 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
111048
|
American Optical
|
American Optical |
1177-1 |
in Fiber Optic Illuminators
AMERICAN OPTICAL FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
2
|
|
195.05 |
 |
Scotia, New York |
|
 |
171583
|
Anatech Ltd
|
Anatech Ltd |
Hummer 6.6T |
in Sample Preparation
ANATECH HUMMER 6.6T SPUTTER SYSTEM:Sputter System
|
1
|
|
|
F* |
Scotia, New York |
|
 |
184614
|
ATM GmbH
|
ATM GmbH |
Brillant BR250.2 |
in Surface Processing Equipment
ATM GmbH CUT OFF SAW 12" :Cut-Off Saw
|
1
|
|
|
F* |
Scotia, New York |
|
 |
1786
|
Bausch & Lomb
|
Bausch & Lomb |
Type A |
in Parts and Accessories, Microscope
BAUSCH & LOMB 31-26-88 TYPE A INCIDENT LIGHT STAND:Type A Incident Light Stand
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
|
12
|
|
|
 |
Scotia, New York |
|
 |
1785
|
Bausch & Lomb
|
Bausch & Lomb |
312690 |
in Parts and Accessories, Microscope
BAUSCH & LOMB ER-ARM:ER-Arm
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope
|
10
|
|
180.05 |
F* |
Scotia, New York |
|
 |
208308
|
Bausch & Lomb
|
Bausch & Lomb |
MicroZoom |
in Optical Microscopes
BAUSCH & LOMB INDUSTRIAL MICROSCOPE INCIDENT LIGHT:Industrial microscope with long working distance objectives.
|
1
|
|
|
F* |
Scotia, New York |
|
 |
964
|
Bausch & Lomb
|
Bausch & Lomb |
MicroZoomII |
in Optical Microscopes
BAUSCH & LOMB MICROSCOPE WORK STATION:Microscope Work Station
Long working distance objectives
|
1
|
|
|
 |
Scotia, New York |
|
 |
3264
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 1 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 1X - 10X:Stereo Zoom Microscope
Microscopes listed are for pod and eyepieces only
|
13
|
|
225.06 |
 |
Scotia, New York |
|
 |
110365
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 2 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 2X:Stereo Zoom Microscope
Microscopes listed are for pod and eyepieces only
|
1
|
|
350.09 |
 |
Scotia, New York |
|
 |
1800
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 5 |
in Optical Microscopes
BAUSCH & LOMB STEREO MICROSCOPE 8X - 40X:Stereo Zoom Microscope
Scopes listed include pod and eyepieces only
|
1
|
|
600.16 |
 |
Scotia, New York |
|
 |
159266
|
Bausch & Lomb
|
Bausch & Lomb |
SZ4 |
in Optical Microscopes
Bausch & Lomb Stereo Zoom 4:StereoZoom 4 Microscope with Boom Stand
|
1
|
|
|
F* |
Plano, TX |
|
 |
161016
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 4 |
in Optical Microscopes
Bausch & Lomb StereoZoom 4:Microscope on Small Base
|
1
|
|
|
 |
Plano, TX |
|
 |
161018
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 6 Plus |
in Optical Microscopes
Bausch & Lomb StereoZoom 6 Plus:Microscope Head
|
1
|
|
|
F* |
Plano, TX |
|
 |
159267
|
Bausch & Lomb
|
Bausch & Lomb |
SZ 6-ST |
in Optical Microscopes
Bausch & Lomb StereoZoom 6-ST:StereoZoom Microscope with Boom Stand
|
1
|
|
|
 |
Plano, TX |
|
 |
157435
|
Bausch & Lomb
|
Bausch & Lomb |
StereoZoom 7 |
in Optical Microscopes
BAUSCH & LOMB StereoZoom 7:Microscope & Boom Stand
|
1
|
|
|
F* |
Plano, TX |
|
 |
110364
|
Bausch & Lomb
|
Bausch & Lomb |
Type K |
in Parts and Accessories, Microscope
BAUSCH & LOMB TYPE K STAND:K Stand for B&L StereoZoom Microscopes
Available Only with Purchase of a Bausch & Lomb StereoZoom Microscope E-Arm not included
|
1
|
|
|
 |
Scotia, New York |
|
 |
109549
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand w/ Rotatable Knuckle
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
|
 |
Scotia, New York |
|
 |
109553
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
|
 |
Scotia, New York |
|
 |
109122
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
19
|
|
|
F* |
Scotia, New York |
|
 |
109425
