 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
332
|
Karl Storz
|
Karl Storz |
483C |
in Parts and Accessories, Microscope
KARL STORZ TWIN FIBER OPTIC LIGHT SOURCE :Twin Fiber Optic Light SourceLight guide not included.
|
1
|
|
350.09 |
 |
Scotia, New York |
|
 |
189080
|
Karl Suss
|
Karl Suss |
PM5 Type: 0577065 |
in Manual Probers
KARL SUSS ANALYTICAL MANUAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
81577
|
Karl Suss
|
Karl Suss |
PM5 |
in Manual Probers
KARL SUSS ANALYTICAL WAFER PROBER:Analytical Wafer Prober
|
1
|
|
|
F* |
Scotia, New York |
|
 |
112607
|
Karl Suss
|
Karl Suss |
MA 150M |
in Mask Aligners
KARL SUSS MANUAL MASK ALIGNER 150 MM:Manual Mask Aligner
The Karl Suss MA 150M Manual Mask Aligner is a mask alignment and exposure system which offers unsurpassed precision and versatility when handling wafers up to 150 mm in diameter.
|
1
|
|
|
F* |
Scotia, New York |
|
 |
126644
|
Karl Suss
|
Karl Suss |
SOM4 |
in Manual Probers
KARL SUSS MANUAL PROBE STATION:Analytical Wafer Prober
|
1
|
|
|
 |
Scotia, New York |
|
 |
183548
|
Karl Suss
|
Karl Suss |
PH150 |
in Manual Probers
KARL SUSS MICROPOSITIONER:Micropositioner with Fine Screw Adjustments
|
1
|
|
1,500.40 |
|
Scotia, New York |
|
 |
173964
|
Karl Suss
|
Karl Suss |
PH150 |
in Manual Probers
KARL SUSS MICROPOSITIONER:Micropositioner with Fine Screw Adjustment
|
1
|
|
1,500.40 |
 |
Scotia, New York |
|
 |
182967
|
Karl Suss
|
Karl Suss |
PH150 |
in Manual Probers
KARL SUSS MICROPOSITIONER:Micropositioner
|
1
|
|
1,550.42 |
 |
Scotia, New York |
|
 |
149217
|
Kashiyama Mfr*
|
Kashiyama Mfr* |
HC60AU-009 |
in Semiconductor Parts
Kashiyama Part Number HC60AU-009:Oth Semi Eq Parts in ALL CATEGORIESKASHIYAMA IND. HC60 DRY VACUUM PUMP
|
1
|
|
|
 |
Hudson, NY |
|
 |
149218
|
Kashiyama Mfr*
|
Kashiyama Mfr* |
HC60B |
in Semiconductor Parts
Kashiyama Part Number HC60B:Oth Semi Eq Parts in ALL CATEGORIESKASHIYAMA IND. HC60 DRY VACUUM PUMP
|
1
|
|
|
 |
Hudson, NY |
|
 |
190950
|
Kaufman & Robinson I
|
Kaufman & Robinson I |
eH1000 HC/F |
in Ion Beam Equipment
KAUFMAN & ROBINSON END-HALL ION SOURCE WITH WATER COOLED FRONT PLATE:Gridless End-Hall Ion Source With Water Cooled Front Plate
|
1
|
|
|
F* |
Scotia, New York |
|
 |
147078
|
Kaydon Corporation I MFR*
|
Kaydon Corporation I MFR* |
JU090X PO-N |
in Semiconductor Parts
Kaydon Corporation Inc. Part Number JU090X PO-N:Silverthin Bearing 3/8 x1/2
