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 Parts and Accessories - Other  in Parts and Accessories, Microscope  (22)

 Patterned Wafer Inspection  in Surface Inspection  (1)

 Polishing & Grinding Sample Prep Equipment  in Sample Preparation  (1)

 Profilometers  in Film Thickness Testers  (4)

 Sample Coaters  in Sample Preparation  (2)

 Optical CD Measurement  in Critical Dimension Measurement Equipment  (1)

 Overlay Registration  in Critical Dimension Measurement Equipment  (3)

 Objective Lenses  in Parts and Accessories, Microscope  (1)

 Stereo Microscopes  in Optical Microscopes  (46)

 Stress Measurement Equipment  in Metrology Equipment  (1)

 Unpatterned Wafer Inspection  in Surface Inspection  (6)

 FT-IR Spectrometers  in Spectrometers  (6)

 Upright Microscopes  in Optical Microscopes  (25)

 UV-Visible Spectrophotometers  in Spectrophotometers  (1)

 Fiber Optic Light Sources  in Fiber Optic Illuminators  (7)

 Film Thickness Testers - Other  in Film Thickness Testers  (3)

 Wafer Inspection Microscopes  in Optical Microscopes  (14)

 Microscopes - Other  in Optical Microscopes  (7)

 Xray Fluorescence Spectrometers  in Spectrometers  (2)

 Stands  in Parts and Accessories, Microscope  (16)

 Sample Preparation - Other  in Sample Preparation  (3)

 Scanning Electron Microscopes  in Inspection Equipment  (2)

 Inverted Microscopes  in Optical Microscopes  (1)

 Measuring Microscopes  in Optical Microscopes  (6)

 Critical Dimension Scanning Electron Microscopes  in Microscopes  (1)

 Metrology Equipment - Other  in Metrology Equipment  (8)

 Cut-Off Saws  in Surface Processing Equipment  (4)

 4 & 6 Point Probes  in Resistivity Testers  (1)

 CV Plotters  in Metrology Equipment  (2)

 Automatic Wafer Inspection Tools  in Microscope Inspection Tools  (4)

 Ellipsometers  in Film Thickness Testers  (8)

Items from the following manufacturers are offered under Metrology Equipment:
ADE, American Optical, Anatech Ltd, ATM GmbH, Bausch & Lomb, Inc, Bio-Rad, Buehler, Carl Zeiss, CDE, CPS, CR Technology, DELTRONIC, Denton, Diagnostic Instruments, Digital Instruments, Dolan Jenner, Fostec, Four Dimensions, Frontier Semiconductor, Gaertner, GCA/Tropel, Hitachi, Insidix, Karl Storz, KLA Tencor, KLA-Tencor, Leco, Leica, Leica, Leitz, McPherson, Melles Griot, Microspec, Mitutoyo, Nanometrics, Nicolet, Nikon, Nikon, Olympus, Plasmos, Reichert Inc, Reichert-Jung, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Sagax, Semilab, Semprex, Solid State Measurement, Takano, Tencor, Veeco Instruments, Vision Engineering, Volpi, Well, Wild, Zeiss