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Microscope Boom Stand w/ Rectangular Horizontal Post
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
6
|
|
|
 |
Scotia, New York |
|
 |
109427
|
BOOM STAND
|
BOOM STAND |
in Parts and Accessories, Microscope
BOOM STAND:Dual Arm Microscope Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
350.09 |
 |
Scotia, New York |
|
 |
4436
|
Buehler
|
Buehler |
Consumables |
in Sample Preparation
BUEHLER CONSUMABLES, POLISHING AND GRINDING:Polishing and Grinding Consumables
|
4
|
|
|
|
Scotia, NY |
|
 |
122523
|
Buehler
|
Buehler |
Dressing Chuck |
in Surface Processing Equipment
BUEHLER ISOMET DRESSING CHUCK:Dressing Chuck
Representative photos
|
1
|
|
|
F* |
Scotia, New York |
|
 |
142877
|
Buehler
|
Buehler |
ISOMET |
in Surface Processing Equipment
BUEHLER LOW SPEED CUT-OFF SAW:Precision Sectioning Saw
Representative photo - color of saw may vary
Various ISOMET chucks available. See other information for more details.
|
2
|
|
|
 |
Scotia, New York |
|
 |
116574
|
Buehler
|
Buehler |
Primet |
in Sample Preparation
BUEHLER PRIMET MODULAR DISPENSING SATELLITE:Modular Dispensing Satellite
|
1
|
|
|
F* |
Scotia, New York |
|
 |
7353
|
CPS
|
CPS |
6004/1958 |
in Inspection Equipment
CPS SEM ELECTRON GUN POWER SUPPLY 30KV:Electron Gun Power Supply
CPS SEM Power Supply 6004
|
1
|
|
3,751.00 |
 |
Scotia, New York |
|
 |
194899
|
DELTRONIC
|
DELTRONIC |
DH14-RR |
in Optical Microscopes
Deltronic DH14-RR Profile Projector :Deltronic DH14-RR Profile Projector
|
1
|
|
|
|
Plano, Texas |
|
 |
57426
|
Denton
|
Denton |
DESK II |
in Sample Preparation
DENTON VACUUM SPUTTER /SAMPLE COATER SEM SAMPLE PREP :Metal Sputter
|
1
|
|
6,251.67 |
F* |
Scotia, New York |
|
 |
159268
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
|
in Optical Microscopes
Diagnostic Instruments:Microscope Boom Stand
|
2
|
|
|
|
Plano, TX |
|
 |
109548
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
SMS16-A |
in Parts and Accessories, Microscope
DIAGNOSTIC INSTRUMENTS BOOM STAND:Weighted Base Boom Stand
Stands can be fitted for B&L StereoZoom Microscopes, Leica StereoZoom Microscopes, Nikon StereoZoom Microscopes, and Olympus StereoZoom Microscopes Available only with purchase of a Stereozoom Microscope E-arm not included
|
2
|
|
|
 |
Scotia, New York |
|
 |
86452
|
Diagnostic Instrumts
|
Diagnostic Instrumts |
SMS16-B |
in Parts and Accessories, Microscope
DIAGNOSTIC INSTRUMENTS BOOM STAND:Boom Stand
|
1
|
|
325.09 |
F* |
Scotia, New York |
|
 |
18711
|
Dolan Jenner
|
Dolan Jenner |
180 |
in Fiber Optic Illuminators
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
1
|
|
150.04 |
F* |
Scotia, New York |
|
 |
122729
|
Dolan Jenner
|
Dolan Jenner |
PL-750A- 111 |
in Fiber Optic Illuminators
DOLAN JENNER FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source
|
1
|
|
225.06 |
F* |
Scotia, NY |
|
 |
134541
|
FIBER OPTIC LIGHT SOURCE
|
FIBER OPTIC LIGHT SOURCE |
in Fiber Optic Illuminators
FIBER OPTIC LIGHT SOURCE:Remote Fiber Optic Illuminator
Model FOI-150-Remote
|
1
|
|
180.05 |
 |
Scotia, New York |
|
 |
134624
|
FIBER OPTIC LIGHT SOURCE
|
FIBER OPTIC LIGHT SOURCE |
in Fiber Optic Illuminators
FIBER OPTIC LIGHT SOURCE:Fiber Optic Illuminator
Manufacturer Unknown
|
1
|
|
180.05 |
 |
Scotia, New York |
|
 |
49926
|
GCA/Tropel
|
GCA/Tropel |
9000 |
in Surface Inspection
GCA/TROPEL 9000:Surface Flatness Analyzer
|
1
|
|
|
 |
Plano, TX |
|
 |
35762
|
Hitachi
|
Hitachi |
S-7000 |
in Microscopes
Hitachi S-7000:CD SEM Measurement Tool
|
1
|
|
|
F* |
Plano, TX |
|
 |
332
|
Karl Storz
|
Karl Storz |
483C |
in Parts and Accessories, Microscope
KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE :Twin Fiber Optic Light SourceLight guide not included.