|
1
|
|
|
|
Hudson, NY |
|
 |
103501
|
Keithley Instruments OEM*
|
Keithley Instruments OEM* |
9126-CGM-R |
in Electrical and Electronic Components
Keithley Instruments Part Number 9126-CGM-R:Capacitance / Conductance Meter - Repaired
|
2
|
|
|
|
Hudson, New York |
|
 |
149088
|
Kensington Labs Mfr*
|
Kensington Labs Mfr* |
8500-12 |
in Semiconductor Parts
Kensington Labs Part Number 8500-12:Oth Semi Eq Parts in ALL CATEGORIESKENSINGTON LAB STAGE
|
1
|
|
|
 |
Hudson, NY |
|
 |
570
|
Kensington Labs
|
Kensington Labs |
MS4 |
in Stages
KENSINGTON ROTARY MICROSCOPE STAGE:X-Y-Z and Rotary Microscope Stage
Stage supports many popular microscopes. Excellent Condition Kensington MS-4
|
1
|
|
|
 |
Scotia, New York |
|
 |
95385
|
Kepco
|
Kepco |
RMX12-C |
in Power Supplies
Kepco:Power Supply, 115/230VAC, 12V, 15A
|
1
|
|
|
 |
Plano, TX |
|
 |
147010
|
Kepco MFR*
|
Kepco MFR* |
EMR-500K |
in Semiconductor Parts
Kepco Part Number EMR-500K:DC Power Supply
|
1
|
|
|
|
Hudson, NY |
|
 |
221102
|
BESI
|
BESI |
X-Eye SF160 SL |
in Machine Tools
KETECA, X-Eye SF160 SL, A-SFS16FDAL170N2D735, XRAY:Function , needed motor vacuum to up this machine |
|
1
|
|
22,806.11 |
 |
Batam, Riau Islands |
|
 |
170463
|
Key High Vacuum
|
Key High Vacuum |
PEV-1-004 |
in Vacuum Valves
KEY HIGH VACUUM PIEZOELECTRIC GAS FLOW VALVE:Piezoelectric High Precision Gas Leak Valve - 1/4" FNPT inlet fitting and 1/2" OD tube outlet fitting.
PEV Series
|
1
|
|
|
 |
Scotia, New York |
|
 |
2634
|
Key High Vacuum
|
Key High Vacuum |
MT300 |
in Vacuum Pumps
KEY HIGH VACUUM PRODUCTS MOLECULAR SIEVE FORELINE TRAP:Molecular Sieve Foreline Trap
Offers an extremely effective method for preventing backstreaming of mechanical roughing pump oils
|
1
|
|
275.07 |
 |
Scotia, New York |
|
 |
163896
|
Key High Vacuum
|
Key High Vacuum |
QBV-30-P-55-24DC |
in Vacuum Valves
KEY HIGH VACUUM PRODUCTS PNEUMATIC BUTTERFLY VACUUM VALVE:Pneumatic Butterfly Vacuum Valve
|
2
|
|
825.22 |
F* |
Scotia, New York |
|
 |
141037
|
Key High Vacuum
|
Key High Vacuum |
QBV-30-P-SS |
in Vacuum Valves
KEY HIGH VACUUM PRODUCTS PNEUMATIC BUTTERFLY VACUUM VALVE ISO-F 3":Pneumatic Butterfly Vacuum Valve
|
1
|
|
515.14 |
 |
Scotia, New York |
|
 |
141044
|
Key High Vacuum
|
Key High Vacuum |
PSL-200-K-N |
in Vacuum Valves
KEY HIGH VACUUM PRODUCTS PNEUMATIC RIGHT ANGLE VACUUM VALVE KF 50:Pneumatic Right Angle Vacuum Valve
|
1
|
|
