems is nearing completion as of 8/2/2017.  Photos of actual unit offered can be provide prior to sale.
165713
Coborn  

Coborn  

SK-KKAS  

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Sterling, Massachusetts
Coborn SK-KKAS Skive Spindle (1.5kW):
  • Coborn SK-KKAS Scaif (Skive) Spindle with advanced functionality.
  • For Polishing & Faceting Single Crystal Diamond: Natural and Lab-Made
    • Height-Adjustable Nose (Z position of spindle nose).
    • Includes Coborn Airflow Bowl option (for dust collection below spindle).
    • Includes Coborn Expanding Nose option (replaceable "collet").
    • Wired to enable variable spindle speed.
  • This 3-Phase spindle was previously tested at Cline Innovations using a sturdy skive bench (not included/available) equipped with a variable speed drive.
  • Skive bench is NOT included with this listing.
  • If you prefer to purchase a complete, operational planetary scaife bench, please see Cline Innovations' listing 173380 .
7353
CPS  

CPS  

6004/1958 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1 3,750.00 Scotia, NY
CPS ELECTRON GUN POWER SUPPLY 30KV:
Electron Gun Power Supply

CPS Computer Power Supply 6004
28680
Dage-MTI  

Dage-MTI  

SERIES 68 

List all items of this typeCameras and Controllers

in Optical Microscopes

2 1,200.00 Scotia, NY
DAGE-MTI SERIES 68 INFRARED CAMERA:
Infrared Camera
57426
Denton  

Denton  

DESK II 

List all items of this typeSample Coaters

in Sample Preparation

1 6,250.00 F* Scotia, New York
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :
Metal Sputter

159268
Diagnostic Instrumts  

Diagnostic Instrumts  

 

List all items of this typeStereo Microscopes

in Optical Microscopes

2   Plano, TX
Diagnostic Instruments:
Microscope Boom Stand
86452
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-B 

List all items of this typeStands

in Parts and Accessories, Microscope

1 325.00 F* Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Boom Stand
109548
Diagnostic Instrumts  

Diagnostic Instrumts  

SMS16-A 

List all items of this typeStands

in Parts and Accessories, Microscope

2 350.00 Scotia, NY
DIAGNOSTIC INSTRUMENTS BOOM STAND:
Weighted Base Boom Stand

Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes

Available only with purchase of a Stereozoom Microscope
E-arm not included

43778
Diagnostic In  

Diagnostic In  

SMS20 

List all items of this typeStands

in Parts and Accessories, Microscope

1 1,075.00 Scotia, NY
DIAGNOSTIC INSTRUMENTS SMS20:
Boom Stand

Stands can be fitted for B&L Stereo Zoom Microscopes, Leica Stereozoom Microscopes and Nikon Stereo Zoom Microscopes
Available only with purchase of a Stereozoom Microscope
E-arm not included
18711
Dolan Jenner  

Dolan Jenner  

180 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 150.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source
122729
Dolan Jenner  

Dolan Jenner  

PL-750A- 111 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 225.00 F* Scotia, NY
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:
Fiber Optic Light Source

4499
Edwards  

Edwards  

S150 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, New York
EDWARDS CARBON EVAPORATION SOURCE:
Carbon Evaporation Source
181557
FEI  

FEI  

200XP TMP 

List all items of this typeFocused Ion Beam Tools

in Electron Microscopy

1   F* Scotia, New York
FEI FOCUSED ION BEAM SYSTEM:
Focus Ion Beam System

The FEI 200xP FIB is a proven work horse in the industry.   This versatile system is capable of 7nm image resolution.
191756
FEI  

FEI  

T30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F*N* East Fishkill, New York
FEI T30, TEM, with LaB6 filament operating at 300KeV:
FEI T30, TEM, with LaB6 filament operating at 300KeV

Cold idle in Lab.