|
1
|
|
350.09 |
 |
Scotia, New York |
|
 |
255041
|
KLA Tencor
|
KLA Tencor |
2367 |
in Microscope Inspection Tools
KLA 2367 "Escape" Bright Field Inspection Tool:BrightField Inspektionstool 25 cassette HW 200mm GEM/SECS and HSMS Model Enable .12 , .62, .39 Picels ORS Upgrade done Tool currently full installed at cleanroom (estimated time depending on areaneed)
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
255557
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
255558
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
255559
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
254018
|
KLA-Tencor
|
KLA-Tencor |
2138XP |
in Microscope Inspection Tools
KLA-Tencor 2138XP Brightfield Inspection Tool:KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes
- For 150mm & 200mm Wafers
- Model 2552UI User Interface
- Denkenseiki Noise Filter
- Please Inquire for Additional Details
|
1
|
|
|
 |
Austin, Texas |
|
 |
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
 |
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
 |
250818
|
KLA-Tencor
|
KLA-Tencor |
Puma 9120 IS |
in Surface Inspection
KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool:KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool - For 200mm or 300mm Wafers
- 2ea Cameras
- Please Inquire for Additional Details
|
1
|
|
|
 |
Austin, Texas |
|
 |
250819
|
KLA-Tencor
|
KLA-Tencor |
Puma 9130 |
in Surface Inspection
KLA-TENCOR Puma 9130 Darkfield Inspection Tool:KLA-TENCOR Puma 9130 Darkfield Inspection Tool - Parts Tool
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
 |
250814
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool:KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
 |
250815
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too:KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
 |
250816
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP3+ |
in Surface Inspection
KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool:KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool - DUV Illumination
- Particle Detection to 32nm
- Dual 300mm FOUP Loadports
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
 |
1127
|
Leco
|
Leco |
VC-50 |
in Surface Processing Equipment
LECO PRECISION DIAMOND CUT OFF SAW 5" BLADE:Vari/Cut Off Saw
|
1
|
|
|
F* |
Scotia, New York |
|
 |
18713
|
Fostec
|
Fostec |
8300 |
in Fiber Optic Illuminators
LEEDS FOSTEC FIBER OPTIC LIGHT SOURCE:Fiber Optic Light Source Representative photo These units are manufactured by Fostec and re-branded by different companies. The light source received may not be branded Fostec.
