 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
256471
|
Accretech
|
Accretech |
UF3000 |
in Wafer Probers
ACCRETCH UF3000 Prober:Prober modal | UF3000 | Manipulator | Yes (For Advantest T5376 test head) | Type of tester head plate | Advantest T5376 | Prober power supply rate | 240V | Chuck Type (Nickel, Gold, etc.) | Nickel type | Chuck Temperature support | Room temp until 150 C | Air Cool for chuck | No | Auto Probe Card (APC) Changer | Yes | Network / Connection | Yes | Prober System Version | 3S14C0E1 | Cleaning pad module | Yes |
|
1
|
|
|
N* |
Bayan Lepas, Penang |
|
 |
52704
|
Alessi
|
Alessi |
MS1-44 |
in Manual Probers
ALESSI CASCADE MICROTECH PROGRAMMABLE MICROPOSITIONER :Programmable Micropositioner
Alessi acquired by Cascade Microtech
|
3
|
|
|
 |
Scotia, New York |
|
 |
134517
|
Alessi
|
Alessi |
Micropositioner Mount |
in Manual Probers
ALESSI MICROPOSITIONER MOUNT:One Axis Micropositioner Mount
|
2
|
|
300.08 |
 |
Scotia, New York |
|
 |
185531
|
Alessi
|
Alessi |
REL |
in Manual Probers
ALESSI REL MANUAL PROBE STATION 4 INCH:Manual Probe Station
|
1
|
|
|
F* |
Scotia, New York |
|
 |
4949
|
Alessi
|
Alessi |
REL-4500 |
in Manual Probers
Alessi REL-4500:Analytical Wafer Prober
Semi-Automatic Probing System
|
1
|
|
|
F* |
Plano, TX |
|
 |
83301
|
Cascade Microtech
|
Cascade Microtech |
ACP65-L-GSG-150 |
in Manual Probers
CASCADE MICROTECH AIR COPLANAR PROBE:Air Coplanar Probe
|
6
|
|
650.17 |
 |
Scotia, New York |
|
 |
177877
|
Cascade Microtech
|
Cascade Microtech |
REL-3200 |
in Manual Probers
CASCADE MICROTECH ANALYTICAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
231327
|
Cascade Microtech
|
Cascade Microtech |
M150 |
in Manual Probers
CASCADE MICROTECH FORMFACTOR 6" MANUAL PROBE STATION:Manual Probe Station
|
1
|
|
|
 |
Scotia, New York |
|
 |
191774
|
Cascade Microtech
|
Cascade Microtech |
MH2-B |
in Manual Probers
CASCADE MICROTECH HIGH RESOLUTION MICROPOSITIONER:High Resolution Micropositioner
|
1
|
|
995.27 |
 |
Scotia, New York |
|
 |
191772
|
Cascade Microtech
|
Cascade Microtech |
DCM-100 |
in Manual Probers
CASCADE MICROTECH THREE AXIS MICROPOSITIONER, MAGNETIC BASE, LEFT HAND:Micropositioner
|
1
|
|
|
 |
Scotia, New York |
|
 |
51074
|
Creative Devices
|
Creative Devices |
CD-IL-VM |
in Manual Probers
CREATIVE DEVICES 3-AXIS MICROPOSITIONER, VACUUM BASE:In-Line Vacuum Based 3-Axis Micropositioner
|
3
|
|
915.25 |
 |
Scotia, New York |
|
 |
172739
|
Electroglas
|
Electroglas |
405 |
in Manual Probers
ELECTROGLAS MICROPOSITIONER:3 Axis - Micropositioner
|
2
|
|
1,500.40 |
F* |
Scotia, New York |
|
 |
191761
|
GGB Industries Inc.
|
GGB Industries Inc. |
10 Microwave Probe Body |
in Wafer Probers
GGB IINDUSTRIES PICOPROBE MICROWAVE PROBE - HIGH PERFORMANCE :High Performance Microwave Probe Body New in The Box
|
3
|
|
|
 |
Scotia, New York |
|
 |
182970
|
GGB Industries Inc.