290.08 |
 |
Scotia, New York |
|
 |
95387
|
Keyence
|
Keyence |
FU-59 |
in Sensors
Keyence:Sensor Photo Fiver S/RSensor Photo Fiver S/R
|
1
|
|
|
 |
Plano, TX |
|
 |
149640
|
Keyence OEM*
|
Keyence OEM* |
96M0179 |
in Semiconductor Parts
Keyence 96M0179 Fiber Splicer and Mounting Kit:Keyence 96M0179 Fiber Splicer and Mounting KitFiber Splicer and Mounting Kit
|
10
|
|
|
 |
Plano, TX |
|
 |
158435
|
Keyence OEM*
|
Keyence OEM* |
BL-U2 |
in Semiconductor Parts
Keyence BL-U2:Power Supply Unit
|
1
|
|
|
|
Plano, TX |
|
 |
142588
|
Keyence OEM*
|
Keyence OEM* |
F-5HA |
in Sensors
Keyence F-5HA Fiber Optic Sensor Head:Keyence F-5HA Fiber Optic Sensor HeadSmall-spot, Side-view Lens
|
6
|
|
|
 |
Plano, TX |
|
 |
163445
|
Keyence OEM*
|
Keyence OEM* |
FS-T2 |
in Semiconductor Parts
Keyence FS-T2:Fiber Amplifier, Cable Type, Expansion Unit, NPN
|
3
|
|
|
 |
Plano, TX |
|
 |
163446
|
Keyence OEM*
|
Keyence OEM* |
FS-V1 |
in Semiconductor Parts
Keyence FS-V1:Fiber Amplifier, Cable Type, Main Unit, NPN
|
1
|
|
|
 |
Plano, TX |
|
 |
137705
|
Keyence OEM*
|
Keyence OEM* |
FS-V11 |
in Sensors
Keyence FS-V11 Fiberoptic Sensor Amp:Keyence FS-V11 Fiberoptic Sensor AmpFiberoptic Sensor Amp
|
1
|
|
|
 |
Plano, TX |
|
 |
142458
|
Keyence OEM*
|
Keyence OEM* |
FS-V11 |
in Electrical and Electronic Components
Keyence FS-V11 Fiberoptic Sensor Amplifier:Keyence FS-V11 Fiberoptic Sensor Amplifier
|
1
|
|
|
 |
Plano, TX |
|
 |
162569
|
Keyence OEM*
|
Keyence OEM* |
FS-V11P / FS-V12P |
in Semiconductor Parts
Keyence FS-V11P and FS-V12P:1ea FS-V11P - Fiber Amplifier, Cable Type, Main Unit, PNP 7ea FS-V12P - Fiber Amplifier, Cable Type, Expansion Unit, PNP
|
2
|
|
|
 |
Plano, TX |
|
 |
142451
|
Keyence OEM*
|
Keyence OEM* |
FS-V21R |
in Sensors
Keyence FS-V21R Fiberoptic Dual Display Sensor:Keyence FS-V21R Fiberoptic Dual Display SensorFiberoptic Dual Display Sensor
|
5
|
|
|
 |
Plano, TX |
|
 |
142452
|
Keyence OEM*
|
Keyence OEM* |
FS-V22R |
in Electrical and Electronic Components
Keyence FS-V22R Digital Display Fiber Optic Switch:Keyence FS-V22R Digital Display Fiber Optic SwitchDigital Display Fiber Optic Switch
|
4
|
|
|
 |
Plano, TX |
|
 |
186213
|
Keyence
|
Keyence |
MD-F3000W |
in Lasers
KEYENCE HIGH POWER FIBER LASER MARKER 30W:Fiber Laser Marker
The optimum fiber laser marker solution for black-color marking and engraving on metal where a high output power is required
|
1
|
|
|