|
19
|
|
|
F* |
Scotia, New York |
|
 |
186519
|
Leica
|
Leica |
INM20 |
in Optical Microscopes
LEICA AUTOMATED WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system
|
1
|
|
|
F* |
Scotia, New York |
|
 |
1893
|
Leica
|
Leica |
445945 |
in Parts and Accessories, Microscope
LEICA E-ARM FOCUSING DRIVE:Focusing Drive For MS5/MZ6/MZ8
|
9
|
|
|
F* |
Scotia, New York |
|
 |
243053
|
Leica
|
Leica |
Polylite 88 |
in Optical Microscopes
LEICA REICHERT BRIGHTFIELD DARKFIELD :Long Working Distance Objectives
|
1
|
|
|
F* |
Scotia, New York |
|
 |
165299
|
Leica
|
Leica |
S6 E |
in Optical Microscopes
LEICA STEREO MICROSCOPE 6.3X - 40X:Stereo Microscope with Boom Stand and Ring Light
|
1
|
|
1,550.42 |
F* |
Scotia, New York |
|
 |
192026
|
Leica
|
Leica |
S6 E |
in Optical Microscopes
LEICA STEREO MICROSCOPE 6.3X - 40X:Stereo Microscope with Boom Stand, Dual Light Pipes & .75X Aux lens
|
1
|
|
1,725.46 |
F* |
Scotia, New York |
|
 |
37954
|
Leica
|
Leica |
INM 100 |
in Optical Microscopes
LEICA WAFER INSPECTION MICROSCOPE, BRIGHT & DARKFIELD:Wafer Inspection Microscope New, never used
|
1
|
|
|
F* |
Scotia, New York |
|
 |
169430
|
Leica
|
Leica |
Wild M8 |
in Optical Microscopes
LEICA WILD STEREO MICROSCOPE 6X - 50X:Stereo Microscope
|
1
|
|
|
 |
Scotia, New York |
|
 |
1643
|
Leica
|
Leica |
POLYLITE88 |
in Optical Microscopes
LEICA/REICHERT METALLURGICAL MICROSCOPE:Metallurgical Microscope - Camera and controller not included
|
1
|
|
|
F* |
Scotia, New York |
|
 |
1641
|
Leica
|
Leica |
POLYLITE 88 |
in Optical Microscopes
LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION :Manual Wafer Inspection Microscope MicroVision MVT 1080 Wafer Loader
|
1
|
|
|
F* |
Scotia, New York |
|
 |
106575
|
Leica
|
Leica |
Polylite 88 |
in Optical Microscopes
LEICA/REICHERT MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Polylite 88 Reflected Light Microscope
|
2
|
|
|
F* |
Scotia, New York |
|
 |
186513
|
Leica
|
Leica |
POLYLITE 88 |
in Optical Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system
|
1
|
|
|
 |
Scotia, New York |
|
 |
186518
|
Leica
|
Leica |
POLYLITE 88 |
in Optical Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE:Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system
|
1
|
|
|
F* |
Scotia, New York |
|
 |
57070
|
Leitz
|
Leitz |
Laborlux 12 HL |
in Optical Microscopes
LEITZ BRIGHTFIELD/DARKFIELD FILAR EYEPIECE:Brightfield, Darkfield and DIC Leitz Filar Eyepiece with Boeckeler Micrometer and Readout
|
1
|
|
5,951.59 |
F* |
Scotia, New York |
|
 |
47433
|
Leitz
|
Leitz |
Secolux 6X6 |
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD:Brightfield Reflected Light Microscope
|
1
|
|
5,701.53 |
F* |
Scotia, New York |
|
 |
113754
|
Leitz
|
Leitz |
Ergolux |
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield/Darkfield Reflected Light
|
1
|
|
4,901.31 |
F* |
Scotia, New York |
|
 |
89143
|
Leitz
|
Leitz |
Ergolux |
in Optical Microscopes
LEITZ MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield Reflected Light/Transmitted Light Microscope
|
1
|
|
5,251.41 |
F* |
Scotia, New York |
|
 |
256664
|
Olympus
|
Olympus |
|
in Optical Microscopes
Low power optical scope:Location is at Infineon Penang.