|
GGB Industries Inc. |
12C |
in Manual Probers
GGB INDUSTRIES INC. PICOPROBE HIGH IMPEDANCE ACTIVE PROBE:High Impedance Active Probes
|
1
|
|
650.17 |
 |
Scotia, New York |
|
 |
182971
|
GGB Industries Inc.
|
GGB Industries Inc. |
12C |
in Manual Probers
GGB INDUSTRIES INC. PICOPROBE HIGH IMPEDANCE ACTIVE PROBE:High Impedance Active Probes
|
1
|
|
650.17 |
 |
Scotia, New York |
|
 |
191762
|
GGB Industries Inc.
|
GGB Industries Inc. |
10 Microwave Probe Body |
in Wafer Probers
GGB INDUSTRIES PICOPROBE MICROWAVE PROBE - HIGH PERFORMANCE :High Performance Microwave Probe Body
|
6
|
|
|
 |
Scotia, New York |
|
 |
253002
|
Delta Design
|
Delta Design |
MATRIX DM8880 |
in Device Handlers
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
252923
|
Multitest
|
Multitest |
MT8589 |
in Device Handlers
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
252922
|
Multitest
|
Multitest |
MT8589 |
in Device Handlers
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
252926
|
Rasco
|
Rasco |
SO1000T |
in Device Handlers
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
252925
|
Rasco
|
Rasco |
SO1800T |
in Device Handlers
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
252924
|
Rasco
|
Rasco |
SO1800T |
in Device Handlers
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
189080
|
Karl Suss
|
Karl Suss |
PM5 Type: 0577065 |
in Manual Probers
KARL SUSS ANALYTICAL MANUAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
81577
|
Karl Suss
|
Karl Suss |
PM5 |
in Manual Probers
KARL SUSS ANALYTICAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
126644
|
Karl Suss
|
Karl Suss |
SOM4 |
in Manual Probers
KARL SUSS MANUAL PROBE STATION:Analytical Wafer Prober
|
1
|
|
|
 |
Scotia, New York |
|
 |
183548
|
Karl Suss
|
Karl Suss |
PH150 |
in Manual Probers
KARL SUSS MICROPOSITIONER:Micropositioner with Fine Screw Adjustments
|
1
|
|
1,500.40 |
|
Scotia, New York |
|
 |
173964
|
Karl Suss
|
Karl Suss |
PH150 |
in Manual Probers
KARL SUSS MICROPOSITIONER:Micropositioner with Fine Screw Adjustment
|
1
|
|
1,500.40 |
 |
Scotia, New York |
|
 |
182967
|
Karl Suss
|
Karl Suss |
PH150 |
in Manual Probers
KARL SUSS MICROPOSITIONER:Micropositioner
|
1
|
|
1,550.42 |
 |
Scotia, New York |
|
 |
120673
|
LIGHT TIGHT PROBER ENCLOSURE
|
LIGHT TIGHT PROBER ENCLOSURE |
in Wafer Probers
LIGHT TIGHT PROBER ENCLOSURE:Stainless Steel Prober Enclosure
Manufacturer unknown
|
1
|
|
2,250.60 |
F* |
Scotia, New York |
|
 |
177875
|
MC System Inc.