2010 

S/N: 30TN6S / D906


191594
FEI  

FEI  

Tecnial TF-20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Burlington, Vermont
FEI Tecnai F20 FE-TEM, :
FEI Tecnai F20 FE-TEM, 

S/N: D241

Main Instrument:  Tecnai F20 S-Twin 
 
FEI Accessories
 
STEM system for FEG
Tecnai Extended Workstation
HAADF Detector
TIA Software
Scanned Image Technique
EDX Spectroscopy Technique
EFTEM Technique
Tecnai Function with Digital Micrograph
EFTEM EELS Module
Tecnai Macro Facility
Compustage Rotation Holder
Compustage Low Background Double-Tilt Holder
Hingeable Mount, Binoculars
Tecnai Smart Tilt
Tecnai Compucentricity
 
Third-Party Accessories
 
NEC 20-inch LCD Monitor
EDAX Digital Pulse Processor, TEM
Gatan 794 MSC Camera, 1K (BROKEN)
Energy Filter, GIF 2001, Grade A, 1K (BROKEN)
Tecnai K Space Control
EDAX RTEM SUTW Detector
Gatan Single Tilt Rotation Holder, Low Background
Gatan Double Tilt Rotation Holder
 
Also, the Compustage has been upgraded to the newer Tecnai Osiris type.
134541
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, NY
FIBER OPTIC LIGHT SOURCE:
Remote Fiber Optic Illuminator

Model FOI-150-Remote
134624
FIBER OPTIC LIGHT SOURCE 
FIBER OPTIC LIGHT SOURCE 

List all items of this typeFiber Optic Light Sources

in Fiber Optic Illuminators

1 180.00 F* Scotia, NY
FIBER OPTIC LIGHT SOURCE:
Fiber Optic Illuminator

Manufacturer Unknown
175864
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, NY
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS)

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

176740
Gatan  

Gatan  

691 PIPS 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Scotia, NY
GATAN 691 PRECISION ION POLISHING SYSTEM PIPS:

Precision Ion Polishing System (PIPS).

Includes Gatan Binocular Microscope

The Gatan 691 is a completely self-contained, compact, bench-top precision ion polishing system designed to
produce high quality TEM specimens having exceptionally large, clean, electron transparent areas.

175315
Gatan  

Gatan  

681 

List all items of this typeSample Coaters

in Sample Preparation

1   F* Scotia, NY
GATAN ION BEAM COATER (IBC):
Ion Beam Coater

Ion Beam Coater (IBC) designed to produce high-quality conductive coatings on

SEM or TEM specimens
100557
Hitachi  

Hitachi  

S-2400 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Micrscope (SEM)
60831
Hitachi  

Hitachi  

S-4100 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:
Field Emission Electron Microscope

NB: System is missing Ion pump power supply. Sold "As Is".
35762
Hitachi  

Hitachi  

S-7000 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Plano, TX
Hitachi S-7000:
CD SEM Measurement Tool
324
Hitachi  

Hitachi  

S-806C 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Scotia, NY
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:
Field Emission Scanning Electron Microscope
178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

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1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

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1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




178297
Hitachi  

Hitachi  

RS4000 

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1   Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
178710
Hitachi  

Hitachi  

RS4000 

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1   Taichung, Taichung City
191596
Hitachi  

Hitachi  

S-4500 

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1   N* Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM:
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


191493
Hitachi  

Hitachi  

S-5000 

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1   N* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

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1   F*N* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

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1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
178299
Hitachi  

Hitachi  

Z-5700 

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1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
189211
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

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in Microscopes

1   F* Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection:
HMI, eScan 320, 300mm, ebeam Inspection
eScan 320 eBeam defect inspection and review system
Integrated front-end, Dual Pod 300mm FOUP 
2- High quality flat panel displays
GUI/Image computer XEON Dual CPU 3.2GHZ, 2GB Memory
Host computer Pentium IV 3.2 GHZ, 2GB Memory
DBDB (Detection, baseon Design Base) function
E-chuck wafer holder
Active Damping
TFE electron beam emission source sub-system
Electron=optice column sub-system
HV power sub-system
Programmable wafer biasing & charge balance control.
SE and BSE high speed detection 







Tool is still in the fab.
181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Dresden, SN
HSEB Axiospect 300, 300mm Wafer inspection microscope:
HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182
54074
Irvine Optical  

Irvine Optical  

UltraSpec III 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical UltraSpec III:
Wafer Inspection Station
136281
Irvine Optical Co.  