|
2
|
|
|
 |
George Town, Penang |
|
 |
18582
|
Melles Griot
|
Melles Griot |
04TFF002 |
in Optical Microscopes
MELLES GRIOT FINE FOCUSING MICROSCOPE:Fine Focusing Microscope
|
3
|
|
450.12 |
 |
Scotia, New York |
|
 |
111690
|
MICROSCOPE STAND
|
MICROSCOPE STAND |
in Parts and Accessories, Microscope
MICROSCOPE STAND:Large StereoZoom Microscope Stand
Available only with purchase of a B&L, Nikon, or Olympus StereoZoom Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
81042
|
Microspec
|
Microspec |
WDX-2A(Spectrometer) |
in Inspection Equipment
MICROSPEC WDX-2A SPECTROMETER:Spectrometer
|
1
|
|
|
 |
Scotia, New York |
|
 |
133353
|
Mitutoyo
|
Mitutoyo |
176-901-1A |
in Optical Microscopes
MITUTOYO TOOLMAKER'S MICROSCOPE:Toolmakers Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
3042
|
Nikon
|
Nikon |
|
in Optical Microscopes
NIKON DISK INSPECTION MICROSCOPE:Disk Inspection Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
1899
|
Nikon
|
Nikon |
UA1 |
in Parts and Accessories, Microscope
|
7
|
|
140.04 |
 |
Scotia, New York |
|
 |
62898
|
Nikon
|
Nikon |
E-Arm |
in Parts and Accessories, Microscope
|
21
|
|
140.04 |
F* |
Scotia, New York |
|
 |
109820
|
Nikon
|
Nikon |
Focusing Stand |
in Parts and Accessories, Microscope
NIKON FOCUSING STAND:Focusing Stand With Diascopic Illuminator Base
Available only with purchase of Nikon Stereozoom Microscope
|
2
|
|
|
 |
Scotia, New York |
|
 |
110421
|
Nikon
|
Nikon |
Focusing Stand |
in Parts and Accessories, Microscope
NIKON FOCUSING STAND:Focusing Stand
Available only with purchase of Nikon Stereozoom Microscope
|
1
|
|
250.07 |
 |
Scotia, New York |
|
 |
249588
|
Nikon
|
Nikon |
Labophot 2 |
in Optical Microscopes
|
1
|
|
|
|
Plano, Texas |
|
 |
3253
|
Nikon
|
Nikon |
None |
in Optical Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSCOPE:Large Substrate Inspection Microscope With Brightfield and Darkfield Illumination 12" x 8" XY Stage
|
1
|
|
|
F* |
Scotia, New York |
|
 |
189203
|
Nikon
|
Nikon |
XD-20 |
in Optical Microscopes
NIKON LARGE SUBSTRATE INSPECTION MICROSOPE:Brightfield, Darkfield, POL Reflected and Transmitted Light
N.B. The Kinetic Systems optical table that the Nikon Microscope is on is not included. However, it is for sale. More information at Kinetic Systems 1201-04-11
|
1
|
|
|
F* |
Scotia, New York |
|
 |
152742
|
Nikon
|
Nikon |
MM-11B |
in Optical Microscopes
NIKON MEASURING MICROSCOPE:Measuring Microscope
|
1
|
|
|
 |
Scotia, New York |
|
 |
105740
|
Nikon
|
Nikon |
MM-11 |
in Optical Microscopes
NIKON MEASURING MICROSCOPE:Measuring Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
129771
|
Nikon
|
Nikon |
MM-11B |
in Optical Microscopes
NIKON MEASURING MICROSCOPE:Measuring Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
1522
|
Nikon
|
Nikon |
OPTIPHOT 200 |
in Optical Microscopes
NIKON MICROSCOPE WAFER INSPECTION :Wafer Inpection Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
4360
|
Nikon
|
Nikon |
Optiphot 200 |
in Optical Microscopes
NIKON MICROSCOPE, REFLECTED LIGHT - BRIGHTFIELD & DARKFIELD:Brightfield and Darkfield
This photograph is a representative image of the microscope with a 6x6 transmitted light stage.
