 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
35762
|
Hitachi
|
Hitachi |
S-7000 |
in Microscopes
Hitachi S-7000:CD SEM Measurement Tool
|
1
|
|
|
F* |
Plano, TX |
|
 |
205450
|
Hitachi
|
Hitachi |
S-9380 |
in Microscopes
Hitachi, S-9380, CD SEM, 300mm:Hitachi, S-9380, CD SEM, 300mm Refurbished S/N: 89638
|
1
|
|
|
 |
Seoul |
|
 |
136824
|
Hitachi OEM*
|
Hitachi OEM* |
2M131 |
in Electrical and Electronic Components
Hitachi 2M131 Magnetron :Hitachi 2M131 Magnetron Magnetron
|
2
|
|
|
 |
Plano, TX |
|
 |
202146
|
Hitachi
|
Hitachi |
HF-2000 |
in Optical Microscopes
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM 1995 Vintage S/N : 6214-3 Un-hooked in lab.
|
1
|
|
|
 |
East Fishkill, New York |
|
 |
204280
|
Hitachi
|
Hitachi |
M-8190XT |
in Plasma Processing Equipment
Hitachi, M-8190XT, 300mm, Plasma Etch:Hitachi, M-8190XT, 300mm, Plasma Etch 3 Chambers In Fab, Warm Idle
|
1
|
|
|
 |
Malta, New York |
|
 |
324
|
Hitachi
|
Hitachi |
S-806C |
in Inspection Equipment
HITACHI S-806C FIELD EMISSION SCANNING ELECTRON MICROSCOPE:Field Emission Scanning Electron Microscope
|
1
|
|
|
F* |
Scotia, New York |
|
 |
203281
|
Hitachi
|
Hitachi |
S-5200 |
in Inspection Equipment
Hitachi, S-5200, SEM, Ultra High Resolution:Hitachi, S-5200, SEM, Ultra High Resolution
|
1
|
|
|
 |
East Fishkill, New York |
|
 |
210389
|
Hitachi
|
Hitachi |
S-4500 |
in Inspection Equipment
Hitachi, S-4500, SEM:Hitachi, S-4500, SEM Installed. Idle S/N: 7953-02
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
219055
|
Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01
|
1
|
|
|
 |
Singapore |
|
 |
219056
|
Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02
|
1
|
|
|
 |
Singapore |
|
 |
219057
|
Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03
|
1
|
|
|
 |
Singapore |
|
 |
219058
|
Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01
|
1
|
|
|
 |
Singapore |
|
 |
219072
|
Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03
|
1
|
|
|
 |
Singapore |
|
 |
178294
|
Hitachi
|
Hitachi |
AS5000 |
in Inspection Equipment
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server
|
1
|
|
|
F* |
Singapore |
|
 |
178296
|
Hitachi
|
Hitachi |
Microanalysis System |
in Inspection Equipment
Hitachi, Metrology, Microanalysis System 300mm:Status: Bagged and Skidded
|
1
|
|
|
|
Taichung, Taichung City |
|
 |
178299
|
Hitachi
|
Hitachi |
Z-5700 |
in Inspection Equipment
Hitachi, Z-5700 Spectroscopy, 300mm:Status: Bagged and Skidded
|
1
|
|
|
|
Taichung, Taichung City |
|
 |
60831
|
Hitachi
|
Hitachi |
S-4100 |
in Inspection Equipment
HITACHI S-4100 FIELD EMISSION ELECTRON MICROSCOPE:Field Emission Electron MicroscopeNB: System is missing Ion pump power supply. Sold "As Is".
|
1
|
|
|
F* |
Scotia, NY |
|
 |
100557
|
Hitachi
|
Hitachi |
S-2400 |
in Inspection Equipment
HITACHI S-2400 SCANNING ELECTRON MICROSCOPE:Scanning Electron Micrscope (SEM)
|
1
|
|
|
F* |
Scotia, NY |
|
 |
155055
|
Hitachi
|
Hitachi |
VP-1500 |
in Pharmaceutical Laboratory and Scientific Equipment
MONOCHROME COPIER:MONOCHROME COPIERMONOCHROME COPIERLOCATION: Malacca SERIAL NUMBER(S): TA0101513
|
1
|
|
3,214.44 |
 |
Regensburg, BY |
|
 |
126271
|
Hitachi
|
Hitachi |
H3862 |
in Semiconductor Manufacturing Equipment
Hitachi H3862 Magnetron:Magnetron
|
1
|
|
|
 |
Plano, TX |
|
|
 |