F* |
Scotia, New York |
|
 |
105908
|
Keyence Mfr*
|
Keyence Mfr* |
EM-080 |
in Sensors
Keyence Part Number EM-080:Proximity Sensor w/Built-In Amplifiers
|
3
|
|
|
|
Hudson, NY |
|
 |
105907
|
Keyence Mfr*
|
Keyence Mfr* |
EM-030 |
in Sensors
Keyence Part# EM-030:Proximity Sensor w/Built-In Amplifiers
|
58
|
|
|
|
Hudson, NY |
|
 |
150027
|
Keyence OEM*
|
Keyence OEM* |
SL-COOH |
in Semiconductor Parts
Keyence SL-COOH:25mm Test Piece for Use with Keyence SL-COOH Series
|
2
|
|
|
 |
Plano, TX |
|
 |
255052
|
Ismeca
|
Ismeca |
KGD01 |
in Production Equipment
|
1
|
|
|
 |
Villach, Kärnten |
|
 |
255056
|
Ismeca
|
Ismeca |
KGD02 |
in Production Equipment
|
1
|
|
|
 |
Villach, Kärnten |
|
 |
115614
|
Kilovac Corporation Mfr*
|
Kilovac Corporation Mfr* |
644-062243-001 |
in Discrete Electronic Components
Kilovac Corporation Part Number 644-062243-001:Relay, RF Switching
|
1
|
|
|
|
Hudson, NY |
|
 |
103749
|
Kinetek Mfr*
|
Kinetek Mfr* |
TT5-00 |
in Electrical and Electronic Components
Kinetek Part Number TT5-00:Keypad Controller RTC-308
|
2
|
|
|
|
Hudson, NY |
|
 |
139160
|
Kinetic Systems
|
Kinetic Systems |
1201-01-11 |
in Semiconductor Manufacturing Facilities Equipment
Kinetic Systems:Vibraplane Isolation Table
|
1
|
|
|
|
Plano, TX |
|
 |
99478
|
Kinetic Systems
|
Kinetic Systems |
Vibraplane 1202-22-12S |
in Semiconductor Manufacturing Facilities Equipment
Kinetic Systems 1202-22-12S:Vibration Isolation Table - Heavy Duty Model 1202-22-12S
|
1
|
|
|
 |
Plano, TX |
|
 |
36037
|
Kinetic Systems, Inc
|
Kinetic Systems, Inc |
2212 |
in Tables
KINETIC SYSTEMS BENCHMATE VIBRATION ISOLATION CONTROL PLATFORM:Vibration Isolation Control Platform
|
2
|
|
|
F* |
Scotia, New York |
|
 |
57327
|
Kinetic Systems, Inc
|
Kinetic Systems, Inc |
Exhaust Valve Core |
in Tables
KINETIC SYSTEMS EXHAUST VALVE CORE:Exhaust Valve Core
|
10
|
|
|
 |
Scotia, New York |
|
 |
218538
|
Kinetic Systems, Inc
|
Kinetic Systems, Inc |
9101-01-21 |
in Tables
KINETIC SYSTEMS VIBRATION ISOLATION TABLE 36" X 30":Vibration Isolation Table
|
1
|
|
|
 |
Scotia, New York |
|
 |
130653
|
Kingdom Mfr*
|
Kingdom Mfr* |
1000 WOG |
in Valves
Kingdom 1000 WOG 1" Ball Valve:Kingdom 1000 WOG 1" Ball Valve
|
3
|
|
|
 |
Plano, TX |
|
 |
130655
|
Kingdom Mfr*
|
Kingdom Mfr* |
2000 WOG |
in Valves
Kingdom 2000 WOG 3/4" Ball Valve:Kingdom 2000 WOG 3/4" Ball Valve
|
2
|
|
|
 |
Plano, TX |
|
 |
95389
|
KIP Inc.