|
MC System Inc. |
Slimline 4440 |
in Manual Probers
MC SYSTEM MICROPOSITIONER MAGNETIC BASE:Micropositioner
|
3
|
|
650.17 |
 |
Scotia, New York |
|
 |
136753
|
Micromanipulator
|
Micromanipulator |
6000 |
in Manual Probers
MICROMANIPULATOR ANALYTICAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
 |
Scotia, New York |
|
 |
3962
|
Micromanipulator
|
Micromanipulator |
2230 |
in Wafer Probers
MICROMANIPULATOR ELECTROMIGRATION TEST STATION:Electromigration Test Station
Unit Is Mounted On An Active Isolation Table
|
1
|
|
|
 |
Scotia, New York |
|
 |
107022
|
Micromanipulator
|
Micromanipulator |
450 |
in Manual Probers
MICROMANIPULATOR MICROPOSITIONER, VACUUM BASE:Micropositioner
|
1
|
|
790.21 |
 |
Scotia, New York |
|
 |
64436
|
Micromanipulator
|
Micromanipulator |
80-RECT-8000 |
in Manual Probers
MICROMANIPULATOR PROBE HEAD HOLDER:Probe Head Holder
|
2
|
|
135.04 |
 |
Scotia, New York |
|
 |
177879
|
Micromanipulator
|
Micromanipulator |
8060-N6 |
in Manual Probers
MICROMANIPULATOR SEMI-AUTOMATIC PROBER:Semi Automatic Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
45437
|
Micromanipulator
|
Micromanipulator |
6640 |
in Manual Probers
MICROMANIPULATOR SEMI-AUTOMATIC PROBER :Semi Automatic Prober
|
1
|
|
|
 |
Scotia, New York |
|
 |
132030
|
Mosaid
|
Mosaid |
MS4155 |
in Device Testers
MOSAID MS4155:Memory Test System
|
1
|
|
|
F* |
Plano, TX |
|
 |
162067
|
Mystic River
|
Mystic River |
Station 1.0 |
in Manual Probers
MYSTIC RIVER SOLAR CELL PROBE STATION:Solar Cell Probe Station
|
1
|
|
|
 |
Scotia, New York |
|
 |
256501
|
Advantest
|
Advantest |
T5376 Memory Tester |
in Device Testers
Penang Advantest T5376 Memory Tester (Wafer Level Sorting):Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN109 MF Date: APR, 2004 Location: KGD Penang Asset Number : ZNPG-103864-0
|
1
|
|
|
N* |
George Town, Penang |
|
 |
256546
|
Advantest
|
Advantest |
T5376 Memory Tester |
in Device Testers
Penang Advantest T5376 Memory Tester (Wafer Level Sorting):Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN129 MF Date: Aug, 2004 Location: KGD Penang Asset Number : ZNPG-101412-0
|
1
|
|
|
N* |
George Town, Penang |
|
 |
256548
|
Advantest
|
Advantest |
T5376 Memory Tester |
in Device Testers
Penang Advantest T5376 Memory Tester (Wafer Level Sorting):Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN130 MF Date: Aug, 2004 Location: KGD Penang Asset Number : ZNPG-101413-0
|
1
|
|
|
N* |
George Town, Penang |
|
 |
64223
|
Rucker & Kolls
|
Rucker & Kolls |
360 |
in Manual Probers
RUCKER & KOLLS EDGE SENSOR:Edge Sensor
|
1
|
|
375.10 |
 |
Scotia, New York |
|
 |
62742
|
Rucker & Kolls
|
Rucker & Kolls |
329-1 |
in Manual Probers
RUCKER & KOLLS MICROPOSITIONER WITH INKER:Micropositioner w/Inker
|
1
|
|
680.18 |
 |
Scotia, New York |
|
 |
254225
|
SemiProbe
|
SemiProbe |
PS4L SA12 |
in Wafer Probers
SEMI PROBE PS4L SA12, 300mm, s/n: F081X5002462000:SEMIPROBE PS4L Maintool / TIS2301-T MENV UPGR - BENCH VERIFICATION SEMIPROBE STATION
|
1
|
|
|
 |
Malta, New York |
|
 |
88344
|
Signatone
|
Signatone |
S 463-E |
in Manual Probers
SIGNATONE ANALYTICAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
150560
|
Signatone
|
Signatone |
S-930 |
in Manual Probers
SIGNATONE MICROPOSITIONER, VACUUM BASE:Micropositioner
|
1
|
|
650.17 |
 |
Scotia, New York |
|
 |
218536
|
Signatone
|
Signatone |
S-926 PLV |
in Manual Probers