Irvine Optical Co.  

UltraSpec III 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical UltraSpec III Wafer Inspection Station:
Irvine Optical UltraSpec III Wafer Inspection Station
131723
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3 

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1   Plano, TX
IRVINE OPTICAL Ultrastation 3:
Macro Inspection Tool
184441
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

1   Plano, TX
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • Automatic Wafer Loading for up to 200mm Wafers
  • LED Display and Extended Control Keyboard
  • Nikon CF Plan Optics; 5X, 10X, 20X, 50X & 150X B/Dfield Objectives
  • Differential Interference Contrast 
  • Ergonomic Trinocular Head with CFWN 10X/20 Eyepieces
  • Motic Moticam 1000 USB Camera
  • Nikon LHS-H100P-1 Lamphouse
  • 12V 100W Halogen Lamp
184442
Irvine Optical Co.  

Irvine Optical Co.  

Ultrastation 3.E 

List all items of this typeAutomatic Wafer Inspection Tools

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1   Plano, TX
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope:
Irvine Optical Ultrastation 3.E Automatic Wafer Inspection Microscope
  • Automatic Wafer Loading for up to 200mm Wafers
  • LED Display and Standard Control Keyboard
  • Motorized Turret with Nikon BD Plan Optics
    • 5X, 10X, 40X & 100X B/Dfield Objectives
  • Ergonomic Trinocular Head with UW 10X/25 Eyepieces
  • Nikon Lamphouse with 12V 100W Halogen Lamp
6402
JEOL  

JEOL  

JSM 6100 

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1   F* Scotia, NY
JEOL JSM 6100 SCANNING ELECTRON MICROSCOPE:
Scanning Electron Microscope with LaB Filament
77955
JEOL  

JEOL  

JWS-7505ZH 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Plano, TX
Jeol JWS-7505ZH:
Critical Dimension Scanning Electron Microscope
178300
JEOL  

JEOL  

7555 

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1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Cold Shutdown
178302
JEOL  

JEOL  

JEM-2500SE 

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1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

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1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

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1   Singapore,
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

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1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
332
Karl Storz  

Karl Storz  

483C 

List all items of this typeParts and Accessories - Other

in Parts and Accessories, Microscope

1 350.00 Scotia, NY
KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE :
Twin Fiber Optic Light Source

Light guide not included.
178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

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in Optical Microscopes

1   F* Singapore,
KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
178304
KLA-Tencor  

KLA-Tencor  

ES31 

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1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

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1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded
188890
KLA-Tencor  

KLA-Tencor  

eS810 

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1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

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1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

178327
KLA-Tencor  

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
KLA-Tencor, INS3300 , Microscopes, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
189332
KLA-Tencor  

KLA-Tencor  

 

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1   Burlington, Vermont
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm:
KLA-Tencor, Ultrapointe CRS 1010-S

Serial Number: 20


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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Microscope Inspection Tools:
American Optical, Anatech Ltd, Applied Materials, Inc., ATM GmbH, BAL-TEC, Bausch & Lomb, Inc, Buehler, Coborn, CPS, Dage-MTI, Denton, Diagnostic Instruments, Dolan Jenner, Edwards, FEI, Fostec, Gatan, Hitachi, HSEB, Irvine Optical Company, JEOL, Karl Storz, KLA-Tencor, Leco, Leica, Leica, Leitz, MASS-PCB, Melles Griot, Microspec, Mitutoyo, Nikon, Nikon, Olympus, Prior Scientific, Reichert Inc, Reichert-Jung, RK Print Coat Instruments, Schott Fostec, SELA, Semicaps, Semprex, South Bay Technology, Strasbaugh, Suss MicroTec, Vision Engineering, Volpi, Wild, Zeiss