|
KIP Inc. |
261165-03 |
in Valves
|
2
|
|
|
F* |
Plano, TX |
|
 |
95391
|
KLA
|
KLA |
710-651090-20 |
in Electrical and Electronic Components
KLA:Optics Interface PC BoardOptics Interface PC Board
|
1
|
|
|
 |
Plano, TX |
|
 |
255041
|
KLA Tencor
|
KLA Tencor |
2367 |
in Microscope Inspection Tools
KLA 2367 "Escape" Bright Field Inspection Tool:BrightField Inspektionstool 25 cassette HW 200mm GEM/SECS and HSMS Model Enable .12 , .62, .39 Picels ORS Upgrade done Tool currently full installed at cleanroom (estimated time depending on areaneed)
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
132079
|
KLA Mfr*
|
KLA Mfr* |
710-657058-20 |
in Semiconductor Parts
KLA 710-657058-20 Auto Focus Led Driver:KLA 710-657058-20 Auto Focus Led DriverAuto Focus Led Driver
|
1
|
|
|
 |
Plano, TX |
|
 |
254099
|
KLA
|
KLA |
Altair 8920i |
in Metrology Equipment
KLA Altair 8920i AOI Tool:KLA Altair 8920i AOI Tool - For 200mm & 300mm Patterned & Unpatterned Wafers
- Brightfield/Darkfield Optics
- 2X, 3.5X, 5X & 10X Objectives
- 35X Review Capability
- 0.4 um Max DF Sensitivity
- Die to Die Detection Algorithm
- Focus Tracking
- RBB Defect Classification
- 18 WPH Throughput
|
1
|
|
|
 |
Austin, Texas |
|
 |
254098
|
KLA
|
KLA |
Altair 8935-FFC |
in Metrology Equipment
KLA Altair 8935-FFC AOI Tool:KLA Altair 8935-FFC AOI Tool - For 200mm Patterned Wafers on Film Frames
- Brightfield/Darkfield Optics
- 2X, 5X, 10X & 20X Objectives
- 35X LWD Review Capability
- 0.2 um Max DF Sensitivity
- Die to Die Detection Algorithm
- Focus Freeze (High Topo) ADAR
- Deep Learning ADC
- 4 WPH Throughput
|
1
|
|
|
 |
Austin, Texas |
|
 |
254100
|
KLA
|
KLA |
Altair 8935i |
in Metrology Equipment
KLA Altair 8935i AOI Tool:KLA Altair 8935i AOI Tool - For 150mm & 200mm Patterned & Unpatterned Wafers
- For GaN & GaAs on Sapphire & Silicon Wafers
- Brightfield/Darkfield Optics
- 2X, 5X, 10X & 20X Objectives
- 35X LWD Review Capability
- 0.2 um Max DF Sensitivity
- Die to Die Detection Algorithm
- Focus Tracking
- RBB Defect Classification
- 6.5 WPH Throughput
|
1
|
|
|
 |
Austin, Texas |
|
 |
242857
|
KLA
|
KLA |
eS32 |
in Test & Measurement Equipment
KLA eS32 E-beam Wafer Inspection 200mm:eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This system provides comprehensive, high-resolution inspection of both masks and wafers with unparalleled accuracy. The unit uses a proprietary optical probe to scan masks and wafers to detect defects and irregularities with a resolution reaching down to 1 micron. This high-precision scanning allows for comprehensive inspection of the entire surface of both the mask and wafer. The machine also includes powerful image processing and analysis algorithms which automatically detect defects, categorize them, and track their locations. KLA eS32 also includes a suite of automated defect correction tools which can rapidly repair standard and complex defects. In addition to its exhaustive defect detection capabilities, this tool also allows for statistical process control (SPC) analysis to ensure production processes maintain consistent quality and accuracy over time. TENCOR ES 32 also includes a user-friendly interface that makes it easy to operate and manage the asset. This user interface is highly customizable, allowing users to quickly change model settings, view detailed inspection reports, and receive real-time notifications of detected defects. In summary, KLA ES 32 is a high-performance mask and wafer inspection equipment that offers superior detection accuracy, automated defect correction, comprehensive statistical process control (SPC) analysis, and an easy-to-use user interface. This system can be used to monitor production lines, resulting in improved manufacturing quality, increased yield, and cost savings.