SIGNATONE PRECISION THREE AXIS MICROPOSITIONER:3 Axis Micropositioner - Left Hand, Pivot Head, Vacuum Base
|
1
|
|
850.23 |
 |
Scotia, New York |
|
 |
218535
|
Signatone
|
Signatone |
S-926 PRV |
in Manual Probers
SIGNATONE PRECISION THREE AXIS MICROPOSITIONER RIGHT HAND:3 Axis Micropositioner - Right Hand, Pivot Head, Vacuum Base
|
1
|
|
850.23 |
 |
Scotia, New York |
|
 |
81260
|
Signatone
|
Signatone |
S-465 |
in Manual Probers
SIGNATONE SEMI AUTOMATIC PROBE STATION:Semi Automatic Probe Station
|
1
|
|
|
F* |
Scotia, New York |
|
 |
178662
|
Signatone
|
Signatone |
S-250-6 |
in Manual Probers
SIGNATONE SUB-MICRON ANALYTICAL PROBE STATION:Analytical Wafer Prober
|
1
|
|
|
 |
Scotia, New York |
|
 |
126654
|
Signatone
|
Signatone |
S-250-5 |
in Manual Probers
SIGNATONE SUB-MICRON ANALYTICAL PROBE STATION:Analytical Wafer Prober
|
1
|
|
|
 |
Scotia, New York |
|
 |
257237
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257244
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257240
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257241
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257242
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257249
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257238
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257247
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
254080
|
Tel
|
Tel |
P12XL |
in Wafer Probers
TEL P12XL, 300mm, s/n: PH01610:TEL P12XL Prober dual foup VIP3
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
257246
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257239
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257245
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257248
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
257243
|
Tel
|
Tel |
P12XL |
in Wafer Probers
|
1
|
|
|
N* |
Burlington, Vermont |
|
 |
254124
|
Tel
|
Tel |
P8 |
in Wafer Probers
|
1
|
|
|
 |
Singapore |
|
 |
254122
|
Tel
|
Tel |
P8 |
in Wafer Probers
|
1
|
|
|
 |
Singapore |
|
 |
254123
|
Tel
|
Tel |
P8 |
in Wafer Probers
|
1
|
|
|
 |
Singapore |
|
 |
254121
|
Tel
|
Tel |
P8 |
in Wafer Probers
|
1
|
|
|
 |
Singapore |
|
 |
254230
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254227
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254228
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254229
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254231
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254234
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254232
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254233
|
Tel
|
Tel |
P8XL |
in Wafer Probers
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
250826
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
Precio |
in Wafer Probers
TEL Precio Wafer Prober:TEL Precio Wafer Prober - Tri-Temp with Chiller
- Dual FOUP Handlers
- Please Inquire for Additional Details
|
1
|
|
|
 |
Austin, Texas |
|
 |
251870
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
Precio |
in Wafer Probers
TEL Precio Wafer Prober:TEL Precio Wafer Prober - Tri-Temp with Chiller
- Dual FOUP Handlers
- Please Inquire for Additional Details
|
1
|
|
|
 |
Austin, Texas |
|
 |
254373
|
Tel
|
Tel |
Precio |
in Wafer Probers
|
1
|
|
|
 |
Malta, New York |
|
 |
254244
|
Tel
|
Tel |
Precio |
in Wafer Probers
|
1
|
|
|
 |
Malta, New York |
|
 |
226733
|
Tel
|
Tel |
CR385PH |
