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Vibration Isolation Control Platform

Exhaust Valve Core

eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This system provides comprehensive, high-resolution inspection of both masks and wafers with unparalleled accuracy. The unit uses a proprietary optical probe to scan masks and wafers to detect defects and irregularities with a resolution reaching down to 1 micron. This high-precision scanning allows for comprehensive inspection of the entire surface of both the mask and wafer. The machine also includes powerful image processing and analysis algorithms which automatically detect defects, categorize them, and track their locations. KLA eS32 also includes a suite of automated defect correction tools which can rapidly repair standard and complex defects. In addition to its exhaustive defect detection capabilities, this tool also allows for statistical process control (SPC) analysis to ensure production processes maintain consistent quality and accuracy over time. TENCOR ES 32 also includes a user-friendly interface that makes it easy to operate and manage the asset. This user interface is highly customizable, allowing users to quickly change model settings, view detailed inspection reports, and receive real-time notifications of detected defects. In summary, KLA ES 32 is a high-performance mask and wafer inspection equipment that offers superior detection accuracy, automated defect correction, comprehensive statistical process control (SPC) analysis, and an easy-to-use user interface. This system can be used to monitor production lines, resulting in improved manufacturing quality, increased yield, and cost savings.

KLA-TENCOR Surfscan 6420 Unpatterned Wafer Surface Contamination Tool

• Please Inquire for Additional Details

KLA-Tencor Camera Interface PCB (CIB2)

• For Puma Darkfield Inspection Tools
• Part No. 0049320-001
• Tested Before Delivery

KLA-Tencor X Timing Controller PCB (XTC) 

• For Puma Darkfield Inspection Tools
• Part No. 0096709-000
• Tested Before Delivery

KLA-Tencor 51-0175, Rev. D H2 Wafer Handler Prealigner

KLA-Tencor 52-0466 DBS Spectrometer Lid 

KLA-Tencor DSW16E 300mm Calibration Wafer

• Part Number 0210691-000 (Advanced Technology Development)
• For Use on e-Beam Patterned Wafer Defect Inspection Tools 

   

KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool

• Dual 300 mm Loadports
• Analysis of 190nm-800nm Wavelengths
• White Light Reflectometer
• Broadband Spectroscopic Ellipsometer
• Single Wave Ellipsometer
• Stress Measurement
• iDesorber 

KLA-TENCOR Archer 200 AIM Overlay Metrology Tool

• ETAL Stage
• Yaskawa Robot with NXC100 Controller
• IDE Maxon 1000 Floatation Controller

KLA-TENCOR HRP-240 High Resolution Profiler

• Cassette to Cassette Wafer Handling for up to 200mm Wafers
• Previously Configured for SMIF Wafer Handling
• Please Inquire for Additional Details

KLA-TENCOR Puma 9130 Darkfield Inspection Tool

• Parts Tool
• Please Inquire for Additional Details

KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit

Motorized Linear Stage

Klinger B91-57055

Klinger acquired by Newport Corporation

• Pneumatic Linear Slide
• Howa-Origa
• Max 0.8 Mpa

• Pneumatic Linear Slide
• Howa-Origa
• Max 0.8 Mpa

Pneumatic Air Cylinder

Micro Ultrasonic Cell Disrupter

Kontes KT 50

Manual Ball Bonder

Manual Wedge Bonder with Leica GZ6 Microscope