|
1
|
|
|
 |
Austin, Texas |
|
 |
95390
|
KLA
|
KLA |
710-659227-00 |
in Semiconductor Parts
KLA Instruments:Wafer Inspection BackplaneWafer Inspection Backplane
|
1
|
|
|
 |
Plano, TX |
|
 |
131811
|
KLA Mfr*
|
KLA Mfr* |
760-661136-00 |
in Semiconductor Parts
KLA Insulated Vertical Illuminator 760-661136-00:KLA Insulated Vertical Illuminator 760-661136-00Insulated Vertical Illuminator
|
1
|
|
|
 |
Plano, TX |
|
 |
255557
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
255558
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
255559
|
KLA Tencor
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
149500
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-653016-20 |
in Electrical and Electronic Components
KLA Tencor 710-653016-20 81B Assy:KLA Tencor 710-653016-20 81B Assy81B Assy
|
1
|
|
|
 |
Plano, TX |
|
 |
149501
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658076-20 |
in Electrical and Electronic Components
KLA Tencor 710-658076-20 Phase 3 Defect Processor PCB:KLA Tencor 710-658076-20 Phase 3 Defect Processor PCBPhase 3 Defect Processor PCB
|
1
|
|
|
 |
Plano, TX |
|
 |
149503
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658081-20 |
in Electrical and Electronic Components
KLA Tencor 710-658081-20 Defect Filter PCB Assy:KLA Tencor 710-658081-20 Defect Filter PCB AssyDefect Filter PCB Assy
|
1
|
|
|
 |
Plano, TX |
|
 |
149499
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
710-658164-20 |
in Electrical and Electronic Components
KLA Tencor 710-658164-20 PLLAD-8 Assy:KLA Tencor 710-658164-20 PLLAD-8 AssyPLLAD-8 Assy
|
1
|
|
|
 |
Plano, TX |
|
 |
106858
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
81-86680 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 81-86680:Motor, Rotator DC w/Gearbox
|
1
|
|
|
|
Hudson, NY |
|
 |
146781
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
91-0011 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 91-0011:Coupling Body 1/8" Barb
|
2
|
|
|
|
Hudson, NY |
|
 |
146782
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
91-0013 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 91-0013:Coupling Insert 1/8" Barb
|
2
|
|
|
|
Hudson, NY |
|
 |
146793
|
KLA Tencor Corporati OEM*
|
KLA Tencor Corporati OEM* |
96-0002 |
in Semiconductor Parts
KLA Tencor Corporati Part Number 96-0002:Regulator Preset 15psi
|
1
|
|
|
|
Hudson, NY |
|
 |
254018
|
KLA-Tencor
|
KLA-Tencor |
2138XP |
in Microscope Inspection Tools
KLA-Tencor 2138XP Brightfield Inspection Tool:KLA-Tencor 2138XP Brightfield Defect Inspection Tool - 0.25µ, 0.39µ, 0.62µ Spot Sizes
- For 150mm & 200mm Wafers
- Model 2552UI User Interface
- Denkenseiki Noise Filter
- Please Inquire for Additional Details
|
1
|
|
|
 |
Austin, Texas |
|
 |
126788
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor 3" Wafer Locator Rings for Flexus 2320:3" Wafer Locator Rings for Flexus 2320
|
2
|
|
|
 |
Plano, TX |
|
 |
252478
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
51-0175, Rev. D |
in Semiconductor Parts
KLA-Tencor 51-0175, Rev. D H2 Wafer Handler Prealigner:KLA-Tencor 51-0175, Rev. D H2 Wafer Handler Prealigner
|
1
|
|
|
 |
Plano, Texas |
|
 |
252479
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
52-0466, Rev. F |
in Semiconductor Parts
KLA-Tencor 52-0466 DBS Spectrometer Lid :KLA-Tencor 52-0466 DBS Spectrometer Lid
|
1
|
|
|
 |
Plano, Texas |
|
 |
252475