in Automatic Test Equipment
TEL, CR385PH, S/N 067004:TEL, CR385PH, S/N 067004
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
226738
|
Tel
|
Tel |
LTI unit |
in Automatic Test Equipment
TEL, LTI unit, S/N 12007:TEL, LTI unit, S/N 12007
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
242652
|
Tel
|
Tel |
P12XL Prober |
in Wafer Probers
TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A:TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
242878
|
Tel
|
Tel |
P12XLn |
in Wafer Probers
TEL, P12XLn, 300mm, S/N PN00453:TEL, P12XLn, 300mm, S/N PN00453
|
1
|
|
|
 |
Singapore |
|
 |
250002
|
Tel
|
Tel |
P12XLn |
in Wafer Probers
|
1
|
|
|
 |
Dresden, Saxony |
|
 |
250003
|
Tel
|
Tel |
P12XLn |
in Wafer Probers
|
1
|
|
|
 |
Singapore |
|
 |
236302
|
Teradyne
|
Teradyne |
Catalyst Mixed Signal |
in Device Testers
Teradyne Catalyst:TESTER ID : CAT-004 Model : CATALYST MIXED SIGNAL Manufacturer : Teradyne Serial No. : 0027H256 Date Released : 15/09/00 COMPUTER HW/SW: Tester Computer : Suns ULTRA60 / 256 MB RAM User Computer : Suns ULTRA5 / 256 MB RAM HD : 8.5 GB Software : Solaris –OS rev. 5.5.1 IMAGE Rev. : 7.0 D8 Tester DIG: Data rate : 200 MHZ DP CH : 256 CH Tester DC: DC SRC Matrix : 4 CH DC DUT SRC : 8 CH AAPU PIN : 48 CH STORED DATA BITS : 48 CH System PPMU : 1 CH TESTER AC: PLFS/PLFD : 4CH VHF AWG400 : 1CH VHF DIG : 2CH PAC Card Cage : 3 VREG : 2 CH DOCKING/MANIPULATOR: Docking : SNR DOCKING Manipulator : UNIVERSAL Manipulator Input Power: Power Supply : 380 VAC, / 48 Amp 50/60Hz, 3 phase Power Consumption Rate : 31.6 KVA (Max)
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
249730
|
Teradyne
|
Teradyne |
J750 |
in Device Testers
Teradyne J750:Teradyne J750 Testequipment
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
249731
|
Teradyne
|
Teradyne |
J750 |
in Device Testers
Teradyne J750:Teradyne J750 Testequipment
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
249732
|
Teradyne J750
|
Teradyne J750 |
in Device Testers
Teradyne J750:Teradyne J750 Tester
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
254116
|
FET/TEST,INC MADE IN
|
FET/TEST,INC MADE IN |
FET 3602E |
in Device Testers
|
1
|
|
|
|
Regensburg, Bavaria |
|
 |
90229
|
TNP Instruments
|
TNP Instruments |
LCD1212 |
in Manual Probers
TNP INSTRUMENTS MANUAL PROBE STATION:Manual Probe Station
|
1
|
|
|
 |
Scotia, New York |
|
 |
172740
|
Ultracision
|
Ultracision |
405 |
in Manual Probers
ULTRACISION MICROPOSITIONER:3 Axis - Micropositioner
|
3
|
|
1,500.40 |
 |
Scotia, New York |
|
 |
156783
|
Wentworth Labs
|
Wentworth Labs |
MP0901 |
in Manual Probers
WENTWORTH ANALYTICAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
6,001.61 |
 |
Scotia, New York |
|
 |
33201
|
Wentworth Labs
|
Wentworth Labs |
AWP 1050 ATC |
in Wafer Probers
WENTWORTH AUTOMATIC WAFER PROBER 6 INCH:Automatic Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
99479
|
Wentworth Labs
|
Wentworth Labs |
HOP 2000 |
in Manual Probers
Wentworth Labs HOP 2000:Micropositioner - Hands Off Probe Positioner
|
2
|
|
|
 |
Plano, TX |
|
 |
62741
|
Xandex
|
Xandex |
320-0010 |
in Manual Probers
XANDEX XYZ MICROPOSITIONER, MAGNETIC BASE WITH INKER:Micropositioner with Inker
|
1
|
|
685.18 |
 |
Scotia, New York |
|
 |
3854
|
XYZ PROBE
|
XYZ PROBE |
in Manual Probers
XYZ PROBE:X, Y, Z Probe with Magnetic Base
|
1
|
|
650.17 |
 |
Scotia, New York |
|