|
3
|
|
|
 |
Scotia, New York |
|
 |
251440
|
Nikon
|
Nikon |
NWL-641 |
in Parts and Accessories, Microscope
Nikon NWL-641 Microscope Automatic Wafer Loader:Nikon NWL-641 Microscope Automatic Wafer Loaders, 2ea Available
|
2
|
|
|
 |
Plano, Texas |
|
 |
251439
|
Nikon
|
Nikon |
NWL200T |
in Parts and Accessories, Microscope
Nikon NWL200T Microscope Wafer Loader:Nikon NWL200T Microscope Automatic Wafer Loader
|
1
|
|
|
|
Plano, Texas |
|
 |
122190
|
Nikon
|
Nikon |
CF Plan 1.5 X |
in Parts and Accessories, Microscope
NIKON OBJECTIVE CF PLAN 1.5X:CF Plan 1.5 X EPI Reflected Light Infinity Corrected Objective
|
11
|
|
925.25 |
F* |
Scotia, New York |
|
 |
155646
|
Nikon
|
Nikon |
Optiphot 200 |
in Optical Microscopes
Nikon Optiphot 200:NIKON Optiphot 200 Wafer Inspection Stand, Including - Focus Mechanism
- Interference Contrast Polarizer/Analyzer
|
1
|
|
|
|
Plano, Texas |
|
 |
120404
|
Nikon
|
Nikon |
Optiphot 88 |
in Optical Microscopes
Nikon Optiphot 88:NIKON Optiphot-88 Wafer Inspection Microscope - 5 Position Turret with Motorized Rotation
- BDPlan 5X, 10X, 20X, 40X & 100X Bright/Darkfield Objective Lenses
- Trinocular Viewing Head with 10X Widefield Eyepieces
- C-Mount with Television Lens Included
- Vertical Illuminator with 12V/50W Halogen Lamp Housing
- Brightfield & Darkfield Channels
- Dual Iris Apertures
Specimen Stage with 200mm X 200mm XY Travel
|
1
|
|
|
|
Plano, Texas |
|
 |
161461
|
Nikon
|
Nikon |
Optiphot 100S |
in Optical Microscopes
NIKON OPTIPHOT REFLECTED LIGHT MICROSCOPE:Reflected Light Microscope
|
1
|
|
|
|
Scotia, NY |
|
 |
179537
|
Nikon
|
Nikon |
Optiphot-150S |
in Optical Microscopes
Nikon Optiphot-150S Wafer Inspection Microscope:Nikon Optiphot-150S Wafer Inspection Microscope - 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses
- Binocular Head with CFWN 10X/20 WF Eyepieces
- Wafer Stage for Use with Nikon NWL-641 Wafer Loader
- 12V/50W Lamphouse with Internal Illumination Transformer
- Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
- Macro Inspection Capability
- Also Available with Bright/Darkfield Objective Lenses
- Also Available with Ergo Trinocular Head and Color Camera
- Also Available without NWL-641 Wafer Loader
|
1
|
|
|
 |
Plano, Texas |
|
 |
212138
|
Nikon
|
Nikon |
Optiphot-150S |
in Optical Microscopes
Nikon Optiphot-150S Wafer Inspection Microscope:Nikon Optiphot-150S Wafer Inspection Microscope - 5X 10X, 20X, 50X & 100X CF Plan Brightfield EPI Objective Lenses
- Ergo Trinocular Head with CFWN 10X/20 WF Eyepieces
- Color CMOS Microscope Camera
- Wafer Stage for Use with Nikon NWL Wafer Loader
- 12V/50W Lamphouse with Internal Illumination Transformer
- Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
- Macro Inspection Capability
- Also Available with Bright/Darkfield Objective Lenses
- Also Available without NWL-641 Wafer Loader
|
1
|
|
|
 |
Plano, Texas |
|
 |
124185
|
Nikon
|
Nikon |
Optistation 3 |
in Microscope Inspection Tools
Nikon Optistation 3:Wafer Inspection Tool for 6" Wafers
|
1
|
|
|
 |
Plano, Texas |
|
 |
87091
|
Nikon
|
Nikon |
Optistation 3A |
in Microscope Inspection Tools
Nikon Optistation 3A:Automatic Wafer Inspection Station
|
1
|
|
|
 |
Plano, TX |
|
 |
235855
|
Nikon
|
Nikon |
Eclipse ME600L |
in Optical Microscopes
NIKON REFLECTED LIGHT BF DF DIC MICROSCOPE:Reflected Light Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
184512
|
Nikon
|
Nikon |
SMZ 1000 |
in Optical Microscopes
NIKON STEREO MICROSCOPE RANGE .8X TO 8.0X:Stereo Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
93456
|
Nikon
|
Nikon |
SMZ-1B |
in Optical Microscopes
NIKON STEREOMICROSCOPE 16X - 70X:Stereomicroscope
|
12
|
|
600.16 |
 |
Scotia, New York |
|
 |
185485
|
Nikon
|
Nikon |
SMZ-1B |
in Optical Microscopes
NIKON STEREOMICROSCOPE 16X - 70X with BOOM STAND:Stereomicroscope with Boom Stand
Choice of 10X, 15X or 20X Eyepieces
|
6
|
|
|
F* |
Scotia, New York |
|
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