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
|
in Semiconductor Parts
KLA-Tencor 6XX0 Ceramic End Effector - New:Ceramic End Effector for Surfscan 6XX0 Tools
|
1
|
|
|
 |
Plano, Texas |
|
 |
133789
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
740-212542-000 |
in Lamps
KLA-Tencor 740-212542-000 Insert Assy with Lamps:KLA-Tencor 740-212542-000 Insert Assy with LampsInsert Assy with Lamps
|
1
|
|
|
 |
Plano, TX |
|
 |
218321
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Surface Inspection
KLA-Tencor AIT Patterned Wafer Inspection Tool:KLA-Tencor AIT Patterned Wafer Inspection Tool
|
1
|
|
|
|
Plano, Texas |
|
 |
250811
|
KLA-Tencor
|
KLA-Tencor |
Aleris 8350 |
in Film Thickness Testers
KLA-TENCOR Aleris 8350 Film Metrology Tool:KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool - Dual 300 mm Loadports
- Wafer Level Reliability
- Broadband Spectroscopic Ellipsometer
- Single Wave Ellipsometer
- Stress Measurement
- iDesorber
|
1
|
|
|
 |
Austin, Texas |
|
 |
104306
|
KLA-Tencor
|
KLA-Tencor |
AlphaStep 300 |
in Film Thickness Testers
KLA-Tencor AlphaStep 300 Profilometer:Profilometer
|
1
|
|
|
 |
Plano, TX |
|
 |
250821
|
KLA-Tencor
|
KLA-Tencor |
Archer 200 AIM |
in Critical Dimension Measurement Equipment
KLA-TENCOR Archer 200 AIM Overlay Metrology Tool:KLA-TENCOR Archer 200 AIM Overlay Metrology Tool - ETAL Stage
- Yaskawa Robot with NXC100 Controller
- IDE Maxon 1000 Floatation Controller
|
1
|
|
|
 |
Plano, Texas |
|
 |
252477
|
KLA -Tencor OEM*
|
KLA -Tencor OEM* |
52-0027 |
in Semiconductor Parts
KLA-Tencor ART Power Supply Module:KLA-Tencor ART Power Supply Module - 3ea Available
- 1ea Refurbished
|
1
|
|
|
|
Plano, Texas |
|
 |
249589
|
KLA-Tencor
|
KLA-Tencor |
ASET-F5x |
in Film Thickness Testers
KLA-Tencor ASET-F5x Thin Film Measurement System:KLA-TENCOR ASET-F5x Thin Film Measurement System - Serial Number 0202802R
- Manufactured in June, 2002
- Inspection Modes Include:
- Dual Beam Spectrometry
- Spectroscopic Ellipsometry
- Film Stress Analysis
- SUMMIT™ Application Software Version 3.21.16
- FTML Version 3.46.06
- Model 300DFF1P Wafer Loading Platform
- Dual Loadports for 300mm Wafers
- Three Axis Wafer Handling Robot
- GEM / SECS Communication
- Inquire for Additional Details
|
2
|
|
|
 |
Austin, Texas |
|
 |
252552
|
KLA -Tencor
|
KLA -Tencor |
Auto RS-75tc |
in Semiconductor Manufacturing Equipment
KLA-TENCOR Auto RS-75tc Resistivity Mapping Tool:KLA-TENCOR Auto RS-75tc Resistivity Mapping Tool Please Inquire for Details
|
1
|
|
|
|
Austin, Texas |
|
 |
252332
|
KLA Tencor
|
KLA Tencor |
DSW16E |
in Metrology Equipment
KLA-Tencor DSW16E 300mm Calibration Wafer:KLA-Tencor DSW16E 300mm Calibration Wafer - Part Number 0210691-000 (Advanced Technology Development)
- For Use on e-Beam Patterned Wafer Defect Inspection Tools
|
1
|
|
|
 |
Plano, Texas |
|
 |
250812
|
KLA-Tencor
|
KLA-Tencor |
HRP-240 |
in Film Thickness Testers
KLA-TENCOR HRP-240 High Resolution Profiler:KLA-TENCOR HRP-240 High Resolution Profiler - Cassette to Cassette Wafer Handling for up to 200mm Wafers
- Previously Configured for SMIF Wafer Handling
- Please Inquire for Additional Details
|
1
|
|
|
 |
Milpitas, California |
|
 |
5310
|
KLA-Tencor
|
KLA-Tencor |
7700 |
in Surface Inspection
KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER:Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
|
1
|
|
|
F* |
Scotia, New York |
|
 |
155840
|
KLA-Tencor OEM*
|
KLA-Tencor OEM* |
410918 |
in Semiconductor Parts
KLA-Tencor PN 410918:L-Stylus, DurasharpL-Stylus, Durasharp
|
5
|
|
|
|
Plano, TX |
|
 |
129073
|
KLA-Tencor
|
KLA-Tencor |
760-660139-00 |
in Other Motors
KLA-Tencor Power Changing Assy 760-660139-00:3 Lens Power Changing Assy complete w/optics
|
1
|
|
|
 |
Plano, TX |
|
 |
117972
|
Tencor OEM*
|
Tencor OEM* |
PN 120456 |
in Semiconductor Parts
KLA-Tencor Profiler Stylus:Tencor Profiler Scan Stylus 1.5 - 2.5 Micron RadiusTencor Profiler Scan Stylus 1.5 - 2.5 Micron Radius
|
1
|
|
|
|
Plano, TX |
|
 |
250818
|
KLA-Tencor
|
KLA-Tencor |
Puma 9120 IS |
in Surface Inspection
KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool:KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool - For 200mm or 300mm Wafers
- 2ea Cameras
- Please Inquire for Additional Details
|
1
|
|
|
 |
Austin, Texas |
|
 |
250819
|
KLA-Tencor
|
KLA-Tencor |
Puma 9130 |
in Surface Inspection
KLA-TENCOR Puma 9130 Darkfield Inspection Tool:KLA-TENCOR Puma 9130 Darkfield Inspection Tool - Parts Tool
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
 |
250822
|
KLA-Tencor
|
KLA-Tencor |
SWE Kit |
in Film Thickness Testers
KLA-TENCOR Spectra fx SWE Kit:KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit
|
1
|
|
|
|
Plano, Texas |
|
 |
126787
|
KLA-Tencor
|
KLA-Tencor |
|
in Production Equipment
KLA-Tencor SQ. 4" Wafer Locator Ring for Flexus 2320:SQ. 4" Wafer Locator Ring for Flexus 2320
|
1
|
|
|
 |
Plano, TX |
|
 |
252551
|
KLA -Tencor
|
KLA -Tencor |
Surfscan 6420 |
in Semiconductor Manufacturing Equipment
KLA-TENCOR Surfscan 6420 Unpatterned Wafer Surface Contamination Tool:KLA-TENCOR Surfscan 6420 Unpatterned Wafer Surface Contamination Tool - Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
 |
250814
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-Tencor Surfscan SP1 Unpatterned Surface Defect Tool:KLA-Tencor Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
 |
250815
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP1 |
in Surface Inspection
KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Too:KLA-TENCOR Surfscan SP1 Unpatterned Wafer Surface Defect Tool
|
1
|
|
|
|
Plano, Texas |
|
 |
250816
|
KLA-Tencor
|
KLA-Tencor |
Surfscan SP3+ |
in Surface Inspection
KLA-TENCOR Surfscan SP3+ Unpatterned Surface Defect Tool:KLA-TENCOR Surfscan SP3+ Unpatterned Wafer Surface Defect Tool - DUV Illumination
- Particle Detection to 32nm
- Dual 300mm FOUP Loadports
- Please Inquire for Additional Details
|
1
|
|
|
|
Austin, Texas |
|
 |
247843
|
KLA-Tencor
|
KLA-Tencor |
UV-1050 |
in Film Thickness Testers
KLA-Tencor UV-1050 Thin Film Measurement Tool:KLA-Tencor UV-1050 Thin Film Measurement Tool - Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Available
|
1
|
|
55,014.74 |
|
Austin, Texas |
|
 |
250823
|
KLA-Tencor
|
KLA-Tencor |
Viper 2401 |
in Metrology Equipment
KLA-TENCOR Viper 2401 After Develop Inspection Tool:KLA-TENCOR Viper 2401 After Develop Inspection Tool - Please Inquire for Details
|
1
|
|
|
|
Austin, Texas |
|
 |
85954
|
Klinger
|
Klinger |
B91-57055 |
in Stages
KLINGER NEWPORT MOTORIZED LINEAR STAGE, 7.5" TRAVEL:Motorized Linear Stage
Klinger B91-57055 Klinger acquired by Newport Corporation
|
2
|
|
1,400.38 |
 |
Scotia, New York |
|
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